Class information for:
Level 1: COMPLICATED STRUCTURAL COMPONENT//CT METROLOGY//CHAIR METROL QUAL MANAGEMENT

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
27569 186 20.1 34%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1503 6998 PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY//COORDINATE MEASURING MACHINES//COORDINATE METROLOGY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 COMPLICATED STRUCTURAL COMPONENT Author keyword 4 75% 2% 3
2 CT METROLOGY Author keyword 3 100% 2% 3
3 CHAIR METROL QUAL MANAGEMENT Address 3 50% 2% 4
4 CHAIR QUAL MANAGEMENT MFG METROL QFM Address 2 67% 1% 2
5 ENVIRONMENTAL SCATTERING Author keyword 2 67% 1% 2
6 FRAUNHOFER INTEGRATED CIRCUITS IIS Address 2 67% 1% 2
7 SURFACE DETERMINATION Author keyword 2 67% 1% 2
8 CHAIR QUAL MANAGEMENT MFG METROL Address 2 26% 4% 7
9 INFLUENCE QUANTITIES Author keyword 2 43% 2% 3
10 DEV XRAY TECHNOL EZRT Address 1 31% 2% 4

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 COMPLICATED STRUCTURAL COMPONENT 4 75% 2% 3 Search COMPLICATED+STRUCTURAL+COMPONENT Search COMPLICATED+STRUCTURAL+COMPONENT
2 CT METROLOGY 3 100% 2% 3 Search CT+METROLOGY Search CT+METROLOGY
3 ENVIRONMENTAL SCATTERING 2 67% 1% 2 Search ENVIRONMENTAL+SCATTERING Search ENVIRONMENTAL+SCATTERING
4 SURFACE DETERMINATION 2 67% 1% 2 Search SURFACE+DETERMINATION Search SURFACE+DETERMINATION
5 INFLUENCE QUANTITIES 2 43% 2% 3 Search INFLUENCE+QUANTITIES Search INFLUENCE+QUANTITIES
6 COORDINATE METROLOGY 1 12% 5% 9 Search COORDINATE+METROLOGY Search COORDINATE+METROLOGY
7 MICRO COORDINATE MEASURING MACHINE 1 40% 1% 2 Search MICRO+COORDINATE+MEASURING+MACHINE Search MICRO+COORDINATE+MEASURING+MACHINE
8 ALUMINIUM GARNET 1 50% 1% 1 Search ALUMINIUM+GARNET Search ALUMINIUM+GARNET
9 AUTOMATIC ALGORITHM GENERATION 1 50% 1% 1 Search AUTOMATIC+ALGORITHM+GENERATION Search AUTOMATIC+ALGORITHM+GENERATION
10 COMPUTED TOMOGRAPHY MEASUREMENT 1 50% 1% 1 Search COMPUTED+TOMOGRAPHY+MEASUREMENT Search COMPUTED+TOMOGRAPHY+MEASUREMENT

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 TOPOMETRY 1 13% 2% 4
2 STYLUS INSTRUMENTS 0 33% 1% 1
3 PROTEIN ADSORPTION KINETICS 0 10% 1% 1
4 EFAB 0 100% 1% 1
5 HIP JOINT ENDOPROSTHESES 0 100% 1% 1
6 INDUSTRIAL COMPUTED TOMOGRAPHY 0 100% 1% 1

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
OBSERVATION OF SURFACE-MORPHOLOGY AND MEASUREMENT OF SURFACE-TOPOGRAPHY FOR TRIBOLOGY STUDY 1994 0 2 50%
Microsystem Technologies for Medical Applications 2011 5 30 3%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 CHAIR METROL QUAL MANAGEMENT 3 50% 2.2% 4
2 CHAIR QUAL MANAGEMENT MFG METROL QFM 2 67% 1.1% 2
3 FRAUNHOFER INTEGRATED CIRCUITS IIS 2 67% 1.1% 2
4 CHAIR QUAL MANAGEMENT MFG METROL 2 26% 3.8% 7
5 DEV XRAY TECHNOL EZRT 1 31% 2.2% 4
6 LEHRSTUHL FERTIGUNGSMESSTECH QUALITATSMANAGEMEN 1 38% 1.6% 3
7 ELE OENGN INFORMAT TECHNOL 1 100% 1.1% 2
8 HBEREICH KOORDINATENMESSTECH 1 100% 1.1% 2
9 SHANXI SIGNAL C TURING PROC 1 50% 1.1% 2
10 INT UNIV LEUVEN 1 40% 1.1% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000198746 LARGE SCALE METROLOGY//MOBILE MEASURING SYSTEM//LARGE SCALE DIMENSIONAL METROLOGY
2 0.0000152912 PROC MEASUREMENT SENSOR TECHNOL//NANOMETROLOGY//MICRO CMM
3 0.0000143430 FIREARMS IDENTIFICATION//STANDARD BULLET//PRECIS TECHNOL
4 0.0000131126 MINIMUM ZONE//COORDINATE MEASURING MACHINES//REVERSE ENGINEERING
5 0.0000113350 RING ARTEFACTS//HIRUP//KT 1
6 0.0000094068 DUAL ENERGY CT//METAL ARTIFACT REDUCTION//DUAL ENERGY
7 0.0000085636 SECAO TECN DESENVOLVIMENTO TECNOL SAUDE//REG COOPERAT LIFE MAT SCI//ATTENUATION CURVES
8 0.0000083698 FAILURE MODE CLASSIFICATION//NSF ADV VEHICLE EXTREME ENVIRONM ELECT CAVE//BIOENGN HLTH TECHNOL GRP
9 0.0000076037 MICROFOCUS X RAY RADIOGRAPHY//BEAM SUM//HARDENING CORRECTION MODEL
10 0.0000069868 SURLENS//2D 3D REGISTRATION//ANATOMY AND IMAGE BASED REGISTRATION