Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 1799 | 2411 | 20.0 | 70% |
Classes in level above (level 2) |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | STRAINED SI | Author keyword | 86 | 48% | 6% | 133 |
| 2 | SIGE | Author keyword | 50 | 17% | 11% | 275 |
| 3 | STRAINED SILICON | Author keyword | 36 | 36% | 3% | 82 |
| 4 | VIRTUAL SUBSTRATE | Author keyword | 30 | 64% | 1% | 29 |
| 5 | SILICON NANOSCI | Address | 29 | 48% | 2% | 44 |
| 6 | SIGE ON INSULATOR | Author keyword | 23 | 70% | 1% | 19 |
| 7 | GE CONDENSATION | Author keyword | 23 | 74% | 1% | 17 |
| 8 | STRAINED SI SIGE | Author keyword | 21 | 90% | 0% | 9 |
| 9 | CRYSTAL SCI TECHNOL | Address | 20 | 31% | 2% | 52 |
| 10 | SGOI | Author keyword | 17 | 59% | 1% | 19 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | STRAINED SI | 86 | 48% | 6% | 133 | Search STRAINED+SI | Search STRAINED+SI |
| 2 | SIGE | 50 | 17% | 11% | 275 | Search SIGE | Search SIGE |
| 3 | STRAINED SILICON | 36 | 36% | 3% | 82 | Search STRAINED+SILICON | Search STRAINED+SILICON |
| 4 | VIRTUAL SUBSTRATE | 30 | 64% | 1% | 29 | Search VIRTUAL+SUBSTRATE | Search VIRTUAL+SUBSTRATE |
| 5 | SIGE ON INSULATOR | 23 | 70% | 1% | 19 | Search SIGE+ON+INSULATOR | Search SIGE+ON+INSULATOR |
| 6 | GE CONDENSATION | 23 | 74% | 1% | 17 | Search GE+CONDENSATION | Search GE+CONDENSATION |
| 7 | STRAINED SI SIGE | 21 | 90% | 0% | 9 | Search STRAINED+SI+SIGE | Search STRAINED+SI+SIGE |
| 8 | SGOI | 17 | 59% | 1% | 19 | Search SGOI | Search SGOI |
| 9 | STRAIN RELAXATION | 14 | 20% | 3% | 63 | Search STRAIN+RELAXATION | Search STRAIN+RELAXATION |
| 10 | STRAINED GE | 11 | 60% | 0% | 12 | Search STRAINED+GE | Search STRAINED+GE |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | SI SIGE HETEROSTRUCTURES | 92 | 69% | 3% | 79 |
| 2 | STRAINED SI | 58 | 42% | 4% | 107 |
| 3 | MODULATION DOPED SI SIGE | 53 | 95% | 1% | 18 |
| 4 | GEXSI1 X LAYERS | 33 | 75% | 1% | 24 |
| 5 | SIGE | 28 | 23% | 4% | 104 |
| 6 | HIGH GE FRACTION | 27 | 78% | 1% | 18 |
| 7 | MOBILITY ENHANCEMENT | 26 | 35% | 2% | 60 |
| 8 | SI SIGE | 23 | 43% | 2% | 40 |
| 9 | GESI STRAINED LAYERS | 21 | 85% | 0% | 11 |
| 10 | SI BUFFERS | 20 | 100% | 0% | 9 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors | 2005 | 443 | 104 | 76% |
| High-mobility Si and Ge structures | 1997 | 524 | 105 | 55% |
| Band structure, deformation potentals, and carrier mobility in strained Si, Ge, and SiGe alloys | 1996 | 785 | 57 | 49% |
| Physics of strain effects in semiconductors and metal-oxide-semiconductor field-effect transistors | 2007 | 132 | 52 | 35% |
| Si/SiGe heterostructures: from material and physics to devices and circuits | 2004 | 244 | 139 | 43% |
| Strain: A Solution for Higher Carrier Mobility in Nanoscale MOSFETs | 2009 | 119 | 49 | 20% |
| Impact strain engineering on gate stack quality and reliability | 2008 | 31 | 56 | 52% |
| Mobility-enhancement technologies | 2005 | 54 | 35 | 63% |
| Silicon-germanium strained layer materials in microelectronics | 1999 | 97 | 72 | 44% |
| Strained-Si heterostructure field effect transistors | 1998 | 70 | 89 | 71% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | SILICON NANOSCI | 29 | 48% | 1.8% | 44 |
| 2 | CRYSTAL SCI TECHNOL | 20 | 31% | 2.2% | 52 |
| 3 | ADV S | 14 | 26% | 2.0% | 48 |
| 4 | WIDE BAND G SEMICOND MAT DEVICES | 8 | 16% | 1.9% | 47 |
| 5 | PALAZ | 4 | 67% | 0.2% | 4 |
| 6 | SIGE DEVICE TEAM | 4 | 50% | 0.2% | 6 |
| 7 | SILICON NANO SCI | 3 | 57% | 0.2% | 4 |
| 8 | ELECT ECE | 3 | 18% | 0.6% | 14 |
| 9 | PETER GRUNBERG PGI 9 IT 9 | 3 | 60% | 0.1% | 3 |
| 10 | DPTS | 2 | 33% | 0.2% | 6 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000205548 | STRAINED SI1 XGEX SI QUANTUM WELLS//SI SIGE SUPERLATTICE//STRAINED SIGE SI |
| 2 | 0.0000167727 | SI1 YCY//SI1 X YGEXCY//SICGE |
| 3 | 0.0000162703 | MISFIT DISLOCATIONS//GRADED BUFFER LAYER//DISLOCATION COMPENSATION |
| 4 | 0.0000143091 | GESN//L NESS//GERMANIUM TIN |
| 5 | 0.0000130810 | NETWORK COMPUTAT NANOTECHNOL//QUASI BALLISTIC TRANSPORT//JOURNAL OF COMPUTATIONAL ELECTRONICS |
| 6 | 0.0000125101 | CERAM PHYS//RIN//CONCENTRATED STRESS |
| 7 | 0.0000113825 | POLY SIGE//POLY SI1 XGEX//POLYCRYSTALLINE SILICON GERMANIUM |
| 8 | 0.0000105936 | ATOMIC LAYER DOPING//SI EPITAXIAL GROWTH//GERMANIUM SILICON COMPOUNDS |
| 9 | 0.0000099584 | SIGE SINGLE CRYSTAL//GERMANIUM SILICON ALLOYS//AXIAL HEAT PROCESSING |
| 10 | 0.0000097376 | SCHOTTKY BARRIER SB//DOPANT SEGREGATION DS//SCHOTTKY BARRIER SB MOSFET |