Class information for:
Level 2: SCANNING//LAMACOP//BACKSCATTERED ELECTRONS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
2051 4868 20.5 43%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 3)


ID, lev.
above		 Publications Label for level above
280 38393 ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

Classes in level below (level 1)


ID, lev. below Publications Label for level below
9401 1091 LAMACOP//SECONDARY ELECTRON EMISSION//ALUMINA INSULATOR
12151 864 STANDARDLESS ANALYSIS//FU 160//TRITIUM ANALYSIS
14436 704 SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL
14527 697 ADV SPACE STUDIES//NANODOSIMETRY//GEANT4 DNA
19163 453 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE//ENVIRONMENTAL SEM//VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE
19558 435 MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST
20291 404 ELECTRON BEAM TESTING//SOREP//VOLTAGE CONTRAST
25941 220 SURFACE EMISSION RATE//ALPHA BETA COUNTING//EXTRAPOLATED RANGE

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SCANNING Journal 91 23% 7% 353
2 LAMACOP Address 27 71% 0% 22
3 BACKSCATTERED ELECTRONS Author keyword 20 43% 1% 36
4 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE Author keyword 19 43% 1% 33
5 ENVIRONMENTAL SEM Author keyword 17 55% 0% 21
6 ESEM Author keyword 16 20% 1% 69
7 VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE Author keyword 15 82% 0% 9
8 SECONDARY ELECTRON EMISSION Author keyword 15 19% 1% 72
9 POLYMERS OIDS GRP Address 14 38% 1% 30
10 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY Author keyword 14 25% 1% 48

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 BACKSCATTERED ELECTRONS 20 43% 1% 36 Search BACKSCATTERED+ELECTRONS Search BACKSCATTERED+ELECTRONS
2 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE 19 43% 1% 33 Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPE Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPE
3 ENVIRONMENTAL SEM 17 55% 0% 21 Search ENVIRONMENTAL+SEM Search ENVIRONMENTAL+SEM
4 ESEM 16 20% 1% 69 Search ESEM Search ESEM
5 VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE 15 82% 0% 9 Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPE Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPE
6 SECONDARY ELECTRON EMISSION 15 19% 1% 72 Search SECONDARY+ELECTRON+EMISSION Search SECONDARY+ELECTRON+EMISSION
7 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY 14 25% 1% 48 Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPY Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPY
8 LOW VACUUM SEM 12 58% 0% 14 Search LOW+VACUUM+SEM Search LOW+VACUUM+SEM
9 MEAN PENETRATION DEPTH 12 86% 0% 6 Search MEAN+PENETRATION+DEPTH Search MEAN+PENETRATION+DEPTH
10 NANODOSIMETRY 12 52% 0% 16 Search NANODOSIMETRY Search NANODOSIMETRY

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ENVIRONMENTAL SEM 34 59% 1% 38
2 ESEM 33 55% 1% 41
3 SEM 30 15% 4% 194
4 IRRADIATED INSULATORS 24 82% 0% 14
5 TISSUE EQUIVALENT GAS 24 82% 0% 14
6 NANOMETRIC VOLUMES 21 78% 0% 14
7 FLASHOVER 19 24% 1% 69
8 SHARPNESS MEASUREMENT 18 89% 0% 8
9 IMPROVED BIPARTITION MODEL 17 70% 0% 14
10 STRUCTURE CODE 17 75% 0% 12

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SCANNING 91 23% 7% 353

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Track-structure codes in radiation research 2006 128 100 55%
FOUNDATIONS OF ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPY 1988 249 17 88%
A history of scanning electron microscopy developments: Towards "wet-STEM" imaging 2007 78 14 71%
SURFACE FLASHOVER OF INSULATORS 1989 216 34 79%
Application of environmental scanning electron microscopy to determine biological surface structure 2009 35 43 63%
Calculations of inner-shell ionization by electron impact with the distorted-wave and plane-wave Born approximations 2008 38 57 70%
Future development of biologically relevant dosimetry 2015 1 112 27%
A critical overview of ESEM applications in the biological field 2005 77 27 52%
Low voltage scanning electron microscopy 1996 131 20 35%
Electron-beam interactions with solids 2003 48 5 80%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 LAMACOP 27 71% 0.5% 22
2 POLYMERS OIDS GRP 14 38% 0.6% 30
3 ADV SPACE STUDIES 13 80% 0.2% 8
4 FIS ECM 9 44% 0.3% 15
5 FU 160 6 100% 0.1% 4
6 FUNDAMENTALS DOSIMETRY 6 100% 0.1% 4
7 INTEGRATED CIRCUIT ADV PROC TECHNOL 6 100% 0.1% 4
8 SGCSLMAC 5 63% 0.1% 5
9 RADIAT BIOPHYS GRP 5 29% 0.3% 14
10 FIS ECM ICC 5 55% 0.1% 6

Related classes at same level (level 2)


Rank Relatedness score Related classes
1 0.0000014642 SCI COUNCIL SPECT//POLARIZATIONAL BREMSSTRAHLUNG//UFR PHYS ATOM MOL OPT PL
2 0.0000013714 SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP
3 0.0000012913 WEDGE AND STRIP ANODE//CANONICAL ABERRATION THEORY//OPT PHYS ELECT ENGN
4 0.0000011742 GRAIN BOUNDARY DETECTION//SCANNING X RAY ANALYTICAL MICROSCOPE//QUANTUM DOT QUANTUM WELL QDQW
5 0.0000011171 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//MICROELECTRONIC ENGINEERING//JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY
6 0.0000010078 STOPPING POWER//LAMOR//RESONANT COHERENT EXCITATION
7 0.0000008818 IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION//IEEE TRANSACTIONS ON ELECTRICAL INSULATION//IEEE ELECTRICAL INSULATION MAGAZINE
8 0.0000008516 IN VIVO CRYOTECHNIQUE//HIGH PRESSURE FREEZING//FREEZE SUBSTITUTION
9 0.0000008181 X-RAY SPECTROMETRY//TXRF//TOTAL REFLECTION X RAY FLUORESCENCE
10 0.0000007504 NUCL SCI S//FLUORESCENCE YIELDS//ECPSSR