Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
751 | 11810 | 24.9 | 75% |
Classes in level above (level 3) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
270 | 39884 | ATOMIC FORCE MICROSCOPY//SELF ASSEMBLED MONOLAYERS//ATOMIC FORCE MICROSCOPE |
Classes in level below (level 1) |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ATOMIC FORCE MICROSCOPE | Author keyword | 42 | 15% | 2% | 251 |
2 | DISSENY PROGRAMACIO SISTEMES ELECT | Address | 37 | 100% | 0% | 14 |
3 | LOCAL ANODIC OXIDATION | Author keyword | 34 | 65% | 0% | 33 |
4 | NONCONTACT ATOMIC FORCE MICROSCOPY | Author keyword | 24 | 61% | 0% | 25 |
5 | TAPPING MODE | Author keyword | 23 | 40% | 0% | 46 |
6 | SCANNING TUNNELING MICROSCOPE | Author keyword | 22 | 23% | 1% | 84 |
7 | FUTURE ENERGY IFES | Address | 21 | 90% | 0% | 9 |
8 | AFM LITHOGRAPHY | Author keyword | 20 | 51% | 0% | 28 |
9 | TIP SAMPLE INTERACTION | Author keyword | 20 | 63% | 0% | 20 |
10 | SCANNING CAPACITANCE MICROSCOPY | Author keyword | 18 | 42% | 0% | 33 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ATOMIC FORCE MICROSCOPE | 42 | 15% | 2% | 251 | Search ATOMIC+FORCE+MICROSCOPE | Search ATOMIC+FORCE+MICROSCOPE |
2 | LOCAL ANODIC OXIDATION | 34 | 65% | 0% | 33 | Search LOCAL+ANODIC+OXIDATION | Search LOCAL+ANODIC+OXIDATION |
3 | NONCONTACT ATOMIC FORCE MICROSCOPY | 24 | 61% | 0% | 25 | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY |
4 | TAPPING MODE | 23 | 40% | 0% | 46 | Search TAPPING+MODE | Search TAPPING+MODE |
5 | SCANNING TUNNELING MICROSCOPE | 22 | 23% | 1% | 84 | Search SCANNING+TUNNELING+MICROSCOPE | Search SCANNING+TUNNELING+MICROSCOPE |
6 | AFM LITHOGRAPHY | 20 | 51% | 0% | 28 | Search AFM+LITHOGRAPHY | Search AFM+LITHOGRAPHY |
7 | TIP SAMPLE INTERACTION | 20 | 63% | 0% | 20 | Search TIP+SAMPLE+INTERACTION | Search TIP+SAMPLE+INTERACTION |
8 | SCANNING CAPACITANCE MICROSCOPY | 18 | 42% | 0% | 33 | Search SCANNING+CAPACITANCE+MICROSCOPY | Search SCANNING+CAPACITANCE+MICROSCOPY |
9 | KELVIN PROBE FORCE MICROSCOPY | 18 | 28% | 0% | 54 | Search KELVIN+PROBE+FORCE+MICROSCOPY | Search KELVIN+PROBE+FORCE+MICROSCOPY |
10 | QPLUS | 18 | 83% | 0% | 10 | Search QPLUS | Search QPLUS |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | TIP INDUCED ANODIZATION | 168 | 91% | 1% | 70 |
2 | REACTIVE SURFACES | 167 | 96% | 0% | 51 |
3 | NANO OXIDATION | 137 | 86% | 1% | 71 |
4 | SCANNING TUNNELING MICROSCOPE | 118 | 19% | 5% | 571 |
5 | TUNNELLING MICROSCOPY | 106 | 74% | 1% | 79 |
6 | TUNNELING MICROSCOPY | 103 | 28% | 3% | 320 |
7 | TUNNELING MICROSCOPE | 103 | 42% | 2% | 189 |
8 | ATOMIC FORCE MICROSCOPE | 96 | 16% | 5% | 568 |
9 | SCANNED PROBE OXIDATION | 94 | 76% | 1% | 65 |
10 | VIBRATING TIP | 86 | 96% | 0% | 26 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Dynamic atomic force microscopy methods | 2002 | 904 | 202 | 80% |
Advances in atomic force microscopy | 2003 | 798 | 130 | 86% |
The emergence of multifrequency force microscopy | 2012 | 118 | 99 | 81% |
Kelvin probe force microscopy and its application | 2011 | 157 | 96 | 61% |
Bistable Si dopants in the GaAs (110) surface | 2015 | 2 | 30 | 60% |
Nano-chemistry and scanning probe nanolithographies | 2006 | 205 | 47 | 72% |
Nanofabrication by scanning probe microscope lithography: A review | 2005 | 215 | 91 | 77% |
Electronic characterization of organic thin films by Kelvin probe force microscopy | 2006 | 201 | 78 | 53% |
BIOMOLECULAR IMAGING WITH THE ATOMIC-FORCE MICROSCOPE | 1994 | 442 | 102 | 82% |
Theories of scanning probe microscopes at the atomic scale | 2003 | 276 | 190 | 54% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | DISSENY PROGRAMACIO SISTEMES ELECT | 37 | 100% | 0.1% | 14 |
2 | FUTURE ENERGY IFES | 21 | 90% | 0.1% | 9 |
3 | ENERGY NANOSCI LENS | 13 | 67% | 0.1% | 12 |
4 | PHYS ELECT CORRELAT MAGNETISM | 11 | 78% | 0.1% | 7 |
5 | INSYS | 8 | 19% | 0.3% | 36 |
6 | SUR E MODIFICAT | 7 | 15% | 0.4% | 43 |
7 | ENERGY NANOSCI | 7 | 27% | 0.2% | 23 |
8 | BIOELECT NANOBIOENGN GRP | 6 | 80% | 0.0% | 4 |
9 | SIC BIO | 6 | 80% | 0.0% | 4 |
10 | MICROELECT MADRID | 6 | 12% | 0.4% | 46 |
Related classes at same level (level 2) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000023129 | FLEXURE HINGE//PIEZOELECTRIC ACTUATOR//NANOPOSITIONING |
2 | 0.0000020449 | NANOTRIBOLOGY//DRY ADHESIVE//DRY ADHESION |
3 | 0.0000016598 | SINGLE MOLECULE FORCE SPECTROSCOPY//FORCE SPECTROSCOPY//MECHANICAL UNFOLDING |
4 | 0.0000012058 | SCANNING TUNNELING MICROSCOPY//ATOM WI LAYERS//VICINAL SINGLE CRYSTAL SURFACES |
5 | 0.0000010226 | SELF ASSEMBLED MONOLAYERS//SELF ASSEMBLED MONOLAYER//DIP PEN NANOLITHOGRAPHY |
6 | 0.0000010162 | CHEM NANOSCI S//BIOMAT CHEMKITA KU//DNA LIPID COMPLEX |
7 | 0.0000009786 | MICROBIAL BIOTECHNOL CELL BIOL//INTERPHASE CHROMATIN//BARLEY CHROMOSOME |
8 | 0.0000008661 | QUANTUM WELL STATES//IMAGE POTENTIAL STATES//MAT FIS SAILA |
9 | 0.0000008549 | AC SURFACE PHOTOVOLTAGE//ELECTRON WORK FUNCTION//SUPERCONDUCTIVITY MECHANISM |
10 | 0.0000007384 | PHOTORESIST REMOVAL//WET OZONE//HYDROGEN TERMINATION |