Class information for:
Level 1: NANOOPT PROPERTY//PLASMA PHYS PLASMA SOURCES//NON UNIFORM THIN FILMS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
8186 1210 21.2 54%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1597 6577 ELLIPSOMETRY//MUELLER MATRIX//NANOOPT PROPERTY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 NANOOPT PROPERTY Address 28 52% 3% 38
2 PLASMA PHYS PLASMA SOURCES Address 19 63% 2% 19
3 NON UNIFORM THIN FILMS Author keyword 9 83% 0% 5
4 JOINT MODERN METROL Address 6 71% 0% 5
5 CDMGTE Author keyword 3 60% 0% 3
6 RG PLASMA TECHNOL Address 3 60% 0% 3
7 SPECTROSCOPIC REFLECTOMETRY Author keyword 3 35% 0% 6
8 NANO OPT PROPERTY Address 2 38% 0% 5
9 ALGAAS GAAS SOLAR CELLS Author keyword 2 67% 0% 2
10 AS S CHALCOGENIDE FILMS Author keyword 2 67% 0% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 NON UNIFORM THIN FILMS 9 83% 0% 5 Search NON+UNIFORM+THIN+FILMS Search NON+UNIFORM+THIN+FILMS
2 CDMGTE 3 60% 0% 3 Search CDMGTE Search CDMGTE
3 SPECTROSCOPIC REFLECTOMETRY 3 35% 0% 6 Search SPECTROSCOPIC+REFLECTOMETRY Search SPECTROSCOPIC+REFLECTOMETRY
4 ALGAAS GAAS SOLAR CELLS 2 67% 0% 2 Search ALGAAS+GAAS+SOLAR+CELLS Search ALGAAS+GAAS+SOLAR+CELLS
5 AS S CHALCOGENIDE FILMS 2 67% 0% 2 Search AS+S+CHALCOGENIDE+FILMS Search AS+S+CHALCOGENIDE+FILMS
6 CRITICAL POINT ENERGY 2 67% 0% 2 Search CRITICAL+POINT+ENERGY Search CRITICAL+POINT+ENERGY
7 IMAGING SPECTROSCOPIC REFLECTOMETRY 2 67% 0% 2 Search IMAGING+SPECTROSCOPIC+REFLECTOMETRY Search IMAGING+SPECTROSCOPIC+REFLECTOMETRY
8 BEAM PROFILE REFLECTOMETRY 1 50% 0% 2 Search BEAM+PROFILE+REFLECTOMETRY Search BEAM+PROFILE+REFLECTOMETRY
9 DIELECTRIC FUNCTION PARAMETRIC MODEL 1 100% 0% 2 Search DIELECTRIC+FUNCTION+PARAMETRIC+MODEL Search DIELECTRIC+FUNCTION+PARAMETRIC+MODEL
10 IMAGING SPECTROPHOTOMETRY 1 100% 0% 2 Search IMAGING+SPECTROPHOTOMETRY Search IMAGING+SPECTROPHOTOMETRY

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SPECTROSCOPIC ELLIPSOMETRY 25 11% 18% 217
2 MODEL DIELECTRIC CONSTANTS 19 74% 1% 14
3 OPTICAL DISPERSION RELATIONS 13 69% 1% 11
4 DIELECTRIC FUNCTIONS 10 28% 3% 31
5 DIELECTRIC FUNCTION 10 11% 7% 89
6 ION IMPLANTED SEMICONDUCTORS 9 83% 0% 5
7 SI100 WAFERS 8 75% 0% 6
8 DAMAGE DEPTH PROFILES 7 67% 0% 6
9 INTERBAND CRITICAL POINTS 6 24% 2% 24
10 SPECTROSCOPIC REFLECTOMETRY 6 80% 0% 4

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Progress in the room-temperature optical functions of semiconductors 2002 60 220 36%
ELLIPSOMETRY OF THIN FILM SYSTEMS 2000 24 79 46%
Determination of doping effects on Si and GaAs bulk samples properties by photothermal investigations 2007 4 4 50%
DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV 1983 2146 20 45%
REFRACTION OF LIGHT IN SEMICONDUCTORS (REVIEW) 1988 30 28 29%
ELLIPSOMETRIC STUDIES OF ELECTRONIC INTERBAND-TRANSITIONS IN CDXHG1-XTE 1984 122 29 28%
THE CHARACTERIZATION OF MATERIALS BY SPECTROSCOPIC ELLIPSOMETRY 1984 2 15 67%
ELLIPSOMETRY IN THIN-FILM ANALYSIS 1981 43 11 18%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 NANOOPT PROPERTY 28 52% 3.1% 38
2 PLASMA PHYS PLASMA SOURCES 19 63% 1.6% 19
3 JOINT MODERN METROL 6 71% 0.4% 5
4 RG PLASMA TECHNOL 3 60% 0.2% 3
5 NANO OPT PROPERTY 2 38% 0.4% 5
6 CZECH METROL 2 33% 0.4% 5
7 CDP BAGNEUX 1 100% 0.2% 2
8 JOINT CHAIR EXPT PHYS 1 100% 0.2% 2
9 PHOTOVOLTA INNOVAT COMMERCIALIZAT 1 23% 0.4% 5
10 OPTOELECT CONVERGENCE SYST 1 12% 0.6% 7

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000192497 IMAGING ELLIPSOMETRY//TOTAL INTERNAL REFLECTION ELLIPSOMETRY//ROTATING POLARIZER ANALYZER ELLIPSOMETER
2 0.0000191452 ALUMINUM DOPED ZINC OXIDE ZNOAL//ABELES EQUATIONS//OPTICAL CONDUCTIVITY MEASUREMENT
3 0.0000143014 SURFACE PHOTOABSORPTION//REFLECTANCE ANISOTROPY SPECTROSCOPY//REFLECTION ANISOTROPY SPECTROSCOPY
4 0.0000112766 INFRARED ELLIPSOMETRY//MICROELECT OPT MAT//BERLIN
5 0.0000097961 PHOTOREFLECTANCE//FIELD INDUCED CHANGE IN THE PSEUDODIELECTRIC FUNCTION//PHOTOELLIPSOMETRY
6 0.0000064850 PHASE MODULATED FLOW BIREFRINGENCE//BICOZAMYCIN//FLEXIBLE CHAIN POLYMER
7 0.0000062050 ABSORBING SUBSTRATE//SINGLE LAYER COATING//ELLIPSOMETRY PLICAT S
8 0.0000059530 SIMOX//BURIED OXIDE LAYER//CONTACTLESS I V METHOD
9 0.0000058032 ALGAAS HETEROSTRUCTURES//EPITAXY ETCHING//QUANTUM WELL LASER STRUCTURES
10 0.0000057549 FONORITON SCI//ISOTOPIC SILICON//ICHHPS