Class information for:
Level 1: CONFOCAL SYSTEMS//MICROWAVE PHOTOCONDUCTIVITY//MIS SWITCHING DEVICES

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
25233 239 13.3 27%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
3535 979 LATERAL PHOTOVOLTAGE//CEMOP//CONTINUOUS POSITION SENSITIVE DETECTOR

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 CONFOCAL SYSTEMS Author keyword 0 33% 0% 1
2 MICROWAVE PHOTOCONDUCTIVITY Author keyword 0 13% 0% 1
3 MIS SWITCHING DEVICES Author keyword 0 100% 0% 1
4 OPTICAL SWITCHING DIODES Author keyword 0 100% 0% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 CONFOCAL SYSTEMS 0 33% 0% 1 Search CONFOCAL+SYSTEMS Search CONFOCAL+SYSTEMS
2 MICROWAVE PHOTOCONDUCTIVITY 0 13% 0% 1 Search MICROWAVE+PHOTOCONDUCTIVITY Search MICROWAVE+PHOTOCONDUCTIVITY
3 MIS SWITCHING DEVICES 0 100% 0% 1 Search MIS+SWITCHING+DEVICES Search MIS+SWITCHING+DEVICES
4 OPTICAL SWITCHING DIODES 0 100% 0% 1 Search OPTICAL+SWITCHING+DIODES Search OPTICAL+SWITCHING+DIODES

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 SIS SOLAR CELLS 1 50% 0% 1
2 CONTROLLED ELECTRIC FIELDS 0 100% 0% 1
3 CURRENT MULTIPLICATION 0 100% 0% 1
4 HIGH RESISTIVITY SEMICONDUCTOR 0 100% 0% 1
5 IMPURITY LEVEL 0 100% 0% 1
6 INSULATOR TUNNEL METAL DEVICES 0 100% 0% 1
7 INTERMEDIATE INSULATING LAYER 0 100% 0% 1
8 MISS DEVICES 0 100% 0% 1
9 MSM STRUCTURE 0 100% 0% 1
10 PHOTOCURRENT AMPLIFICATION 0 100% 0% 1

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Fast Optical Detecting Media Based on Semiconductor Nanostructures for Recording Images Obtained Using Charges of Free Photocarriers 2011 0 13 85%
PHOTOELECTRIC PROPERTIES OF METAL-INSULATOR-SEMICONDUCTOR STRUCTURES WITH A TUNNEL-TRANSPARENT INSULATOR LAYER (REVIEW) 1983 27 28 36%
Confocal microscopy of colloids 1997 25 23 4%

Address terms

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000194575 DIRECT TUNNELING//QUANTUM MECHANICAL EFFECTS QMES//WAVE FUNCTION PENETRATION
2 0.0000183212 DIFFUSION TEMPERATURE//DEVICE FUNCT SECT//TWO DIMENSIONAL DEVICE SIMULATION
3 0.0000134809 EDUC SCANNING PROBE MICROSCOPY//LOBACHEVSKY PHYS TECH//PHOTOELECTRIC SPECTROSCOPY
4 0.0000122002 SECT PHYS PL//KHERSON BRANCH//CARRIERS CAPTURE
5 0.0000112427 BACKWARD DIODES//MILLIMETER WAVE DETECTORS//BULK BARRIER DIODES
6 0.0000078395 DELTA DOPING//SELF CONSISTENTLY//DELTA DOPED QUANTUM WELLS
7 0.0000073359 SIPOS//MSOS O P STRUCTURE//SEMI INSULATING POLYCRYSTALLINE SILICON
8 0.0000064129 EMISSION RATE SPECTRUM//CAPACITANCE TRANSIENTS//DLTS RESOLUTION
9 0.0000063936 ELECTRICAL PASSIVATION OF STRUCTURAL DEFECTS//GAAS DIODE//TRIPLE CRYSTAL DIFFRACTOMETRY
10 0.0000051164 COMMERCIAL RELIABILITY PROGRAM//ELECTRONIC COMPONENT RELIABILITY//INTERNET CALIBRATION