Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 35020 | 55 | 18.5 | 65% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 1376 | 7700 | GALLIUM ARSENIDE//SULFUR PASSIVATION//INDIUM ARSENIDE |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | INDIUM PHOSPHIDE100 | Author keyword | 3 | 100% | 5% | 3 |
| 2 | INTERACTION IONS MATTER | Author keyword | 2 | 67% | 4% | 2 |
| 3 | SIMULATION METHOD TRIM | Author keyword | 2 | 67% | 4% | 2 |
| 4 | INPO4 | Author keyword | 1 | 50% | 4% | 2 |
| 5 | LMCDD | Address | 1 | 100% | 4% | 2 |
| 6 | MICROELECT PL | Address | 1 | 16% | 13% | 7 |
| 7 | SCI MAT ELECT AUTOMAT | Address | 1 | 11% | 15% | 8 |
| 8 | ALUMINA LAYERS | Author keyword | 1 | 50% | 2% | 1 |
| 9 | MESU PHYS IUT | Address | 1 | 50% | 2% | 1 |
| 10 | METAL INSULATOR SEMICONDUCTORS | Author keyword | 1 | 50% | 2% | 1 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | INDIUM PHOSPHIDE100 | 3 | 100% | 5% | 3 | Search INDIUM+PHOSPHIDE100 | Search INDIUM+PHOSPHIDE100 |
| 2 | INTERACTION IONS MATTER | 2 | 67% | 4% | 2 | Search INTERACTION+IONS+MATTER | Search INTERACTION+IONS+MATTER |
| 3 | SIMULATION METHOD TRIM | 2 | 67% | 4% | 2 | Search SIMULATION+METHOD+TRIM | Search SIMULATION+METHOD+TRIM |
| 4 | INPO4 | 1 | 50% | 4% | 2 | Search INPO4 | Search INPO4 |
| 5 | ALUMINA LAYERS | 1 | 50% | 2% | 1 | Search ALUMINA+LAYERS | Search ALUMINA+LAYERS |
| 6 | METAL INSULATOR SEMICONDUCTORS | 1 | 50% | 2% | 1 | Search METAL+INSULATOR+SEMICONDUCTORS | Search METAL+INSULATOR+SEMICONDUCTORS |
| 7 | SR XPS | 0 | 33% | 2% | 1 | Search SR+XPS | Search SR+XPS |
| 8 | MODEL OF NON EQUILIBRIUM PHENOMENA | 0 | 25% | 2% | 1 | Search MODEL+OF+NON+EQUILIBRIUM+PHENOMENA | Search MODEL+OF+NON+EQUILIBRIUM+PHENOMENA |
| 9 | INP SURFACE | 0 | 17% | 2% | 1 | Search INP+SURFACE | Search INP+SURFACE |
| 10 | INP SUBSTRATES | 0 | 13% | 2% | 1 | Search INP+SUBSTRATES | Search INP+SUBSTRATES |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | ELS | 3 | 37% | 13% | 7 |
| 2 | EPES | 2 | 25% | 15% | 8 |
| 3 | AUGER ANALYSIS | 0 | 13% | 5% | 3 |
| 4 | INP100 SURFACE | 0 | 18% | 4% | 2 |
| 5 | SURFACE STABILIZATION | 0 | 25% | 2% | 1 |
| 6 | INSB001 | 0 | 14% | 2% | 1 |
| 7 | PRESSURE PHASE TRANSITIONS | 0 | 14% | 2% | 1 |
| 8 | IN053GA047AS INP | 0 | 11% | 2% | 1 |
Journals |
Reviews |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | LMCDD | 1 | 100% | 3.6% | 2 |
| 2 | MICROELECT PL | 1 | 16% | 13% | 7 |
| 3 | SCI MAT ELECT AUTOMAT | 1 | 11% | 15% | 8 |
| 4 | MESU PHYS IUT | 1 | 50% | 1.8% | 1 |
| 5 | AMEL | 0 | 33% | 1.8% | 1 |
| 6 | LPSCE | 0 | 33% | 1.8% | 1 |
| 7 | IUT B RUE FRANCE VILLEURBANNE | 0 | 100% | 1.8% | 1 |
| 8 | MULTI MAT INTER ES | 0 | 100% | 1.8% | 1 |
| 9 | PL MICRO ELECT | 0 | 100% | 1.8% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000281509 | SEMICOND INTEGRATED CIRCUIT//SCI TECH FES SAIS//HIGFET |
| 2 | 0.0000263111 | ING ELECT SEES//SECC PUEBLA//ALLOY SOURCE |
| 3 | 0.0000217782 | ELECTRONIC RADIATION//RUMENTAT MESU//CROSS SECTIONAL SEM |
| 4 | 0.0000210108 | WEBSTER//ADIABATIC BOND CHARGE MODEL//INAS110 |
| 5 | 0.0000193760 | IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION |
| 6 | 0.0000191222 | ION SPUTTERING//HBEREICH AUTOMATISIERUNG INFORMAT//ION EROSION |
| 7 | 0.0000155475 | INN//INDIUM NITRIDE//INN PROJECT |
| 8 | 0.0000155418 | CEA SERV RECH SUR ES IRRADIAT MAT//CHIM ORGAN THEORIQUE//DISPLAY DEVICE CO |
| 9 | 0.0000141958 | CUBIC GAN//FB PHYS 6//HEXAGONAL GAN |
| 10 | 0.0000109021 | ATOMIC HYDROGEN CLEANING//ECR HYDROGEN PLASMA//IN SITU VACUUM PROCESS |