Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 20848 | 383 | 19.9 | 73% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 751 | 11810 | ATOMIC FORCE MICROSCOPE//DISSENY PROGRAMACIO SISTEMES ELECT//LOCAL ANODIC OXIDATION |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | TIP CHARACTERIZATION | Author keyword | 9 | 64% | 2% | 9 |
| 2 | TIP CHARACTERIZER | Author keyword | 6 | 71% | 1% | 5 |
| 3 | SIDEWALL MEASUREMENT | Author keyword | 4 | 75% | 1% | 3 |
| 4 | TIP ARTIFACTS | Author keyword | 3 | 50% | 1% | 4 |
| 5 | BLIND TIP RECONSTRUCTION | Author keyword | 3 | 60% | 1% | 3 |
| 6 | DIGITAL PROBING | Author keyword | 2 | 67% | 1% | 2 |
| 7 | DIGITAL PROBING MODE | Author keyword | 2 | 67% | 1% | 2 |
| 8 | MICROFABRICATED TIPS | Author keyword | 2 | 67% | 1% | 2 |
| 9 | NANOSCALE DIMENSIONAL METROLOGY | Author keyword | 2 | 67% | 1% | 2 |
| 10 | STEP HEIGHTS | Author keyword | 2 | 67% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | TIP CHARACTERIZATION | 9 | 64% | 2% | 9 | Search TIP+CHARACTERIZATION | Search TIP+CHARACTERIZATION |
| 2 | TIP CHARACTERIZER | 6 | 71% | 1% | 5 | Search TIP+CHARACTERIZER | Search TIP+CHARACTERIZER |
| 3 | SIDEWALL MEASUREMENT | 4 | 75% | 1% | 3 | Search SIDEWALL+MEASUREMENT | Search SIDEWALL+MEASUREMENT |
| 4 | TIP ARTIFACTS | 3 | 50% | 1% | 4 | Search TIP+ARTIFACTS | Search TIP+ARTIFACTS |
| 5 | BLIND TIP RECONSTRUCTION | 3 | 60% | 1% | 3 | Search BLIND+TIP+RECONSTRUCTION | Search BLIND+TIP+RECONSTRUCTION |
| 6 | DIGITAL PROBING | 2 | 67% | 1% | 2 | Search DIGITAL+PROBING | Search DIGITAL+PROBING |
| 7 | DIGITAL PROBING MODE | 2 | 67% | 1% | 2 | Search DIGITAL+PROBING+MODE | Search DIGITAL+PROBING+MODE |
| 8 | MICROFABRICATED TIPS | 2 | 67% | 1% | 2 | Search MICROFABRICATED+TIPS | Search MICROFABRICATED+TIPS |
| 9 | NANOSCALE DIMENSIONAL METROLOGY | 2 | 67% | 1% | 2 | Search NANOSCALE+DIMENSIONAL+METROLOGY | Search NANOSCALE+DIMENSIONAL+METROLOGY |
| 10 | STEP HEIGHTS | 2 | 67% | 1% | 2 | Search STEP+HEIGHTS | Search STEP+HEIGHTS |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | TIP CHARACTERIZATION | 4 | 67% | 1% | 4 |
| 2 | AFM MEASUREMENT | 3 | 100% | 1% | 3 |
| 3 | CD AFM | 3 | 32% | 2% | 8 |
| 4 | TIP SHAPE | 2 | 25% | 2% | 7 |
| 5 | ZNO WHISKER TIP | 2 | 43% | 1% | 3 |
| 6 | BLIND TIP RECONSTRUCTION | 1 | 100% | 1% | 2 |
| 7 | SCANNED PROBE MICROSCOPY | 1 | 50% | 1% | 2 |
| 8 | HEIGHT CALIBRATION | 1 | 40% | 1% | 2 |
| 9 | ULTRANANOCRYSTALLINE DIAMOND PROBES | 1 | 40% | 1% | 2 |
| 10 | AFM IMAGES | 1 | 18% | 1% | 5 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Review of reference metrology for nanotechnology: significance, challenges, and solutions | 2012 | 3 | 6 | 67% |
| Anisotropic wet etching silicon tips of small opening angle in KOH solution with the additions of I-2/KI | 2009 | 5 | 18 | 33% |
| Atomic force microscopy tip characteriser based on the fabrication of nanorod array structures | 2013 | 0 | 17 | 65% |
| Molecular views and measurements of hemostatic processes using atomic force microscopy | 2002 | 25 | 180 | 9% |
| DIMENSIONAL METROLOGY WITH SCANNING PROBE MICROSCOPES | 1993 | 95 | 96 | 13% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | ATDF INC | 1 | 50% | 0.3% | 1 |
| 2 | CIRCUIT EDIT MASK REPAIR | 1 | 50% | 0.3% | 1 |
| 3 | COMP GR H PROGRAM | 1 | 50% | 0.3% | 1 |
| 4 | GR H PROGRAM | 1 | 50% | 0.3% | 1 |
| 5 | INT AD T BIONANOTECHOL | 1 | 50% | 0.3% | 1 |
| 6 | NANOSCALE METROL GRP | 1 | 50% | 0.3% | 1 |
| 7 | STATE DIE MOULD | 1 | 50% | 0.3% | 1 |
| 8 | UNIT PROC DEV | 1 | 50% | 0.3% | 1 |
| 9 | VI32 | 1 | 50% | 0.3% | 1 |
| 10 | FUNDACAO TECNOL MINAS GERAIS | 1 | 22% | 0.5% | 2 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000247376 | NANONEWTON//SPRING CONSTANT//NORMAL SPRING CONSTANT |
| 2 | 0.0000242634 | APEX RADIUS//GRP MAT NANOESTRUCT//TIP FABRICATION |
| 3 | 0.0000236106 | CARBON NANOTUBE PROBES//CARBON NANOTUBE TIPS//HIGH DENSITY INFORMATION STORAGE |
| 4 | 0.0000201434 | DNA NETWORK//FOR UNGSZENTRUM IBI STRUCT BIOL 2//CRYO AFM |
| 5 | 0.0000184264 | DISSENY PROGRAMACIO SISTEMES ELECT//FUTURE ENERGY IFES//QPLUS |
| 6 | 0.0000163559 | PROC MEASUREMENT SENSOR TECHNOL//NANOMETROLOGY//MICRO CMM |
| 7 | 0.0000134352 | OPTICAL SCATTEROMETRY//DIMENSIONAL STANDARDS//LINEWIDTH MONITORING |
| 8 | 0.0000100283 | LOCAL TUNNELING BARRIER HEIGHT//LOCAL TUNNELING BARRIER HEIGHT LBH//I S CHARACTERISTICS |
| 9 | 0.0000082826 | ORIENTING SUBSTRATES//ASET SUMITOMO CHEM//PTFE FILMS |
| 10 | 0.0000077380 | SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL |