Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
4134 | 1766 | 20.6 | 70% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
751 | 11810 | ATOMIC FORCE MICROSCOPE//DISSENY PROGRAMACIO SISTEMES ELECT//LOCAL ANODIC OXIDATION |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | LOCAL TUNNELING BARRIER HEIGHT | Author keyword | 8 | 75% | 0% | 6 |
2 | LOCAL TUNNELING BARRIER HEIGHT LBH | Author keyword | 8 | 100% | 0% | 5 |
3 | I S CHARACTERISTICS | Author keyword | 6 | 80% | 0% | 4 |
4 | LOCAL WORK FUNCTION | Author keyword | 6 | 53% | 0% | 8 |
5 | ELECTRON STANDING WAVE | Author keyword | 5 | 63% | 0% | 5 |
6 | ATOMIC CORRUGATION | Author keyword | 3 | 100% | 0% | 3 |
7 | ELECTRON ORBITAL | Author keyword | 2 | 67% | 0% | 2 |
8 | BARRIER HEIGHT IMAGING | Author keyword | 1 | 50% | 0% | 2 |
9 | BESOCKE STYLE SCANNER | Author keyword | 1 | 100% | 0% | 2 |
10 | MICROSCOPIC WORK FUNCTION | Author keyword | 1 | 100% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MOIRE PATTERN | 27 | 78% | 1% | 18 |
2 | INERTIAL SLIDER | 23 | 100% | 1% | 10 |
3 | SUPERPERIODIC FEATURES | 14 | 100% | 0% | 7 |
4 | COARSE APPROACH | 9 | 83% | 0% | 5 |
5 | SCATTERING THEORETIC APPROACH | 6 | 80% | 0% | 4 |
6 | TUNNELING MICROSCOPE | 5 | 10% | 3% | 47 |
7 | TUNNELLING MICROSCOPY | 5 | 20% | 1% | 21 |
8 | MICROPOSITIONER | 5 | 32% | 1% | 12 |
9 | CORRUGATIONS | 4 | 23% | 1% | 16 |
10 | GIANT CORRUGATIONS | 4 | 33% | 1% | 10 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
A review and outlook for an anomaly of scanning tunnelling microscopy (STM): Superlattices on graphite | 2005 | 86 | 76 | 53% |
Invited Review Article: A 10 mK scanning probe microscopy facility | 2010 | 33 | 63 | 43% |
STM-theory: Image potential, chemistry and surface relaxation | 2006 | 50 | 69 | 43% |
Scanning tunneling microscopy of semiconductor surfaces | 1996 | 152 | 239 | 28% |
SCANNING TUNNELING MICROSCOPE INSTRUMENTATION | 1989 | 172 | 107 | 59% |
1ST-PRINCIPLES THEORY OF SCANNING TUNNELING MICROSCOPY | 1991 | 76 | 51 | 65% |
SCANNING TUNNELING MICROSCOPY | 1987 | 426 | 68 | 59% |
ATOMIC-RESOLUTION SURFACE SPECTROSCOPY WITH THE SCANNING TUNNELING MICROSCOPE | 1989 | 144 | 66 | 56% |
SCANNING TUNNELING MICROSCOPY | 1992 | 35 | 395 | 43% |
Scanned probe microscopies in chemistry | 1996 | 81 | 224 | 15% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ATOM PHYS SUR E SCI | 1 | 50% | 0.1% | 1 |
2 | AUSTRALIA COUNCIL EXCELLENCE QUANTUM COMP | 1 | 50% | 0.1% | 1 |
3 | C T SPIN INVEST TEAM | 1 | 50% | 0.1% | 1 |
4 | NANOELECT MAT GRP | 1 | 50% | 0.1% | 1 |
5 | PHYS MATHEMAT | 1 | 50% | 0.1% | 1 |
6 | TAUKUBA ADV ALLIANCE | 1 | 50% | 0.1% | 1 |
7 | HBEREICH PHYS TECHNOL 10 | 0 | 33% | 0.1% | 1 |
8 | PROBLEMS MICROELECT TECHNOL HIGHLY PURE MA | 0 | 33% | 0.1% | 1 |
9 | SYNTH NANO FUNCT MAT PROJECT | 0 | 33% | 0.1% | 1 |
10 | ELECT ENGN MAT SCI TECHNOL | 0 | 25% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000291135 | APEX RADIUS//GRP MAT NANOESTRUCT//TIP FABRICATION |
2 | 0.0000239378 | CHUGOKU IND//LOW ENERGY ARGON ION//BROWN 175 |
3 | 0.0000182444 | CHAIR QUANTUM RADIO PHYS//X RAY EXCITED CURRENT//SHERMAN FAIRCHILD SOLID STATE STUDIES |
4 | 0.0000156196 | TUNNELING ACOUSTIC MICROSCOPY//SAW IMAGING//MICRODISPLACEMENT MEASUREMENT |
5 | 0.0000124055 | DNA NETWORK//FOR UNGSZENTRUM IBI STRUCT BIOL 2//CRYO AFM |
6 | 0.0000120221 | SPIN POLARIZED SCANNING TUNNELING MICROSCOPY//ILSE KATZ NANOMETER SCALE SCI TECHNOL//MICROSTRUCT ADV |
7 | 0.0000100283 | TIP CHARACTERIZATION//TIP CHARACTERIZER//SIDEWALL MEASUREMENT |
8 | 0.0000089911 | LOCAL ANODIC OXIDATION//AFM LITHOGRAPHY//NANO OXIDATION |
9 | 0.0000086291 | DISSENY PROGRAMACIO SISTEMES ELECT//FUTURE ENERGY IFES//QPLUS |
10 | 0.0000086112 | NHMLF PHYS//MOLECULAR ORGANIC MATERIALS//TTF TCNQ |