| Class information for:  | 
| Basic class information | 
| ID | Publications | Average number of references | Avg. shr. active ref. in WoS | 
|---|---|---|---|
| 5252 | 1582 | 25.5 | 77% | 
| Classes in level above (level 2) | 
| ID, lev. above | Publications | Label for level above | 
|---|---|---|
| 666 | 12577 | SCANNING TUNNELING MICROSCOPY//ATOM WI LAYERS//VICINAL SINGLE CRYSTAL SURFACES | 
| Terms with highest relevance score | 
| Rank | Term | Type of term | Relevance score (tfidf) | Class's shr. of term's tot. occurrences | Shr. of publ. in class containing term | Num. of publ. in class | 
|---|---|---|---|---|---|---|
| 1 | ATOM WI LAYERS | Address | 16 | 45% | 2% | 27 | 
| 2 | SI335 | Author keyword | 11 | 100% | 0% | 6 | 
| 3 | AU SI INTERFACE | Author keyword | 6 | 80% | 0% | 4 | 
| 4 | REFLECTION HIGH ENERGY POSITRON DIFFRACTION RHEPD | Author keyword | 5 | 60% | 0% | 6 | 
| 5 | METAL SEMICONDUCTOR NONMAGNETIC THIN FILM STRUCTURES | Author keyword | 4 | 47% | 0% | 7 | 
| 6 | AG ISLANDS ON OXIDIZED SI SURFACES | Author keyword | 4 | 75% | 0% | 3 | 
| 7 | IN SI111 | Author keyword | 4 | 75% | 0% | 3 | 
| 8 | METAL SEMICONDUCTOR INTERFACES | Author keyword | 4 | 10% | 2% | 36 | 
| 9 | AU SI111 | Author keyword | 3 | 100% | 0% | 3 | 
| 10 | SI553 | Author keyword | 3 | 100% | 0% | 3 | 
| Web of Science journal categories | 
| Author Key Words | 
| Rank | Web of Science journal category | Relevance score (tfidf) | Class's shr. of term's tot. occurrences | Shr. of publ. in class containing term | Num. of publ. in class | LCSH search | Wikipedia search | 
|---|---|---|---|---|---|---|---|
| 1 | SI335 | 11 | 100% | 0% | 6 | Search SI335 | Search SI335 | 
| 2 | AU SI INTERFACE | 6 | 80% | 0% | 4 | Search AU+SI+INTERFACE | Search AU+SI+INTERFACE | 
| 3 | REFLECTION HIGH ENERGY POSITRON DIFFRACTION RHEPD | 5 | 60% | 0% | 6 | Search REFLECTION+HIGH+ENERGY+POSITRON+DIFFRACTION+RHEPD | Search REFLECTION+HIGH+ENERGY+POSITRON+DIFFRACTION+RHEPD | 
| 4 | METAL SEMICONDUCTOR NONMAGNETIC THIN FILM STRUCTURES | 4 | 47% | 0% | 7 | Search METAL+SEMICONDUCTOR+NONMAGNETIC+THIN+FILM+STRUCTURES | Search METAL+SEMICONDUCTOR+NONMAGNETIC+THIN+FILM+STRUCTURES | 
| 5 | AG ISLANDS ON OXIDIZED SI SURFACES | 4 | 75% | 0% | 3 | Search AG+ISLANDS+ON+OXIDIZED+SI+SURFACES | Search AG+ISLANDS+ON+OXIDIZED+SI+SURFACES | 
| 6 | IN SI111 | 4 | 75% | 0% | 3 | Search IN+SI111 | Search IN+SI111 | 
| 7 | METAL SEMICONDUCTOR INTERFACES | 4 | 10% | 2% | 36 | Search METAL+SEMICONDUCTOR+INTERFACES | Search METAL+SEMICONDUCTOR+INTERFACES | 
| 8 | AU SI111 | 3 | 100% | 0% | 3 | Search AU+SI111 | Search AU+SI111 | 
| 9 | SI553 | 3 | 100% | 0% | 3 | Search SI553 | Search SI553 | 
| 10 | SI557 | 3 | 100% | 0% | 3 | Search SI557 | Search SI557 | 
| Key Words Plus | 
| Rank | Web of Science journal category | Relevance score (tfidf) | Class's shr. of term's tot. occurrences | Shr. of publ. in class containing term | Num. of publ. in class | 
|---|---|---|---|---|---|
| 1 | ROOT3X ROOT3R30 DEGREES AG SI111 SURFACE | 61 | 95% | 1% | 20 | 
