Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
4571 | 1690 | 17.1 | 49% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
687 | 12408 | JOURNAL OF SYNCHROTRON RADIATION//DIFFRACTION ENHANCED IMAGING//PHASE RETRIEVAL |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | X RAY CTR | Author keyword | 15 | 88% | 0% | 7 |
2 | GLANCING ANGLE INCIDENCE | Author keyword | 1 | 100% | 0% | 2 |
3 | X RAY CRYSTAL TRUNCATION ROD | Author keyword | 1 | 100% | 0% | 2 |
4 | X RAY EXTINCTION | Author keyword | 1 | 100% | 0% | 2 |
5 | PANALYT | Address | 1 | 23% | 0% | 5 |
6 | DYNAMICAL X RAY DIFFRACTION | Author keyword | 1 | 40% | 0% | 2 |
7 | COHERENT XRAY OPT | Address | 1 | 13% | 0% | 5 |
8 | BRANCH OFF MUNICH | Address | 1 | 50% | 0% | 1 |
9 | CYLINDRICAL CRYSTALS | Author keyword | 1 | 50% | 0% | 1 |
10 | DYNAMICAL THEORY OF SCATTERING | Author keyword | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | STATISTICAL DYNAMICAL THEORY | 52 | 76% | 2% | 37 |
2 | ROCKING CURVES | 28 | 53% | 2% | 37 |
3 | SPECULAR REFLECTION CONDITIONS | 27 | 83% | 1% | 15 |
4 | CRYSTAL DIFFRACTION | 20 | 62% | 1% | 21 |
5 | FAR TAILS | 20 | 100% | 1% | 9 |
6 | RANDOMLY DISORDERED CRYSTALS | 20 | 100% | 1% | 9 |
7 | COHERENCE DESCRIPTION | 17 | 100% | 0% | 8 |
8 | BRAGG DIFFRACTION | 16 | 23% | 4% | 62 |
9 | BRAGG PEAKS | 14 | 100% | 0% | 7 |
10 | TRIPLE CRYSTAL DIFFRACTOMETRY | 13 | 62% | 1% | 13 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
X-RAY-DIFFRACTION FROM LOW-DIMENSIONAL STRUCTURES | 1993 | 196 | 62 | 61% |
Multiparametric crystallography using the diversity of multiple scattering patterns for Bragg and diffuse waves. Method of standing diffuse waves | 2011 | 2 | 29 | 100% |
X-ray analysis of thin films and multilayers | 1996 | 61 | 119 | 35% |
HIGH-RESOLUTION X-RAY-DIFFRACTION CHARACTERIZATION OF SEMICONDUCTOR STRUCTURES | 1994 | 50 | 77 | 48% |
SURFACE X-RAY-DIFFRACTION | 1992 | 466 | 121 | 11% |
Diffuse-dynamic multiparameter diffractometry: A review | 2010 | 0 | 15 | 100% |
Advances in the structural characterisation of semiconductor crystals by X-ray scattering methods | 2004 | 2 | 38 | 53% |
INVESTIGATION OF REAL CRYSTALS BY X-RAY-DIFFRACTION INCLINATION METHOD - REVERSE DIFFRACTION PROBLEM | 1991 | 7 | 13 | 100% |
High-resolution X-ray diffraction in crystalline structures with quantum dots | 2015 | 0 | 141 | 43% |
DEFORMATIONS AND STRAINS IN MULTILAYER EPITAXIAL CRYSTAL-STRUCTURES | 1989 | 8 | 22 | 77% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PANALYT | 1 | 23% | 0.3% | 5 |
2 | COHERENT XRAY OPT | 1 | 13% | 0.3% | 5 |
3 | BRANCH OFF MUNICH | 1 | 50% | 0.1% | 1 |
4 | ELE SYST GRP | 1 | 50% | 0.1% | 1 |
5 | EXCELLENCE COHERENT X RAY SCI | 1 | 50% | 0.1% | 1 |
6 | GEO UMWELT WISSEN | 1 | 50% | 0.1% | 1 |
7 | MICRO NANOSTRUCT METROL GRP | 1 | 50% | 0.1% | 1 |
8 | OR MIKRO NANOSTRUKTUREN | 1 | 50% | 0.1% | 1 |
9 | PARTICLE PHYS LTP | 1 | 50% | 0.1% | 1 |
10 | THIN FILM NANOSTRUCT | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000186489 | X RAY SURFACE DIFFRACTION//MHATT//BM25 SPLINE |
2 | 0.0000158037 | TOTAL EXTERNAL REFLECTION//X RAY STANDING WAVES//LAYERED SYNTHETIC MICROSTRUCTURES |
3 | 0.0000152478 | ELECTRON BEAM DOPING//KEK PF//BRAGG LAUE DIFFRACTION |
4 | 0.0000127319 | CNRS L NEEL//PARA TERPHENYL SINGLE CRYSTALS//URA 009 CNRS |
5 | 0.0000127225 | X RAY MULTIPLE DIFFRACTION//THREE BEAM X RAY DIFFRACTION//RENNINGER SCAN |
6 | 0.0000100027 | RHOPALOPSOLE//LEUCTRIDAE//PARALEUCTRA |
7 | 0.0000067257 | DOUBLY CURVED CRYSTALS//BRAGG SPECTROMETER//CRYSTAL ANALYSER |
8 | 0.0000064272 | MISFIT DISLOCATIONS//GRADED BUFFER LAYER//DISLOCATION COMPENSATION |
9 | 0.0000063561 | INASP INP//INASP//QUANTUM PHOTOVOLTA GRP |
10 | 0.0000063068 | NEUTRON SPECULAR REFLECTION//MAGNETIC REFERENCE LAYER//PHASE PROBLEM |