Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 20524 | 395 | 28.9 | 65% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 803 | 11388 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | ELECTRON TOMOGRAPHY | Author keyword | 20 | 17% | 27% | 105 |
| 2 | TILT SERIES | Author keyword | 8 | 70% | 2% | 7 |
| 3 | MISSING WEDGE | Author keyword | 5 | 50% | 2% | 7 |
| 4 | X RAY REFRACTION TOPOGRAPHY | Author keyword | 3 | 100% | 1% | 3 |
| 5 | SIMULTANEOUS ITERATIVE RECONSTRUCTION TECHNIQUE SIRT | Author keyword | 2 | 67% | 1% | 2 |
| 6 | TRANSMISSION ELECTRON MICROTOMOGRAPHY TEMT | Author keyword | 2 | 50% | 1% | 3 |
| 7 | HGRP BILDGEBENDE VERFAHREN | Address | 1 | 38% | 1% | 3 |
| 8 | ARBEITSGRP RONTGEN STREU TOPOG | Address | 1 | 100% | 1% | 2 |
| 9 | DISCRETE ALGEBRAIC RECONSTRUCTION TECHNIQUE DART | Author keyword | 1 | 100% | 1% | 2 |
| 10 | ROD SHAPED SPECIMEN | Author keyword | 1 | 100% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | MISSING WEDGE | 36 | 77% | 6% | 24 |
| 2 | Z CONTRAST | 16 | 38% | 9% | 34 |
| 3 | X RAY REFRACTION | 9 | 64% | 2% | 9 |
| 4 | RUTHERFORD SCATTERING | 9 | 50% | 3% | 13 |
| 5 | EFTEM TOMOGRAPHY | 4 | 75% | 1% | 3 |
| 6 | SENSING ELECTRON TOMOGRAPHY | 4 | 75% | 1% | 3 |
| 7 | HAADF STEM | 4 | 31% | 3% | 11 |
| 8 | DUAL AXIS TOMOGRAPHY | 3 | 42% | 1% | 5 |
| 9 | QUANTITATIVE STRUCTURAL ANALYSIS | 2 | 67% | 1% | 2 |
| 10 | EQUALLY SLOPED TOMOGRAPHY | 1 | 38% | 1% | 3 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Electron tomography and holography in materials science | 2009 | 229 | 76 | 29% |
| Progress in electron tomography to assess the 3D nanostructure of catalysts | 2013 | 8 | 76 | 46% |
| Computational methods for materials characterization by electron tomography | 2013 | 6 | 63 | 52% |
| Electron Tomography for Heterogeneous Catalysts and Related Nanostructured Materials | 2009 | 100 | 167 | 26% |
| Electron tomography of dislocation structures | 2014 | 4 | 36 | 28% |
| Electron Tomography in the (S)TEM: From Nanoscale Morphological Analysis to 3D Atomic Imaging | 2012 | 13 | 66 | 44% |
| High resolution electron tomography | 2013 | 3 | 40 | 58% |
| Recent Advances in the Application of Electron Tomography to Materials Chemistry | 2012 | 17 | 36 | 36% |
| Nanotomography in the chemical, biological and materials sciences | 2007 | 97 | 74 | 23% |
| Fabrication of marker area to align TEM tomographic tilt series of rod-shaped specimens | 2011 | 1 | 4 | 75% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | HGRP BILDGEBENDE VERFAHREN | 1 | 38% | 0.8% | 3 |
| 2 | ARBEITSGRP RONTGEN STREU TOPOG | 1 | 100% | 0.5% | 2 |
| 3 | ULTRAHIGH VOLTAGE ELE ON MICROSCOPY | 1 | 12% | 2.5% | 10 |
| 4 | ULTRA HVEM | 1 | 25% | 1.0% | 4 |
| 5 | ABT WERKSTOFFE | 1 | 25% | 0.8% | 3 |
| 6 | ANWENDERZENTRUM IND | 1 | 50% | 0.3% | 1 |
| 7 | CREAT FUNCT NANOMAT | 1 | 50% | 0.3% | 1 |
| 8 | DESKTOP PLATFORMS GRP | 1 | 50% | 0.3% | 1 |
| 9 | INAC UJF UMR E GRENOBLE 1 | 1 | 50% | 0.3% | 1 |
| 10 | INTELLIGENT SIGNAL PROC GRP ISP | 1 | 50% | 0.3% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000196734 | JOURNAL OF STRUCTURAL BIOLOGY//SINGLE PARTICLE RECONSTRUCTION//CRYO ELECTRON MICROSCOPY |
| 2 | 0.0000160827 | ULTRAMICROSCOPY//ABERRATION CORRECTION//DEPTH SECTIONING |
| 3 | 0.0000148245 | ENVIRONMENTAL TEM//ATMOSPHER SCI GLOBAL CLIMATE CHANGE//LIQUID CELL TEM |
| 4 | 0.0000136347 | DISCRETE TOMOGRAPHY//CONVEX POLYOMINOES//BINARY TOMOGRAPHY |
| 5 | 0.0000122100 | EFTEM//ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY EFTEM//SPECTRUM IMAGING |
| 6 | 0.0000089460 | ELECTRON HOLOGRAPHY//OFF AXIS ELECTRON HOLOGRAPHY//TRIEBENBERG |
| 7 | 0.0000078800 | NANOPYRAMID ARRAY//DOPANT ION IMPLANTATION//FIS SUPERFICIES INTER ES |
| 8 | 0.0000073791 | SEDIMENTATION BALANCE//STANDARD REFERENCE PARTICLES//BOILER ENGN |
| 9 | 0.0000067107 | THREE DIMENSIONAL X RAY DIFFRACTION//3DXRD//DIFFRACTION CONTRAST TOMOGRAPHY |
| 10 | 0.0000063377 | FOCUSED ION BEAM//SHAVE OFF//SHAVE OFF DEPTH PROFILING |