Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 30295 | 140 | 13.4 | 51% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 360 | 16761 | PATTERN RECOGNITION//PATTERN RECOGNITION LETTERS//IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | DEFECT CLASSIFIER | Author keyword | 2 | 67% | 1% | 2 |
| 2 | PLASTIC OPTIC FIBER BUNDLE | Author keyword | 2 | 67% | 1% | 2 |
| 3 | AUTOMATIC OPTICAL INSPECTION SYSTEM | Author keyword | 2 | 50% | 2% | 3 |
| 4 | BIPOLAR SEMICONDUCTOR TECHNOLOGY | Author keyword | 1 | 100% | 1% | 2 |
| 5 | GYEONGGI TECHNOPK | Address | 1 | 50% | 1% | 2 |
| 6 | VISUAL ALIGNMENT | Author keyword | 1 | 25% | 2% | 3 |
| 7 | AUTO LOADING | Author keyword | 1 | 50% | 1% | 1 |
| 8 | BIODISK | Author keyword | 1 | 50% | 1% | 1 |
| 9 | CENTROID ALGORITHMS | Author keyword | 1 | 50% | 1% | 1 |
| 10 | ECOLI DETECTION | Author keyword | 1 | 50% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | DEFECT CLASSIFIER | 2 | 67% | 1% | 2 | Search DEFECT+CLASSIFIER | Search DEFECT+CLASSIFIER |
| 2 | PLASTIC OPTIC FIBER BUNDLE | 2 | 67% | 1% | 2 | Search PLASTIC+OPTIC+FIBER+BUNDLE | Search PLASTIC+OPTIC+FIBER+BUNDLE |
| 3 | AUTOMATIC OPTICAL INSPECTION SYSTEM | 2 | 50% | 2% | 3 | Search AUTOMATIC+OPTICAL+INSPECTION+SYSTEM | Search AUTOMATIC+OPTICAL+INSPECTION+SYSTEM |
| 4 | BIPOLAR SEMICONDUCTOR TECHNOLOGY | 1 | 100% | 1% | 2 | Search BIPOLAR+SEMICONDUCTOR+TECHNOLOGY | Search BIPOLAR+SEMICONDUCTOR+TECHNOLOGY |
| 5 | VISUAL ALIGNMENT | 1 | 25% | 2% | 3 | Search VISUAL+ALIGNMENT | Search VISUAL+ALIGNMENT |
| 6 | AUTO LOADING | 1 | 50% | 1% | 1 | Search AUTO+LOADING | Search AUTO+LOADING |
| 7 | BIODISK | 1 | 50% | 1% | 1 | Search BIODISK | Search BIODISK |
| 8 | CENTROID ALGORITHMS | 1 | 50% | 1% | 1 | Search CENTROID+ALGORITHMS | Search CENTROID+ALGORITHMS |
| 9 | ECOLI DETECTION | 1 | 50% | 1% | 1 | Search ECOLI+DETECTION | Search ECOLI+DETECTION |
| 10 | ENCODED PATTERNS | 1 | 50% | 1% | 1 | Search ENCODED+PATTERNS | Search ENCODED+PATTERNS |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | MICROCHIP SYSTEM | 4 | 75% | 2% | 3 |
| 2 | HIGH ACCURACY POSITION | 1 | 38% | 2% | 3 |
| 3 | PIXEL ACCURACY ESTIMATION | 1 | 100% | 1% | 2 |
| 4 | MOIRE INTERFERENCE | 1 | 50% | 1% | 1 |
| 5 | OBJECT TRANSFORMATION | 1 | 50% | 1% | 1 |
| 6 | SUBPIXEL EDGE DETECTION | 0 | 20% | 1% | 2 |
| 7 | PROBE ASSAYS | 0 | 33% | 1% | 1 |
| 8 | AUTOMATIC MASK ALIGNMENT | 0 | 25% | 1% | 1 |
| 9 | BIOWARFARE AGENTS | 0 | 25% | 1% | 1 |
| 10 | FAST HOUGH TRANSFORM | 0 | 14% | 1% | 1 |
Journals |
Reviews |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | GYEONGGI TECHNOPK | 1 | 50% | 1.4% | 2 |
| 2 | INTERGRATED CHINESE WESTERN MED | 1 | 50% | 0.7% | 1 |
| 3 | MICROTECH FRANCHE COMTE OPT PM DUFFIEUX | 1 | 50% | 0.7% | 1 |
| 4 | HIGHTECH | 0 | 11% | 2.9% | 4 |
| 5 | ASSOC PROJET AURORE | 0 | 33% | 0.7% | 1 |
| 6 | CNRSENSMM | 0 | 33% | 0.7% | 1 |
| 7 | GRP MAT AVANZADOS ENERGIA | 0 | 25% | 0.7% | 1 |
| 8 | SLOVENIAN BLDG | 0 | 25% | 0.7% | 1 |
| 9 | EUROPEAN MOL MED SEMM | 0 | 17% | 0.7% | 1 |
| 10 | MECHATRON TEAM | 0 | 17% | 0.7% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000184035 | APPROXIMATE SIGNAL PROCESSING//FULL SEARCH EQUIVALENT ALGORITHM//INCREMENTAL REFINEMENT OF COMPUTATION |
| 2 | 0.0000157492 | SOLDER JOINT INSPECTION//AUTOMATIC OPTICAL INSPECTION//SOLDERING ASSESSMENT |
| 3 | 0.0000156642 | LINTING//OFFSET PRINTING//LINT TESTS |
| 4 | 0.0000141750 | DOT MATRIX HOLOGRAM//BAR CODE DECODING//ANTICOUNTERFEITING |
| 5 | 0.0000117924 | DEFECT DETECTION//YARN DYED FABRIC//SURFACE INSPECTION |
| 6 | 0.0000092560 | GAZE TRACKING//GAZE ESTIMATION//GAZE DETECTION |
| 7 | 0.0000088614 | DATA MANAGEMENT AND ANALYSIS//DAYHOFF MATRIX//IMMUNOL HISTOCOMPATIB |
| 8 | 0.0000086659 | LABEL EQUIVALENCE//LABELING ALGORITHM//FIRST SCAN |
| 9 | 0.0000074083 | BLACK STAIN//STABILIZATION RESONANCE ENERGY//BLACK TOOTH STAIN |
| 10 | 0.0000071607 | DPTO AUTOMAT COMPUTAC//QUATERNION CONVOLUTION//WAVELETS STRATEG PROGRAMME |