Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 26625 | 204 | 12.9 | 28% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 3576 | 936 | SCI PROD ASSOC PHYS SUN//STARODUBTSEV PHYSICOTECH//SOLAR PHYS PROD CORP |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | SELF ORGANIZING PROCESSES | Author keyword | 1 | 50% | 1% | 2 |
| 2 | SELF ORGANIZING EFFECTS | Author keyword | 1 | 50% | 0% | 1 |
| 3 | PLATEFORME RIO BIBS | Address | 0 | 25% | 0% | 1 |
| 4 | LONG RANGE EFFECT | Author keyword | 0 | 12% | 1% | 2 |
| 5 | INGN OSTEOARTICULAIRE DENTU791 | Address | 0 | 100% | 0% | 1 |
| 6 | ROLE OF NATIVE OXIDE | Author keyword | 0 | 100% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | SELF ORGANIZING PROCESSES | 1 | 50% | 1% | 2 | Search SELF+ORGANIZING+PROCESSES | Search SELF+ORGANIZING+PROCESSES |
| 2 | SELF ORGANIZING EFFECTS | 1 | 50% | 0% | 1 | Search SELF+ORGANIZING+EFFECTS | Search SELF+ORGANIZING+EFFECTS |
| 3 | LONG RANGE EFFECT | 0 | 12% | 1% | 2 | Search LONG+RANGE+EFFECT | Search LONG+RANGE+EFFECT |
| 4 | ROLE OF NATIVE OXIDE | 0 | 100% | 0% | 1 | Search ROLE+OF+NATIVE+OXIDE | Search ROLE+OF+NATIVE+OXIDE |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | HEAVILY DOPED HETEROSTRUCTURES | 1 | 100% | 1% | 2 |
| 2 | DEEP IMPURITY CENTER | 1 | 50% | 0% | 1 |
| 3 | INTERSTITIAL ALUMINUM | 0 | 33% | 0% | 1 |
| 4 | LOCAL VIBRATIONS | 0 | 33% | 0% | 1 |
| 5 | ENHANCED MIGRATION | 0 | 25% | 0% | 1 |
| 6 | TIN OXIDE ITO | 0 | 13% | 0% | 1 |
| 7 | QUASI HYDRODYNAMIC SIMULATION | 0 | 100% | 0% | 1 |
| 8 | STIMULATED PHENOMENA | 0 | 100% | 0% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| RECOMBINATION-INDUCED DEFECT HEATING AND RELATED PHENOMENA | 1994 | 17 | 15 | 33% |
| Surface composition of binary ionic crystals: Correlation between evaporation and electronic processes | 1996 | 0 | 12 | 100% |
| THE DEFECT CREATION IN SOLIDS BY A DECAY OF ELECTRONIC EXCITATIONS | 1985 | 72 | 27 | 4% |
| MODELING OF VLSI SEMICONDUCTOR MANUFACTURING PROCESSES | 1989 | 1 | 25 | 4% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | PLATEFORME RIO BIBS | 0 | 25% | 0.5% | 1 |
| 2 | INGN OSTEOARTICULAIRE DENTU791 | 0 | 100% | 0.5% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000171302 | CHARGE FLOW MECHANISM//HEAT TREATMENT METHOD//RECOMBINATION ENHANCED DIFFUSION |
| 2 | 0.0000102327 | STATE SCI EXPT TECH INFORMAT PROTECT PRO//CN PPP//WIDE GAP NANOCRYSTALS |
| 3 | 0.0000072504 | CROSS WAVES//KIRENSKI PHYS//SELF LIMITED GROWTH |
| 4 | 0.0000068218 | FERROBIELASTIC//NUCLEI GROWTH//SOLID STATE REACTION MECHANISM |
| 5 | 0.0000066499 | MONOXIDE FLAME EMISSION SPECTROMETRY//DUAL WAVELENGTH METHOD//ELEMENTS CONTENT |
| 6 | 0.0000066289 | ALPHA LIFEO2//LI5FEO4//LIFEO2 |
| 7 | 0.0000063987 | PL MATH AUTOMAT//PULSE WIDTH DEPENDENCE OF DAMAGE THRESHOLD//KABARDINO BALKAR SCI |
| 8 | 0.0000063131 | EDUC SCANNING PROBE MICROSCOPY//LOBACHEVSKY PHYS TECH//PHOTOELECTRIC SPECTROSCOPY |
| 9 | 0.0000061972 | MLPSO//ABSORPTION COEFFICIENT MEASUREMENT//GALLIUM PHOSPHIDE GAP |
| 10 | 0.0000061781 | MICROSYST IMICRO//MULTIPHONON RECOMBINATION//EXP ANGEW PHYS |