Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 2450 | 3595 | 15.4 | 42% |
Classes in level above (level 3) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 534 | 16689 | TERAHERTZ//PHYS BIOL ULTRAFAST SCI TECHNOL//TERAHERTZ TIME DOMAIN SPECTROSCOPY |
Classes in level below (level 1) |
| ID, lev. below | Publications | Label for level below |
|---|---|---|
| 6265 | 1442 | PERMITTIVITY MEASUREMENT//PL MICROWAVE NONDESTRUCT TESTING//CAVITY PERTURBATION METHOD |
| 9481 | 1084 | DIELECTRIC RESONATORS//DIELECTRIC RESONATOR//MIKROELEKT OPTOELEKT |
| 15183 | 657 | SIX PORT//SIX PORT REFLECTOMETER//SIX PORT CALIBRATION |
| 27461 | 188 | DIGITAL SINUSOIDAL OSCILLATOR//FRACTIONAL ADDRESSING//FREQUENCY SPACING |
| 28459 | 168 | HORIZONTAL ASYMMETRY//CONDITIONAL SIGNAL AVERAGING//CYCLE LOSS GAIN DETECTOR |
| 35003 | 56 | DIELECTRIC CAPACITOR//ROUGHNESS ACCESSIBILITY//CONDUCTOR AND DIELECTRIC LOSSES |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | PERMITTIVITY MEASUREMENT | Author keyword | 61 | 49% | 3% | 90 |
| 2 | PL MICROWAVE NONDESTRUCT TESTING | Address | 34 | 61% | 1% | 36 |
| 3 | COMPLEX PERMITTIVITY | Author keyword | 27 | 22% | 3% | 111 |
| 4 | CAVITY PERTURBATION METHOD | Author keyword | 24 | 91% | 0% | 10 |
| 5 | SIX PORT | Author keyword | 19 | 41% | 1% | 35 |
| 6 | MICROWAVE MEASUREMENT | Author keyword | 14 | 24% | 1% | 52 |
| 7 | SIX PORT REFLECTOMETER | Author keyword | 13 | 55% | 0% | 16 |
| 8 | DIELECTRIC RESONATORS | Author keyword | 13 | 19% | 2% | 60 |
| 9 | MICROWAVE MEASUREMENTS | Author keyword | 12 | 15% | 2% | 79 |
| 10 | DIELECTRIC RESONATOR | Author keyword | 11 | 19% | 1% | 53 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | PERMITTIVITY MEASUREMENT | 61 | 49% | 3% | 90 | Search PERMITTIVITY+MEASUREMENT | Search PERMITTIVITY+MEASUREMENT |
| 2 | COMPLEX PERMITTIVITY | 27 | 22% | 3% | 111 | Search COMPLEX+PERMITTIVITY | Search COMPLEX+PERMITTIVITY |
| 3 | CAVITY PERTURBATION METHOD | 24 | 91% | 0% | 10 | Search CAVITY+PERTURBATION+METHOD | Search CAVITY+PERTURBATION+METHOD |
| 4 | SIX PORT | 19 | 41% | 1% | 35 | Search SIX+PORT | Search SIX+PORT |
| 5 | MICROWAVE MEASUREMENT | 14 | 24% | 1% | 52 | Search MICROWAVE+MEASUREMENT | Search MICROWAVE+MEASUREMENT |
| 6 | SIX PORT REFLECTOMETER | 13 | 55% | 0% | 16 | Search SIX+PORT+REFLECTOMETER | Search SIX+PORT+REFLECTOMETER |
| 7 | DIELECTRIC RESONATORS | 13 | 19% | 2% | 60 | Search DIELECTRIC+RESONATORS | Search DIELECTRIC+RESONATORS |
| 8 | MICROWAVE MEASUREMENTS | 12 | 15% | 2% | 79 | Search MICROWAVE+MEASUREMENTS | Search MICROWAVE+MEASUREMENTS |
| 9 | DIELECTRIC RESONATOR | 11 | 19% | 1% | 53 | Search DIELECTRIC+RESONATOR | Search DIELECTRIC+RESONATOR |
| 10 | SIX PORT CALIBRATION | 9 | 83% | 0% | 5 | Search SIX+PORT+CALIBRATION | Search SIX+PORT+CALIBRATION |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | TRANSMISSION REFLECTION METHOD | 91 | 94% | 1% | 32 |
| 2 | COMPLEX PERMITTIVITY | 59 | 23% | 6% | 226 |
| 3 | MICROWAVE FREQUENCIES | 47 | 25% | 5% | 166 |
| 4 | COMPLEX PERMITTIVITY DETERMINATION | 40 | 82% | 1% | 23 |
| 5 | COMPLEX PERMITTIVITY MEASUREMENTS | 27 | 65% | 1% | 26 |
| 6 | DISBOND | 26 | 80% | 0% | 16 |
| 7 | ENDED COAXIAL LINE | 20 | 47% | 1% | 32 |
| 8 | 6 PORT REFLECTOMETER | 17 | 57% | 1% | 20 |
| 9 | AUTOMATIC NETWORK ANALYZER | 16 | 64% | 0% | 16 |
| 10 | LOSSY MATERIALS | 15 | 82% | 0% | 9 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Frequency domain complex permittivity measurements at microwave frequencies | 2006 | 57 | 39 | 64% |
| A review of RF and microwave techniques for dielectric measurements on polar liquids | 2006 | 37 | 93 | 61% |
| Comparisons of microwave dielectric property measurements by transmission/reflection techniques and resonance techniques | 2009 | 13 | 44 | 66% |
| A brief review of microwave testing of stratified composite structures: A comparison between plane wave and near field approaches | 2002 | 14 | 22 | 86% |
| The co-axial aperture electromagnetic sensor and its application in material characterization | 1997 | 31 | 88 | 92% |
| Measuring the dielectric properties of materials. Ninety-year development from low-frequency techniques to broadband spectroscopy and high-frequency imaging | 2013 | 7 | 217 | 31% |
| Resonance methods for microwave studies of dielectrics - (Review) | 2007 | 6 | 15 | 80% |
| Broadband dielectric spectrometry of liquids and biosystems | 2006 | 65 | 118 | 17% |
| THE MEASUREMENT OF THE PROPERTIES OF MATERIALS | 1986 | 141 | 65 | 34% |
| Contactless methods of conductivity and sheet resistance measurement for semiconductors, conductors and superconductors | 2013 | 4 | 23 | 30% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | PL MICROWAVE NONDESTRUCT TESTING | 34 | 61% | 1.0% | 36 |
| 2 | MICROWAVE IMAGING NONDESTRUCT EVALUAT | 8 | 100% | 0.1% | 5 |
| 3 | MIKROELEKT OPTOELEKT | 7 | 56% | 0.3% | 9 |
| 4 | MICROWAVE TOMOG MAT | 7 | 38% | 0.4% | 15 |
| 5 | IMAGING SENSING TEAM | 6 | 80% | 0.1% | 4 |
| 6 | FREQUENCY STAND METROL GRP | 6 | 38% | 0.4% | 13 |
| 7 | AMNTL | 6 | 71% | 0.1% | 5 |
| 8 | RECH AVANCEES MICROONDES ELECT SPATIALE | 5 | 54% | 0.2% | 7 |
| 9 | PLICAT NANOSCI NANOENGN | 4 | 39% | 0.3% | 9 |
| 10 | ELECT MICROELECT NANOTECHNOL IEMN DHS | 3 | 57% | 0.1% | 4 |
Related classes at same level (level 2) |