Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 24678 | 254 | 14.5 | 36% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 270 | 18550 | SEMICONDUCTOR LASERS//IEEE JOURNAL OF QUANTUM ELECTRONICS//IEEE PHOTONICS TECHNOLOGY LETTERS |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | KOSSEL TECHNIQUE | Author keyword | 11 | 60% | 5% | 12 |
| 2 | LATTICE SOURCE INTERFERENCES | Author keyword | 8 | 100% | 2% | 5 |
| 3 | DETERMINATION OF LATTICE PARAMETERS | Author keyword | 3 | 100% | 1% | 3 |
| 4 | DETERMINATION OF RESIDUAL STRESS | Author keyword | 3 | 100% | 1% | 3 |
| 5 | XRT TECHNIQUE | Author keyword | 3 | 100% | 1% | 3 |
| 6 | DIVERGENT BEAM X RAY INTERFERENCES | Author keyword | 1 | 100% | 1% | 2 |
| 7 | PSEUDO KOSSEL TECHNIQUE | Author keyword | 1 | 100% | 1% | 2 |
| 8 | OBERFLACHENPHYS MIKROSTRUKTURPHYS | Address | 1 | 17% | 2% | 6 |
| 9 | KOSSEL MICRODIFFRACTION | Author keyword | 1 | 33% | 1% | 2 |
| 10 | CRYSTALLOG MINERAL PHYS UNIT | Address | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | KOSSEL | 5 | 55% | 2% | 6 |
| 2 | KOSSEL TECHNIQUE | 3 | 100% | 1% | 3 |
| 3 | KOSSEL DIFFRACTION | 1 | 100% | 1% | 2 |
| 4 | A CM2 | 1 | 50% | 0% | 1 |
| 5 | DIFFUSION ZONES | 0 | 33% | 0% | 1 |
| 6 | LATTICE SOURCE INTERFERENCES | 0 | 33% | 0% | 1 |
| 7 | EPITAXIAL CDTE | 0 | 14% | 0% | 1 |
| 8 | ALMANDINE GARNET | 0 | 13% | 0% | 1 |
| 9 | KOSSEL PATTERNS | 0 | 100% | 0% | 1 |
| 10 | MANTLE CRYSTAL STRUCTURES | 0 | 100% | 0% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| X-ray divergent-beam (Kossel) technique: A review | 2011 | 5 | 73 | 68% |
| APPLICATIONS OF THE DIVERGENT BEAM X-RAY TECHNIQUE | 1989 | 3 | 7 | 86% |
| There ain't nothing like a Dame: a commentary on Lonsdale (1947) 'Divergent beam X-ray photography of crystals' | 2015 | 0 | 5 | 100% |
| Growth of quantum-well heterostructures by liquid phase epitaxy | 2006 | 2 | 15 | 73% |
| ELASTIC PROPERTIES OF MINERALS | 1993 | 3 | 31 | 13% |
| The double heterostructure: The concept and its applications in physics, electronics, and technology (Nobel lecture) | 2001 | 3 | 31 | 10% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | OBERFLACHENPHYS MIKROSTRUKTURPHYS | 1 | 17% | 2.4% | 6 |
| 2 | CRYSTALLOG MINERAL PHYS UNIT | 1 | 50% | 0.4% | 1 |
| 3 | SEMICOND ELE | 0 | 18% | 0.8% | 2 |
| 4 | INTERDISZIPLINA WISSEN ZENTRUM MAT WISSENSC | 0 | 20% | 0.4% | 1 |
| 5 | ICHT IONENTECHN | 0 | 13% | 0.4% | 1 |
| 6 | KRISTALLOG MAT FOR | 0 | 100% | 0.4% | 1 |
| 7 | MIKROSTRUKTURPHYS OBERFLACHENPHYS | 0 | 100% | 0.4% | 1 |
| 8 | RONTGENOG SPEZIAL | 0 | 100% | 0.4% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000162760 | ALGAAS HETEROSTRUCTURES//EPITAXY ETCHING//QUANTUM WELL LASER STRUCTURES |
| 2 | 0.0000110843 | SECT PHYS PL//KHERSON BRANCH//CARRIERS CAPTURE |
| 3 | 0.0000106533 | MOSSBAUER SPECT//ATOMIC MOTIONS//ASSOCIATO INFM |
| 4 | 0.0000103003 | ELEMENTAL RARE EARTHS SEPARATION//NUCLEAR PUMPING//AI LEIPUNSKI PHYS POWER ENGN |
| 5 | 0.0000077877 | ELECTROEPITAXY//MICROCHANNEL EPITAXY//LIQUID PHASE ELECTROEPITAXY |
| 6 | 0.0000076933 | DISCOVERY OF X RAYS//BITUMINOUS OILS//CRYSTAL SYSTEMS |
| 7 | 0.0000076182 | TOTAL EXTERNAL REFLECTION//X RAY STANDING WAVES//LAYERED SYNTHETIC MICROSTRUCTURES |
| 8 | 0.0000070276 | X RAY MULTIPLE DIFFRACTION//THREE BEAM X RAY DIFFRACTION//RENNINGER SCAN |
| 9 | 0.0000067272 | PHOTON RECYCLING//SEMICONDUCTOR SCINTILLATORS//FSF |
| 10 | 0.0000066498 | QUANTUM WELL LASERS//ANTI GUIDING FACTOR//MULTIQUANTUM WELL LASERS |