Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 34322 | 73 | 22.5 | 31% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 142 | 22391 | JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY//SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY//ELECTROTHERMAL VAPORIZATION |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | CADMIUM YELLOW | Author keyword | 3 | 100% | 4% | 3 |
| 2 | ELECTRON BACKSCATTERING COEFFICIENT | Author keyword | 1 | 50% | 1% | 1 |
| 3 | EYE CATARACTS | Author keyword | 1 | 50% | 1% | 1 |
| 4 | GALLIUM ARSENIDE WAFER | Author keyword | 1 | 50% | 1% | 1 |
| 5 | PIGMENT INTERACTION | Author keyword | 1 | 50% | 1% | 1 |
| 6 | POSITION TAGGED SPECTROMETRY | Author keyword | 1 | 50% | 1% | 1 |
| 7 | SCATTER DIAGRAM ANALYSIS | Author keyword | 1 | 50% | 1% | 1 |
| 8 | ZETA FACTORS | Author keyword | 1 | 50% | 1% | 1 |
| 9 | CADMIUM PIGMENTS | Author keyword | 0 | 33% | 1% | 1 |
| 10 | COMPOSITIONAL IMAGING | Author keyword | 0 | 33% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | CADMIUM YELLOW | 3 | 100% | 4% | 3 | Search CADMIUM+YELLOW | Search CADMIUM+YELLOW |
| 2 | ELECTRON BACKSCATTERING COEFFICIENT | 1 | 50% | 1% | 1 | Search ELECTRON+BACKSCATTERING+COEFFICIENT | Search ELECTRON+BACKSCATTERING+COEFFICIENT |
| 3 | EYE CATARACTS | 1 | 50% | 1% | 1 | Search EYE+CATARACTS | Search EYE+CATARACTS |
| 4 | GALLIUM ARSENIDE WAFER | 1 | 50% | 1% | 1 | Search GALLIUM+ARSENIDE+WAFER | Search GALLIUM+ARSENIDE+WAFER |
| 5 | PIGMENT INTERACTION | 1 | 50% | 1% | 1 | Search PIGMENT+INTERACTION | Search PIGMENT+INTERACTION |
| 6 | POSITION TAGGED SPECTROMETRY | 1 | 50% | 1% | 1 | Search POSITION+TAGGED+SPECTROMETRY | Search POSITION+TAGGED+SPECTROMETRY |
| 7 | SCATTER DIAGRAM ANALYSIS | 1 | 50% | 1% | 1 | Search SCATTER+DIAGRAM+ANALYSIS | Search SCATTER+DIAGRAM+ANALYSIS |
| 8 | ZETA FACTORS | 1 | 50% | 1% | 1 | Search ZETA+FACTORS | Search ZETA+FACTORS |
| 9 | CADMIUM PIGMENTS | 0 | 33% | 1% | 1 | Search CADMIUM+PIGMENTS | Search CADMIUM+PIGMENTS |
| 10 | COMPOSITIONAL IMAGING | 0 | 33% | 1% | 1 | Search COMPOSITIONAL+IMAGING | Search COMPOSITIONAL+IMAGING |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | ELECTRON PROBE MICROANALYZER | 3 | 50% | 7% | 5 |
| 2 | PULSE PROCESSOR | 1 | 50% | 1% | 1 |
| 3 | SPECTROMETRY LEEIXS | 0 | 17% | 1% | 1 |
| 4 | MICROBEAM ANALYSIS | 0 | 14% | 1% | 1 |
| 5 | MS TRACE ELEMENT | 0 | 14% | 1% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Saving the photons: mapping x-rays by position-tagged spectrometry | 1999 | 7 | 7 | 57% |
| AUTOMATED SYSTEMS OF IMAGE-PROCESSING AND METALLOGRAPHIC INSPECTION (REVIEW) | 1987 | 0 | 4 | 75% |
| ATOMIC SPECTROMETRY UPDATE INDUSTRIAL ANALYSIS - METALS, CHEMICALS AND ADVANCED MATERIALS | 1991 | 4 | 181 | 7% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | MKT PLICAT GRP | 0 | 100% | 1.4% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000223137 | KUPA RIVER DRAINAGE BASIN//ALUMINUM INTERFERENCE//RIVERS OF KOSOVO |
| 2 | 0.0000184408 | ENGN 36//MINIMUM MASS FRACTION//QUANTITATIVE X RAY MAPPING |
| 3 | 0.0000179200 | ELE ON SPECT GRP//HOTSPOT RADIATION//CAO CRUCIBLE |
| 4 | 0.0000161808 | CHITON//CHITON RADULA//EASY MAGNETIZATION DIRECTION |
| 5 | 0.0000158722 | LEEIXS//SOFT X RAY SPECTROMETRY//SIO2 NA2O BINARY SLAG |
| 6 | 0.0000158287 | EFTEM//ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY EFTEM//SPECTRUM IMAGING |
| 7 | 0.0000116028 | ETUD SCI NAT ENVIRONM//CONTINUOUS FLOW CENTRIFUGE//QUARTIER BINZA UPN |
| 8 | 0.0000100452 | LOW Z PARTICLE ELECTRON PROBE X RAY MICROANALYSIS//INDIVIDUAL PARTICLE ANALYSIS//LOW Z PARTICLE EPMA |
| 9 | 0.0000094818 | DIGITAL SPECTROSCOPY//NUCLEAR COUNTING//CDZNTE SEMICONDUCTOR DETECTOR |
| 10 | 0.0000094084 | VITREOUS ENAMEL//VITREOUS ENAMEL COATING//PROPERMA ENGN COATINGS |