Class information for:
Level 1: VISUALIZATION OF PHASE OBJECTS//COLOR INTERFEROMETRY//FOCUSING SCHLIEREN

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
30075 143 11.7 37%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
3560 948 DEMINERALIZED DENTIN MATRIX//ESTUDOS AVANCADOS IEAV//ASSOCIATED SENSORS MAT LAS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 VISUALIZATION OF PHASE OBJECTS Author keyword 1 33% 1% 2
2 COLOR INTERFEROMETRY Author keyword 1 50% 1% 1
3 FOCUSING SCHLIEREN Author keyword 1 50% 1% 1
4 LAWRENCE BERKELEY ADV LIGHT SOURCE Address 1 50% 1% 1
5 OPT OPT TECHNOL Address 1 50% 1% 1
6 OPTICAL SURFACE ANALYSER Author keyword 1 50% 1% 1
7 PERIODIC IMAGE Author keyword 1 50% 1% 1
8 SEMICONDUCTOR CONTAMINATION Author keyword 1 50% 1% 1
9 TRANSVERSE RAY ABERRATIONS Author keyword 1 50% 1% 1
10 SEMIDERIVATIVE REAL FILTER Author keyword 0 33% 1% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 VISUALIZATION OF PHASE OBJECTS 1 33% 1% 2 Search VISUALIZATION+OF+PHASE+OBJECTS Search VISUALIZATION+OF+PHASE+OBJECTS
2 COLOR INTERFEROMETRY 1 50% 1% 1 Search COLOR+INTERFEROMETRY Search COLOR+INTERFEROMETRY
3 FOCUSING SCHLIEREN 1 50% 1% 1 Search FOCUSING+SCHLIEREN Search FOCUSING+SCHLIEREN
4 OPTICAL SURFACE ANALYSER 1 50% 1% 1 Search OPTICAL+SURFACE+ANALYSER Search OPTICAL+SURFACE+ANALYSER
5 PERIODIC IMAGE 1 50% 1% 1 Search PERIODIC+IMAGE Search PERIODIC+IMAGE
6 SEMICONDUCTOR CONTAMINATION 1 50% 1% 1 Search SEMICONDUCTOR+CONTAMINATION Search SEMICONDUCTOR+CONTAMINATION
7 TRANSVERSE RAY ABERRATIONS 1 50% 1% 1 Search TRANSVERSE+RAY+ABERRATIONS Search TRANSVERSE+RAY+ABERRATIONS
8 SEMIDERIVATIVE REAL FILTER 0 33% 1% 1 Search SEMIDERIVATIVE+REAL+FILTER Search SEMIDERIVATIVE+REAL+FILTER
9 FRESNEL IMAGING 0 25% 1% 1 Search FRESNEL+IMAGING Search FRESNEL+IMAGING
10 DARK FIELD MICROSCOPE 0 20% 1% 1 Search DARK+FIELD+MICROSCOPE Search DARK+FIELD+MICROSCOPE

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 REAL TIME ENHANCEMENT 6 71% 3% 5
2 2 DIMENSIONAL OBJECTS 6 100% 3% 4
3 PHASE CHANGE VISUALIZATION 3 50% 3% 4
4 CHANGE VISUALIZATION 2 67% 1% 2
5 SEMIDERIVATIVE REAL FILTER 2 67% 1% 2
6 NON INTEGER ORDER 1 40% 1% 2
7 SHOCK IMPINGEMENT 1 50% 1% 1
8 CONDUCTING WIRE GRATINGS 0 13% 1% 1
9 GLASSY CHALCOGENIDE SEMICONDUCTOR 0 100% 1% 1
10 SUBMICROMETER DEFECT DETECTION 0 100% 1% 1

Journals

Reviews

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 LAWRENCE BERKELEY ADV LIGHT SOURCE 1 50% 0.7% 1
2 OPT OPT TECHNOL 1 50% 0.7% 1
3 JSTC 0 25% 0.7% 1
4 GEN ENGN QUAL ASSURANCE 0 20% 0.7% 1
5 PHOTON INFORMAT MEDIA ENGN 0 13% 0.7% 1
6 OPTOELE COMP SYST SCI FDN 0 100% 0.7% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000174825 DEMINERALIZED DENTIN MATRIX//AUTOGENOUS DEMINERALIZED DENTIN MATRIX//CONTINUOUS MULTIRESOLUTION ENTROPY
2 0.0000132720 LASER INTERFERENCE MICROSCOPY//COHERENT PHASE MICROSCOPY//DYNAMIC PHASE MICROSCOPY
3 0.0000103610 157 NM LASER//SUR E ENGN OPTOELECT F4//HYBRIDIZATION REACTION
4 0.0000101598 SCI PL ECOL//BUILDING CUBE METHOD//NPK
5 0.0000072181 HOLOGRAPHIC LENSES//LLOYDS MIRROR INTERFERENCE//EXIT PUPIL EXPANDER
6 0.0000069089 PHOTOELECTRIC DETECTION TARGET//PLAN OF WEAVE//WOVEN ORNAMENT
7 0.0000068431 LASER INTERFERENCE METALLURGY//DIRECT DIGITAL MFG//JR3CN
8 0.0000067646 ELECTROHOLOGRAPHY//DISPLAY 3D//HOLODIGILOG HUMAN MEDIA HOLODIGILOG
9 0.0000066774 WAVELENGTH DEPENDENT EFFECTS//MATHEMATICAL METHODS OF OPTICS//MAXWELL OPTICS
10 0.0000066665 DEFECT DETECTION//YARN DYED FABRIC//SURFACE INSPECTION