Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 19750 | 427 | 19.9 | 68% |
Classes in level above (level 2) |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | FLUCTUAT | Address | 19 | 70% | 4% | 16 |
| 2 | PLANAR GUNN DIODE | Author keyword | 6 | 71% | 1% | 5 |
| 3 | ELLIPSOIDAL VALLEYS | Author keyword | 6 | 100% | 1% | 4 |
| 4 | MINIMUM ACCELERATION LENGTH | Author keyword | 4 | 75% | 1% | 3 |
| 5 | RETARDED LANGEVIN EQUATION RLE | Author keyword | 4 | 75% | 1% | 3 |
| 6 | VELOCITY FIELD CHARACTERISTIC | Author keyword | 3 | 100% | 1% | 3 |
| 7 | ENSEMBLE MONTE CARLO | Author keyword | 2 | 29% | 2% | 7 |
| 8 | GUNN DEVICES | Author keyword | 2 | 22% | 1% | 6 |
| 9 | CELLULAR MONTE CARLO | Author keyword | 1 | 100% | 0% | 2 |
| 10 | GAN HETEROSTRUCTURE | Author keyword | 1 | 50% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | MICROWAVE POWER GENERATION | 15 | 82% | 2% | 9 |
| 2 | RESOLVED ELECTROABSORPTION MEASUREMENT | 13 | 71% | 2% | 10 |
| 3 | BIASED ALGAN GAN | 9 | 83% | 1% | 5 |
| 4 | ALGAN ALN GAN CHANNELS | 7 | 67% | 1% | 6 |
| 5 | NDR DIODE | 4 | 75% | 1% | 3 |
| 6 | PHASE GAN | 4 | 75% | 1% | 3 |
| 7 | PHONON LIFETIME | 4 | 75% | 1% | 3 |
| 8 | MICROWAVE NOISE | 3 | 30% | 2% | 9 |
| 9 | TIME RESOLVED RAMAN | 3 | 28% | 2% | 9 |
| 10 | HOT PHONONS | 3 | 30% | 2% | 7 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Electron density window for best frequency performance, lowest phase noise and slowest degradation of GaN heterostructure field-effect transistors | 2013 | 5 | 37 | 62% |
| Steady-state and transient electron transport within the wide energy gap compound semiconductors gallium nitride and zinc oxide: an updated and critical review | 2014 | 0 | 132 | 20% |
| A 2015 perspective on the nature of the steady-state and transient electron transport within the wurtzite phases of gallium nitride, aluminum nitride, indium nitride, and zinc oxide: a critical and retrospective review | 2015 | 0 | 202 | 17% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | FLUCTUAT | 19 | 70% | 3.7% | 16 |
| 2 | PLICAT SPECIF INTEGRATED CIRCUIT | 1 | 27% | 0.7% | 3 |
| 3 | STATE KEY DISCIPLINE WIDE BAND G SEMICOND T | 1 | 14% | 1.4% | 6 |
| 4 | AMSRL SE EM | 1 | 19% | 0.9% | 4 |
| 5 | DEF POWER | 1 | 50% | 0.2% | 1 |
| 6 | ERC 227 | 1 | 50% | 0.2% | 1 |
| 7 | ICHTEN GRENZFLACHEN CNI | 1 | 50% | 0.2% | 1 |
| 8 | SATELLITE VENTURE | 1 | 50% | 0.2% | 1 |
| 9 | SEMICOND CHARACTERIZAT | 1 | 50% | 0.2% | 1 |
| 10 | THIN FILMS INTE ES | 1 | 50% | 0.2% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000176275 | ADV STUDY RADIOPHYS ELECT//IMPATT DIODES//LARGE SIGNAL SIMULATION |
| 2 | 0.0000169916 | ALGAN GAN//HIGH ELECTRON MOBILITY TRANSISTOR HEMT//CURRENT COLLAPSE |
| 3 | 0.0000158462 | ENERGY TRANSPORT MODEL//HYDRODYNAMICAL MODELS//BOLTZMANN POISSON SYSTEM |
| 4 | 0.0000142161 | MICRO PHOTONELECT//HOT ELECTRON SCATTERING//LO PHONON EMISSION |
| 5 | 0.0000141052 | THREE TERMINAL BALLISTIC JUNCTIONS//BALLISTIC RECTIFICATION//BALLISTIC DEVICES |
| 6 | 0.0000135846 | EPITAXIAL SEMICOND GRP//EXP SOLID STATE PHYS 3//RECIPROCAL SPACE ANALYSIS |
| 7 | 0.0000125897 | 4H SIC MESFET//MESFET//MESFETS |
| 8 | 0.0000119944 | BACKWARD DIODES//MILLIMETER WAVE DETECTORS//BULK BARRIER DIODES |
| 9 | 0.0000115583 | IMPACT IONIZATION//AVALANCHE PHOTODIODES APDS//AVALANCHE PHOTODIODE APD |
| 10 | 0.0000103161 | BLOCH GRUNEISEN REGIME//THERMOMAGNETIC EFFECT//CONFINED AND INTERFACE PHONONS |