Class information for:
Level 1: MOIRE INTERFEROMETRY//ELECTRON BEAM MOIRE//NANO MOIRE

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
17061 556 15.8 43%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
967 10249 OPTICS AND LASERS IN ENGINEERING//DIGITAL IMAGE CORRELATION//FRINGE ANALYSIS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MOIRE INTERFEROMETRY Author keyword 9 17% 9% 50
2 ELECTRON BEAM MOIRE Author keyword 8 75% 1% 6
3 NANO MOIRE Author keyword 6 71% 1% 5
4 GEOMETRIC PHASE ANALYSIS Author keyword 4 30% 2% 10
5 FRINGE MULTIPLICATION Author keyword 3 57% 1% 4
6 MICROSCOPIC MOIRE INTERFEROMETRY Author keyword 3 57% 1% 4
7 MA INENWESEN Address 3 50% 1% 4
8 ELECTRON MOIRE Author keyword 3 60% 1% 3
9 BISCUIT CHECKING Author keyword 2 67% 0% 2
10 FAR INFRARED FIZEAU INTERFEROMETRY Author keyword 2 67% 0% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 MOIRE INTERFEROMETRY 9 17% 9% 50 Search MOIRE+INTERFEROMETRY Search MOIRE+INTERFEROMETRY
2 ELECTRON BEAM MOIRE 8 75% 1% 6 Search ELECTRON+BEAM+MOIRE Search ELECTRON+BEAM+MOIRE
3 NANO MOIRE 6 71% 1% 5 Search NANO+MOIRE Search NANO+MOIRE
4 GEOMETRIC PHASE ANALYSIS 4 30% 2% 10 Search GEOMETRIC+PHASE+ANALYSIS Search GEOMETRIC+PHASE+ANALYSIS
5 FRINGE MULTIPLICATION 3 57% 1% 4 Search FRINGE+MULTIPLICATION Search FRINGE+MULTIPLICATION
6 MICROSCOPIC MOIRE INTERFEROMETRY 3 57% 1% 4 Search MICROSCOPIC+MOIRE+INTERFEROMETRY Search MICROSCOPIC+MOIRE+INTERFEROMETRY
7 ELECTRON MOIRE 3 60% 1% 3 Search ELECTRON+MOIRE Search ELECTRON+MOIRE
8 BISCUIT CHECKING 2 67% 0% 2 Search BISCUIT+CHECKING Search BISCUIT+CHECKING
9 FAR INFRARED FIZEAU INTERFEROMETRY 2 67% 0% 2 Search FAR+INFRARED+FIZEAU+INTERFEROMETRY Search FAR+INFRARED+FIZEAU+INTERFEROMETRY
10 MOIRE INTERFEROMETRY METHOD 2 67% 0% 2 Search MOIRE+INTERFEROMETRY+METHOD Search MOIRE+INTERFEROMETRY+METHOD

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MICROSCOPIC MOIRE INTERFEROMETRY 8 100% 1% 5
2 MOIRE INTERFEROMETRY 6 19% 5% 29
3 NANO MOIRE METHOD 4 67% 1% 4
4 MOIRE METHOD 4 31% 2% 11
5 SCANNING MOIRE 3 50% 1% 5
6 BEAM MOIRE 3 39% 1% 7
7 FRINGE MULTIPLICATION 3 57% 1% 4
8 REDUCED PROCESS STEPS 2 67% 0% 2
9 TEXTILE COMPOSITE MATERIALS 2 67% 0% 2
10 ELECTRON BEAM MOIRE 2 33% 1% 5

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
A HISTORICAL REVIEW OF MOIRE INTERFEROMETRY 1994 45 9 78%
Moire methods for engineering and science - Moire interferometry and shadow Moire 2000 10 14 79%
High Temperature Gratings for the Moire and Moire Interferometry Methods and their Application to Deformation Measurement - A Review 2001 1 7 71%
COMPUTERIZED OPTICAL FRINGE PATTERN-ANALYSIS IN PHOTOMECHANICS - A REVIEW 1992 20 15 13%
HOLOGRAPHIC, SPECKLE AND MOIRE TECHNIQUES IN OPTICAL METROLOGY 1993 8 149 17%
Role of NPL-India in Nanotechnology and Nanometrology 2013 0 18 6%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 MA INENWESEN 3 50% 0.7% 4
2 ENG MECH 1 38% 0.5% 3
3 OPENING VACUUM PHYS 1 100% 0.4% 2
4 ADV MAT SUR ES 1 50% 0.2% 1
5 MECH ENGN MECH MAT 1 50% 0.2% 1
6 MED PROD ENGN 1 50% 0.2% 1
7 PRECIS ENGN PROGRAM 1 50% 0.2% 1
8 CARE ELECT PACKAGING 0 33% 0.2% 1
9 MAT STRUCT METALL 0 33% 0.2% 1
10 PL MECH MINISTRATOR EDUC 0 33% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000155177 DIGITAL IMAGE CORRELATION//VIRTUAL FIELDS METHOD//FULL FIELD MEASUREMENTS
2 0.0000151081 PL COMP MECH//SPECKLE INTERFEROMETRY//SHEAROGRAPHY
3 0.0000147903 SPECKLE PHOTOGRAPHY//OPTIMO//YOUNG FRINGES
4 0.0000106315 HOLE DRILLING//HOLE DRILLING METHOD//CRACK COMPLIANCE
5 0.0000100109 STRUCTURED LIGHT//FRINGE PROJECTION//FOURIER TRANSFORM PROFILOMETRY FTP
6 0.0000088673 JOURNAL OF ELECTRONIC PACKAGING//SOLDERING & SURFACE MOUNT TECHNOLOGY//SOLDER JOINT
7 0.0000080549 DIGITAL PHOTOELASTICITY//RGB PHOTOELASTICITY//PHOTOELASTICITY
8 0.0000076454 TALBOT EFFECT//PL OPT COMPLUTENSE GRP//ARRAY ILLUMINATORS
9 0.0000071593 INFORMAT PHYS ENGN//MOIRE DEFLECTOMETRY//SANDWICH HOLOGRAPHY
10 0.0000062089 AMPLITUDE PHASE CHARACTERISTICS//BLOCKING OF REFRACTED RAYS//DUAL HOLOGRAM SHEARING INTERFEROMETRY