| 2 | AG SI111 SURFACE | 56 | 81% | 2% | 34 | 
| 3 | SI557 AU | 52 | 100% | 1% | 18 | 
| 4 | SI111 ROOT 3X ROOT 3 AG SURFACE | 46 | 82% | 2% | 27 | 
| 5 | SI ATOM DENSITY | 42 | 94% | 1% | 15 | 
| 6 | SQUARE ROOT 3 | 38 | 93% | 1% | 14 | 
| 7 | SI111 SQUARE ROOT 3X SQUARE ROOT 3 AG SURFACE | 29 | 88% | 1% | 14 | 
| 8 | SQUARE ROOT 3 AG SURFACE | 26 | 87% | 1% | 13 | 
| 9 | AU SI111 | 23 | 70% | 1% | 19 | 
| 10 | INDUCED 5X2 RECONSTRUCTION | 23 | 100% | 1% | 10 | 
| Journals | 
| Reviews | 
| Title | Publ. year | Cit. | Active references | % act. ref. to same field | 
|---|---|---|---|---|
| Surface-sensitive conductance measurements | 2009 | 33 | 134 | 47% | 
| Structures and electronic transport on silicon surfaces | 1999 | 132 | 131 | 71% | 
| Surface-state bands on silicon as electron systems in reduced dimensions at atomic scales | 2000 | 26 | 61 | 70% | 
| Atomic chains on surfaces | 2008 | 23 | 57 | 35% | 
| Vicinal surfaces for functional nanostructures | 2009 | 20 | 87 | 26% | 
| Surface one-dimensional structures | 2007 | 3 | 54 | 59% | 
| CORRELATION BETWEEN ATOMIC-SCALE STRUCTURES AND MACROSCOPIC ELECTRICAL-PROPERTIES OF METAL-COVERED SI(111) SURFACES | 1993 | 47 | 79 | 48% | 
| Atomic imaging of macroscopic surface conductivity | 1999 | 3 | 28 | 61% | 
| Multiprobe NSOM fluorescence | 2014 | 0 | 19 | 37% | 
| PROPERTIES OF NOBLE-METAL SILICON JUNCTIONS | 1992 | 40 | 234 | 33% | 
| Address terms | 
| Rank | Address term | Relevance score (tfidf) | Class's shr. of term's tot. occurrences | Shr. of publ. in class containing term | Num. of publ. in class | 
|---|---|---|---|---|---|
| 1 | ATOM WI LAYERS | 16 | 45% | 1.7% | 27 | 
| 2 | IQUIPS | 1 | 38% | 0.2% | 3 | 
| 3 | KNOWLEDGE INTELLIGENCE SCI SUMIDA KU | 1 | 100% | 0.1% | 2 | 
| 4 | LEADING PROJECT | 1 | 100% | 0.1% | 2 | 
| 5 | SRL ISSP | 1 | 100% | 0.1% | 2 | 
| 6 | ENGN CRYSTALLINE MAT SCI CHIKUSA KU | 1 | 33% | 0.1% | 2 | 
| 7 | ATOM WI | 1 | 50% | 0.1% | 1 | 
| 8 | CLEAR ENERGY QUANTUM STRUCT | 1 | 50% | 0.1% | 1 | 
| 9 | ELECT ENGN PHYS ELE | 1 | 50% | 0.1% | 1 | 
| 10 | FUNDAMENTAL ELE | 1 | 50% | 0.1% | 1 | 
| Related classes at same level (level 1) | 
| Rank | Relatedness score | Related classes | 
|---|---|---|
| 1 | 0.0000261490 | DAS STRUCTURE//SN GE111//SI111 7 X 7 | 
| 2 | 0.0000182507 | HIGH INDEX SINGLE CRYSTAL SURFACES//SI110//SI113 | 
| 3 | 0.0000135437 | CEA SERV RECH SUR ES IRRADIAT MAT//CHIM ORGAN THEORIQUE//DISPLAY DEVICE CO | 
| 4 | 0.0000126607 | QUANTUM WELL STATES//ELECTRONIC GROWTH//QUANTUM SIZE EFFECTS | 
| 5 | 0.0000124165 | GE001//C4 X 2//C4X2 | 
| 6 | 0.0000105846 | SURFACTANT MEDIATED EPITAXY//BI NANOLINES//SI100 2X1 SB | 
| 7 | 0.0000098443 | NANOMETER SIZED SCHOTTKY CONTACT//METAL DOT ARRAY//NANO DIODE | 
| 8 | 0.0000092537 | SALINICOCCUS ROSEUS//CU2SI//BURLA | 
| 9 | 0.0000091676 | ERBIUM SILICIDE//ERSI2//YTTRIUM SILICIDE | 
| 10 | 0.0000090728 | VALENCE BAND DENSITY OF STATES//SURFACE MAGNETO OPTIC KERR EFFECT//METAL SEMICONDUCTOR THIN FILM |