Class information for:
Level 1: ABSOLUTE LENGTH MEASUREMENT//GAUGE BLOCK//ULTRAFAST OPT ULTR RECIS GRP

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
13004 803 14.3 61%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1503 6998 PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY//COORDINATE MEASURING MACHINES//COORDINATE METROLOGY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ABSOLUTE LENGTH MEASUREMENT Author keyword 6 71% 1% 5
2 GAUGE BLOCK Author keyword 6 28% 2% 19
3 ULTRAFAST OPT ULTR RECIS GRP Address 6 50% 1% 8
4 SYNTHETIC WAVELENGTH Author keyword 5 50% 1% 7
5 ABSOLUTE DISTANCE Author keyword 5 41% 1% 9
6 SINUSOIDAL PHASE MODULATING Author keyword 5 55% 1% 6
7 FREQUENCY SCANNING INTERFEROMETRY Author keyword 4 67% 0% 4
8 TWO WAVELENGTH INTERFEROMETER Author keyword 4 75% 0% 3
9 FRINGE LOCKING Author keyword 3 50% 0% 4
10 LENGTH METROLOGY Author keyword 3 30% 1% 7

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 ABSOLUTE LENGTH MEASUREMENT 6 71% 1% 5 Search ABSOLUTE+LENGTH+MEASUREMENT Search ABSOLUTE+LENGTH+MEASUREMENT
2 GAUGE BLOCK 6 28% 2% 19 Search GAUGE+BLOCK Search GAUGE+BLOCK
3 SYNTHETIC WAVELENGTH 5 50% 1% 7 Search SYNTHETIC+WAVELENGTH Search SYNTHETIC+WAVELENGTH
4 ABSOLUTE DISTANCE 5 41% 1% 9 Search ABSOLUTE+DISTANCE Search ABSOLUTE+DISTANCE
5 SINUSOIDAL PHASE MODULATING 5 55% 1% 6 Search SINUSOIDAL+PHASE+MODULATING Search SINUSOIDAL+PHASE+MODULATING
6 FREQUENCY SCANNING INTERFEROMETRY 4 67% 0% 4 Search FREQUENCY+SCANNING+INTERFEROMETRY Search FREQUENCY+SCANNING+INTERFEROMETRY
7 TWO WAVELENGTH INTERFEROMETER 4 75% 0% 3 Search TWO+WAVELENGTH+INTERFEROMETER Search TWO+WAVELENGTH+INTERFEROMETER
8 FRINGE LOCKING 3 50% 0% 4 Search FRINGE+LOCKING Search FRINGE+LOCKING
9 LENGTH METROLOGY 3 30% 1% 7 Search LENGTH+METROLOGY Search LENGTH+METROLOGY
10 ABSOLUTE DISTANCE MEASUREMENT 3 22% 1% 10 Search ABSOLUTE+DISTANCE+MEASUREMENT Search ABSOLUTE+DISTANCE+MEASUREMENT

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SURFACE PROFILE MEASUREMENT 13 55% 2% 16
2 PHASE MODULATING INTERFEROMETRY 12 86% 1% 6
3 LASER DIODE INTERFEROMETER 11 49% 2% 17
4 2 WAVELENGTH 11 48% 2% 16
5 FEMTOSECOND PULSE LASER 10 44% 2% 17
6 DISTANCE MEASUREMENT 9 23% 4% 35
7 UPDATED EDLEN EQUATION 7 26% 3% 24
8 FEEDBACK CONTROL SYSTEM 6 80% 0% 4
9 VARIABLE SYNTHETIC WAVELENGTH 6 71% 1% 5
10 ABSOLUTE DISTANCE MEASUREMENT 6 28% 2% 18

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
On-Line Metrology with Conoscopic Holography: Beyond Triangulation 2009 10 11 73%
Laser-diode interferometry 2004 21 130 49%
Refractometry and gas density 2004 7 61 25%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 ULTRAFAST OPT ULTR RECIS GRP 6 50% 1.0% 8
2 DIOPT 1 100% 0.2% 2
3 ENGN METROL GRP 1 100% 0.2% 2
4 INFORMAT OPT OPT ELECT TECHNOL 1 100% 0.2% 2
5 METROL QUAL ENGN 1 50% 0.2% 2
6 PHYS ANGEW PHYS 1 100% 0.2% 2
7 PHYS CHEM OPT ENGN 1 100% 0.2% 2
8 BILLIONTH UNCERTAINTY PRECIS ENGN GRP 1 27% 0.4% 3
9 TIME FREQUENCY METROL 1 18% 0.5% 4
10 BNMINM 1 50% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000260760 WHITE LIGHT INTERFEROMETRY//COMMUNITY TABUK//PRECIS MECH CONTROL
2 0.0000224479 PROC MEASUREMENT SENSOR TECHNOL//NANOMETROLOGY//MICRO CMM
3 0.0000130658 STATE PRECIS MEASUREMENT TECHNOL RU//PRECIS RUMENTS//SELF MIXING EFFECT
4 0.0000128728 FIBER OPTICAL FREQUENCY COMB//OPTICAL FREQUENCY METROLOGY//CARRIER ENVELOPE PHASE
5 0.0000122929 STANDARD REFERENCE DATA//OPTICAL HETERODYNE INTERFEROMETER//CHAINS OF LINKED VIBRATORS
6 0.0000104148 PL COMP MECH//SPECKLE INTERFEROMETRY//SHEAROGRAPHY
7 0.0000095706 THREE DIMENSIONAL IMAGE SENSOR//DEMODULATION PIXEL//PHOTONIC MIXER DEVICES PMDS
8 0.0000089630 LASER INTERFERENCE MICROSCOPY//COHERENT PHASE MICROSCOPY//DYNAMIC PHASE MICROSCOPY
9 0.0000080688 COLLIMATION TESTING//OPTICAL TESTING INSTRUMENTS//OPT LICADA
10 0.0000078918 ANGLE STANDARD//ANGLE MEASUREMENT//ANGLE MEASUREMENTS