Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 28103 | 175 | 24.2 | 78% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 1005 | 9882 | SELF ASSEMBLED MONOLAYERS//SELF ASSEMBLED MONOLAYER//DIP PEN NANOLITHOGRAPHY |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | CHARGE WRITING | Author keyword | 10 | 73% | 5% | 8 |
| 2 | CAPILLARY FORCE ASSEMBLY | Author keyword | 4 | 67% | 2% | 4 |
| 3 | NANOPARTICLE PATTERNING | Author keyword | 4 | 75% | 2% | 3 |
| 4 | HGEBIET NANOTECHNOL | Address | 3 | 50% | 2% | 4 |
| 5 | AVIDIN BIOTIN REACTION | Author keyword | 2 | 67% | 1% | 2 |
| 6 | NANOXEROGRAPHY | Author keyword | 2 | 67% | 1% | 2 |
| 7 | TRAPPED SURFACE CHARGES | Author keyword | 2 | 67% | 1% | 2 |
| 8 | CHEMICAL NANOPATTERNING | Author keyword | 1 | 100% | 1% | 2 |
| 9 | MASKLESS MICROFABRICATION | Author keyword | 1 | 100% | 1% | 2 |
| 10 | CNRSUMR 5215UPS | Address | 1 | 50% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | CHARGE WRITING | 10 | 73% | 5% | 8 | Search CHARGE+WRITING | Search CHARGE+WRITING |
| 2 | CAPILLARY FORCE ASSEMBLY | 4 | 67% | 2% | 4 | Search CAPILLARY+FORCE+ASSEMBLY | Search CAPILLARY+FORCE+ASSEMBLY |
| 3 | NANOPARTICLE PATTERNING | 4 | 75% | 2% | 3 | Search NANOPARTICLE+PATTERNING | Search NANOPARTICLE+PATTERNING |
| 4 | AVIDIN BIOTIN REACTION | 2 | 67% | 1% | 2 | Search AVIDIN+BIOTIN+REACTION | Search AVIDIN+BIOTIN+REACTION |
| 5 | NANOXEROGRAPHY | 2 | 67% | 1% | 2 | Search NANOXEROGRAPHY | Search NANOXEROGRAPHY |
| 6 | TRAPPED SURFACE CHARGES | 2 | 67% | 1% | 2 | Search TRAPPED+SURFACE+CHARGES | Search TRAPPED+SURFACE+CHARGES |
| 7 | CHEMICAL NANOPATTERNING | 1 | 100% | 1% | 2 | Search CHEMICAL+NANOPATTERNING | Search CHEMICAL+NANOPATTERNING |
| 8 | MASKLESS MICROFABRICATION | 1 | 100% | 1% | 2 | Search MASKLESS+MICROFABRICATION | Search MASKLESS+MICROFABRICATION |
| 9 | COLLOID ASSEMBLY | 1 | 50% | 1% | 1 | Search COLLOID+ASSEMBLY | Search COLLOID+ASSEMBLY |
| 10 | IN SE | 1 | 50% | 1% | 1 | Search IN+SE | Search IN+SE |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | NANOXEROGRAPHY | 7 | 46% | 6% | 11 |
| 2 | AEROTAXY | 3 | 100% | 2% | 3 |
| 3 | SERS BASED DETECTION | 2 | 67% | 1% | 2 |
| 4 | SINGLE PARTICLE RESOLUTION | 2 | 67% | 1% | 2 |
| 5 | CONDENSATION MAGNIFICATION | 1 | 100% | 1% | 2 |
| 6 | ELECTRODYNAMIC PRECIPITATION | 1 | 50% | 1% | 2 |
| 7 | INDUCED LATERAL DAMAGE | 1 | 50% | 1% | 1 |
| 8 | GAAS QUANTUM DOTS | 1 | 18% | 2% | 3 |
| 9 | PLASMA ETCHING TECHNIQUES | 0 | 33% | 1% | 1 |
| 10 | INTELLIGENT MATERIALS | 0 | 25% | 1% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Electrostatic self-assembly of nanoparticles into ordered nanowire arrays | 2011 | 0 | 17 | 47% |
| Nano-fabrication: A review | 2007 | 2 | 23 | 43% |
| Strategies for controlled placement of nanoscale building blocks | 2007 | 59 | 199 | 6% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | HGEBIET NANOTECHNOL | 3 | 50% | 2.3% | 4 |
| 2 | CNRSUMR 5215UPS | 1 | 50% | 0.6% | 1 |
| 3 | LEATHER CHEM ENGN MINIST EDUC | 1 | 50% | 0.6% | 1 |
| 4 | SUCURSALA ICPI | 1 | 50% | 0.6% | 1 |
| 5 | HFA | 1 | 29% | 1.1% | 2 |
| 6 | PROC AEROSOL MEASUREMENT TECHNOL | 1 | 25% | 1.1% | 2 |
| 7 | LTM CNRS UJF | 1 | 22% | 1.1% | 2 |
| 8 | CNRS LTM | 0 | 33% | 0.6% | 1 |
| 9 | INAC SIN S SP2M | 0 | 33% | 0.6% | 1 |
| 10 | NANOPARTICLE BASED MFG METROL | 0 | 33% | 0.6% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000179862 | UNIPOLAR CHARGING//UNIPOLAR CHARGER//DIFFERENTIAL MOBILITY ANALYZER DMA |
| 2 | 0.0000134586 | DIP PEN NANOLITHOGRAPHY//POLYMER PEN LITHOGRAPHY//DIP PEN NANOLITHOGRAPHY DPN |
| 3 | 0.0000133211 | SCANNING CAPACITANCE MICROSCOPY//KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY |
| 4 | 0.0000124679 | SOLUTION LIQUID SOLID GROWTH//GAP NANOCRYSTALS//PARTICULATE THIN FILM |
| 5 | 0.0000115759 | AU NANOWIRE//LOW MOLECULAR WEIGHT ORGANICS//NANOPOROUS MASK |
| 6 | 0.0000101620 | MICROCONTACT PRINTING//SOFT LITHOGRAPHY//CAPILLARY FORCE LITHOGRAPHY |
| 7 | 0.0000087946 | RESONANCE DYNAMIC DIPOLE DIPOLE INTERACTION RDDDI//DYNAMIC DIPOLE DIPOLE INTERACTION//QUBIT SWAP PI4 GATE |
| 8 | 0.0000077293 | FLUIDIC SELF ASSEMBLY//FLUIDIC SELF ASSEMBLY FSA//OE MCMS |
| 9 | 0.0000070309 | LOCAL ANODIC OXIDATION//AFM LITHOGRAPHY//NANO OXIDATION |
| 10 | 0.0000065662 | ELECTROHYDRODYNAMIC ATOMIZATION//ELECTROSPRAYING//ELECTROSPRAY |