Class information for:
Level 1: CONVERGENT BEAM ELECTRON DIFFRACTION//PRECESSION ELECTRON DIFFRACTION//CBED

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
7413 1291 22.5 49%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
803 11388 ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 CONVERGENT BEAM ELECTRON DIFFRACTION Author keyword 36 43% 5% 63
2 PRECESSION ELECTRON DIFFRACTION Author keyword 31 57% 3% 36
3 CBED Author keyword 25 43% 3% 43
4 CONVERGENT BEAM ELECTRON DIFFRACTION CBED Author keyword 13 49% 2% 20
5 ELECTRON PRECESSION Author keyword 8 75% 0% 6
6 MEMORY ANAL SCI ENGN GRP Address 8 75% 0% 6
7 PRECESSION TECHNIQUE Author keyword 8 100% 0% 5
8 HOLZ Author keyword 6 80% 0% 4
9 LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION Author keyword 6 58% 1% 7
10 LACBED Author keyword 6 39% 1% 12

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 CONVERGENT BEAM ELECTRON DIFFRACTION 36 43% 5% 63 Search CONVERGENT+BEAM+ELECTRON+DIFFRACTION Search CONVERGENT+BEAM+ELECTRON+DIFFRACTION
2 PRECESSION ELECTRON DIFFRACTION 31 57% 3% 36 Search PRECESSION+ELECTRON+DIFFRACTION Search PRECESSION+ELECTRON+DIFFRACTION
3 CBED 25 43% 3% 43 Search CBED Search CBED
4 CONVERGENT BEAM ELECTRON DIFFRACTION CBED 13 49% 2% 20 Search CONVERGENT+BEAM+ELECTRON+DIFFRACTION+CBED Search CONVERGENT+BEAM+ELECTRON+DIFFRACTION+CBED
5 ELECTRON PRECESSION 8 75% 0% 6 Search ELECTRON+PRECESSION Search ELECTRON+PRECESSION
6 PRECESSION TECHNIQUE 8 100% 0% 5 Search PRECESSION+TECHNIQUE Search PRECESSION+TECHNIQUE
7 HOLZ 6 80% 0% 4 Search HOLZ Search HOLZ
8 LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION 6 58% 1% 7 Search LARGE+ANGLE+CONVERGENT+BEAM+ELECTRON+DIFFRACTION Search LARGE+ANGLE+CONVERGENT+BEAM+ELECTRON+DIFFRACTION
9 LACBED 6 39% 1% 12 Search LACBED Search LACBED
10 LOCAL LATTICE STRAIN 6 100% 0% 4 Search LOCAL+LATTICE+STRAIN Search LOCAL+LATTICE+STRAIN

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 CBED PATTERNS 85 92% 3% 34
2 BEAM ELECTRON DIFFRACTION 66 47% 8% 104
3 ALMFE 29 88% 1% 14
4 DYNAMICAL DIRECT METHODS 15 88% 1% 7
5 HOLZ LINES 15 88% 1% 7
6 PRECESSION TECHNIQUE 14 55% 1% 18
7 ORDER STRUCTURE FACTORS 14 100% 1% 7
8 ELASTIC RELAXATION 11 36% 2% 24
9 NONCENTROSYMMETRIC CRYSTALS 9 55% 1% 12
10 ELD 9 64% 1% 9

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
ON THE ACCURATE MEASUREMENT OF STRUCTURE-FACTOR AMPLITUDES AND PHASES BY ELECTRON-DIFFRACTION 1993 100 63 76%
Precession electron diffraction - a topical review 2015 2 55 53%
Electron crystallography as a complement to X-ray powder diffraction techniques 2013 14 42 33%
Precession Electron Diffraction 2012 3 79 78%
Strategies in electron diffraction data collection 2002 8 7 86%
Measurements of electron densities in solids: a real-space view of electronic structure and bonding in inorganic crystals 2004 26 98 43%
Quantitative electron diffraction: From atoms to bonds 1996 18 11 73%
Finite-element study of strain field in strained-Si MOSFET 2009 5 15 67%
Crystal structure determination from EM images and electron diffraction patterns 2002 8 28 54%
Electron crystallography: imaging and single-crystal diffraction from powders 2008 28 81 35%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MEMORY ANAL SCI ENGN GRP 8 75% 0.5% 6
2 J MALINOWSKI OPT MAT TECHNOL 2 67% 0.2% 2
3 ADV CHARACTERIZAT 2 43% 0.2% 3
4 IST LAMEL 2 10% 1.2% 15
5 DEVICE ANAL GRP 1 100% 0.2% 2
6 EM BUSINESS UNIT 1 17% 0.4% 5
7 UMR CNRS 8517 1 16% 0.4% 5
8 ELECT MICROSCOPY ETH ZURICH 1 50% 0.1% 1
9 FOR UNGSZENTRUM ICHTEN IONENTECH 1 50% 0.1% 1
10 INTERDEPARTEMENTAL ELE ON MICROSCOPY 1 50% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000219305 EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY
2 0.0000181493 ULTRAMICROSCOPY//ABERRATION CORRECTION//DEPTH SECTIONING
3 0.0000127102 CHARGE FLIPPING//SUPERSPACE APPROACH//APERIODIC CRYSTAL
4 0.0000099481 GERMANIUM PHOTODIODES//INTEGRAL BREADTH METHOD//PERTURBATION CRYSTALLOGRAPHY
5 0.0000097772 REG PHYSICOCHEM ANAL//DOUBLE DIFFRACTION//TRANSMISSION REFLECTION AND SCANNING ELECTRON MICROSCOPY INCLUDING EBIC MECHANICAL PROPERTIES OF SOLIDS
6 0.0000087715 AQUEOUS PERCHLORIC ACID//NEAT LIQUIDS//STRUCTURAL DIFFUSION
7 0.0000070648 REFINED BEAM UNIT//SI111ROOT 3 X ROOT 3 AL//REFLECTION ELECTRON MICROSCOPY REM
8 0.0000069360 CERAM PHYS//RIN//CONCENTRATED STRESS
9 0.0000067914 X RAY MULTIPLE DIFFRACTION//THREE BEAM X RAY DIFFRACTION//RENNINGER SCAN
10 0.0000060836 KIKUCHI LINES//ELECTRON CHANNELING CONTRAST IMAGING ECCI//ACOM