Class information for:
Level 1: OXYGEN BOMBARDMENT//STORING MATTER TECHNIQUE//SCI ANAL MAT SAM

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
5107 1603 22.6 52%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
886 10744 SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 OXYGEN BOMBARDMENT Author keyword 27 92% 1% 11
2 STORING MATTER TECHNIQUE Author keyword 26 100% 1% 11
3 SCI ANAL MAT SAM Address 26 55% 2% 32
4 MRI MODEL Author keyword 19 63% 1% 19
5 SURFACE TRANSIENT Author keyword 18 89% 0% 8
6 DEPTH RESOLUTION Author keyword 17 29% 3% 50
7 SPUTTER RATE Author keyword 15 82% 1% 9
8 USEFUL YIELD Author keyword 12 59% 1% 13
9 AES DEPTH PROFILING Author keyword 11 45% 1% 18
10 SPUTTER DEPTH PROFILING Author keyword 9 45% 1% 15

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 OXYGEN BOMBARDMENT 27 92% 1% 11 Search OXYGEN+BOMBARDMENT Search OXYGEN+BOMBARDMENT
2 STORING MATTER TECHNIQUE 26 100% 1% 11 Search STORING+MATTER+TECHNIQUE Search STORING+MATTER+TECHNIQUE
3 MRI MODEL 19 63% 1% 19 Search MRI+MODEL Search MRI+MODEL
4 SURFACE TRANSIENT 18 89% 0% 8 Search SURFACE+TRANSIENT Search SURFACE+TRANSIENT
5 DEPTH RESOLUTION 17 29% 3% 50 Search DEPTH+RESOLUTION Search DEPTH+RESOLUTION
6 SPUTTER RATE 15 82% 1% 9 Search SPUTTER+RATE Search SPUTTER+RATE
7 USEFUL YIELD 12 59% 1% 13 Search USEFUL+YIELD Search USEFUL+YIELD
8 AES DEPTH PROFILING 11 45% 1% 18 Search AES+DEPTH+PROFILING Search AES+DEPTH+PROFILING
9 SPUTTER DEPTH PROFILING 9 45% 1% 15 Search SPUTTER+DEPTH+PROFILING Search SPUTTER+DEPTH+PROFILING
10 CESIUM CLUSTERS 9 83% 0% 5 Search CESIUM+CLUSTERS Search CESIUM+CLUSTERS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 OXYGEN BOMBARDMENT 35 89% 1% 16
2 SAMPLE ROTATION 33 46% 3% 54
3 CESIUM BOMBARDMENT 23 100% 1% 10
4 O 2 BOMBARDMENT 21 90% 1% 9
5 SENSITIVE ANALYTICAL TECHNIQUE 20 100% 1% 9
6 SIMS 18 12% 9% 139
7 OXYGEN BOMBARDED SILICON 17 100% 0% 8
8 USEFUL YIELDS 17 100% 0% 8
9 IMPURITY LAYERS 15 73% 1% 11
10 IN SITU DEPOSITION 15 73% 1% 11

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding 2013 12 301 38%
Sputter depth profile analysis of interfaces 1998 115 133 62%
ULTRA-SHALLOW DOPING PROFILING WITH SIMS 1995 98 113 50%
COMPOSITIONAL DEPTH PROFILING BY SPUTTERING 1991 62 86 62%
CHARACTERIZATION OF SHARP INTERFACES AND DELTA-DOPED LAYERS IN SEMICONDUCTORS USING SECONDARY-ION MASS-SPECTROMETRY 1994 28 61 69%
EFFECTS OF CRYSTALLINITY ON DEPTH RESOLUTION IN SPUTTER DEPTH PROFILES 1993 18 33 67%
SIMS: from research to production control 2003 7 19 74%
OPTIMIZATION OF SECONDARY-ION MASS-SPECTROMETRY FOR QUANTITATIVE TRACE ANALYSIS 1994 18 31 58%
SURFACE AND DEPTH ANALYSIS BASED ON SPUTTERING 1991 44 208 48%
High-depth-resolution Auger depth profiling atomic mixing 1999 5 41 51%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SCI ANAL MAT SAM 26 55% 2.0% 32
2 ADV SIMS PROJECT 9 83% 0.3% 5
3 ADV SIMS PROJECTS 9 67% 0.5% 8
4 SPDT 3 40% 0.4% 6
5 SCI ANAL MAT 3 17% 0.9% 15
6 ANAL MAT 2 23% 0.6% 9
7 ANALYSE MAT 2 67% 0.1% 2
8 SUR E ENGN OPTOELECT F4 2 50% 0.2% 3
9 NANO SUR E GRP 2 16% 0.6% 10
10 ANALYT RUMENTAT IL 2 14% 0.7% 11

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000207749 SUR E THIN FILM ANAL IFOS//SNMS//POST IONIZATION
2 0.0000160074 CONICAL PROTRUSION//FINE PROTRUSION//STRIPE RIB
3 0.0000141404 SIMS MICROSCOPY//ION MICROSCOPY//ANALYTICAL ION MICROSCOPY
4 0.0000130014 ION SPUTTERING//HBEREICH AUTOMATISIERUNG INFORMAT//ION EROSION
5 0.0000116791 LINEAR LEAST SQUARES FITTING//LINEAR LEAST SQUARE FIT//LINEAR LEAST SQUARE METHOD
6 0.0000114335 KINETIC EXCITATION//ION PHOTON EMISSION//NON ADDITIVE SPUTTERING
7 0.0000091427 HELLANDITE//OKANOGANITE Y//REE BOROSILICATE
8 0.0000071099 HONG KONG BEIJING JOINT//MATEMATYKI FIZYKI//GEN LASER PHYS
9 0.0000068497 MOLECULAR DEPTH PROFILING//CLUSTER SIMS//ION BEAM ENGN EXPT
10 0.0000066984 IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION