Class information for:
Level 1: PL MICROWAVE NONDESTRUCT TESTING//MICROWAVE NONDESTRUCTIVE TESTING//MODULATED SCATTERER TECHNIQUE MST

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
24763 302 16.6 47%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
42 3       IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS//ENGINEERING, ELECTRICAL & ELECTRONIC 97664
2685 2             PERMITTIVITY MEASUREMENT//PL MICROWAVE NONDESTRUCT TESTING//COMPLEX PERMITTIVITY 3376
24763 1                   PL MICROWAVE NONDESTRUCT TESTING//MICROWAVE NONDESTRUCTIVE TESTING//MODULATED SCATTERER TECHNIQUE MST 302

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PL MICROWAVE NONDESTRUCT TESTING address 3611043 17% 71% 50
2 MICROWAVE NONDESTRUCTIVE TESTING authKW 674060 3% 67% 10
3 MODULATED SCATTERER TECHNIQUE MST authKW 629988 3% 69% 9
4 AMNTL address 550485 2% 78% 7
5 MICROWAVE IMAGING NONDESTRUCT EVALUAT address 505550 2% 100% 5
6 MICROWAVE TESTING authKW 421290 2% 83% 5
7 OPTICALLY MODULATED SCATTERER OMS authKW 404440 1% 100% 4
8 PL MICROWAVE NONDESTRUCT TESTING AMNTL address 404440 1% 100% 4
9 OPEN ENDED RECTANGULAR WAVEGUIDE authKW 323550 1% 80% 4
10 LOADED SCATTERER authKW 303330 1% 100% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Materials Science, Characterization, Testing 13167 26% 0% 79
2 Instruments & Instrumentation 1895 25% 0% 76
3 Engineering, Electrical & Electronic 1765 45% 0% 136
4 Telecommunications 329 9% 0% 28
5 Materials Science, Composites 241 4% 0% 13
6 Materials Science, Ceramics 166 5% 0% 15
7 Engineering, General 63 4% 0% 12
8 Construction & Building Technology 32 2% 0% 6
9 Materials Science, Multidisciplinary 25 10% 0% 30
10 Engineering, Mechanical 12 3% 0% 9

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PL MICROWAVE NONDESTRUCT TESTING 3611043 17% 71% 50
2 AMNTL 550485 2% 78% 7
3 MICROWAVE IMAGING NONDESTRUCT EVALUAT 505550 2% 100% 5
4 PL MICROWAVE NONDESTRUCT TESTING AMNTL 404440 1% 100% 4
5 MINEL 303330 1% 100% 3
6 IMAGING SENSING TEAM 181996 1% 60% 3
7 AIRBORNE SYST TECHNOL 101110 0% 100% 1
8 DHS ELECT MICROELECT NANOTECHNOL 101110 0% 100% 1
9 ELECT HIGH FREQUENCY TECHNOL 101110 0% 100% 1
10 GENIE ELECT PAU 101110 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MATERIALS EVALUATION 62459 11% 2% 32
2 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 38409 19% 1% 58
3 RESEARCH IN NONDESTRUCTIVE EVALUATION 33910 3% 3% 10
4 NDT & E INTERNATIONAL 22695 7% 1% 20
5 GLASTECHNISCHE BERICHTE-GLASS SCIENCE AND TECHNOLOGY 9247 2% 1% 7
6 JOURNAL OF NONDESTRUCTIVE EVALUATION 7684 2% 1% 6
7 GLASS SCIENCE AND TECHNOLOGY-GLASTECHNISCHE BERICHTE 6733 1% 2% 4
8 IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION 1688 5% 0% 15
9 NDT INTERNATIONAL 1540 1% 1% 2
10 JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY 1122 1% 0% 3

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 MICROWAVE NONDESTRUCTIVE TESTING 674060 3% 67% 10 Search MICROWAVE+NONDESTRUCTIVE+TESTING Search MICROWAVE+NONDESTRUCTIVE+TESTING
2 MODULATED SCATTERER TECHNIQUE MST 629988 3% 69% 9 Search MODULATED+SCATTERER+TECHNIQUE+MST Search MODULATED+SCATTERER+TECHNIQUE+MST
3 MICROWAVE TESTING 421290 2% 83% 5 Search MICROWAVE+TESTING Search MICROWAVE+TESTING
4 OPTICALLY MODULATED SCATTERER OMS 404440 1% 100% 4 Search OPTICALLY+MODULATED+SCATTERER+OMS Search OPTICALLY+MODULATED+SCATTERER+OMS
5 OPEN ENDED RECTANGULAR WAVEGUIDE 323550 1% 80% 4 Search OPEN+ENDED+RECTANGULAR+WAVEGUIDE Search OPEN+ENDED+RECTANGULAR+WAVEGUIDE
6 LOADED SCATTERER 303330 1% 100% 3 Search LOADED+SCATTERER Search LOADED+SCATTERER
7 MICROWAVE REAL TIME IMAGING 303330 1% 100% 3 Search MICROWAVE+REAL+TIME+IMAGING Search MICROWAVE+REAL+TIME+IMAGING
8 INSULATING FOAM 269624 1% 67% 4 Search INSULATING+FOAM Search INSULATING+FOAM
9 MICROWAVE NDT 231105 1% 57% 4 Search MICROWAVE+NDT Search MICROWAVE+NDT
10 EVANESCENT FIELD AMPLIFICATION 227496 1% 75% 3 Search EVANESCENT+FIELD+AMPLIFICATION Search EVANESCENT+FIELD+AMPLIFICATION

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 KHARKOVSKY, S , ZOUGHI, R , (2007) MICROWAVE AND MILLIMETER WAVE NONDESTRUCTIVE TESTING AND EVALUATION.IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE. VOL. 10. ISSUE 2. P. 26-38 37 59% 133
2 NADAKUDUTI, J , CHEN, G , ZOUGHI, R , (2006) SEMIEMPIRICAL ELECTROMAGNETIC MODELING OF CRACK DETECTION AND SIZING IN CEMENT-BASED MATERIALS USING NEAR-FIELD MICROWAVE METHODS.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 55. ISSUE 2. P. 588-597 20 95% 22
3 ZOUGHI, R , KHARKOVSKY, S , (2008) MICROWAVE AND MILLIMETRE WAVE SENSORS FOR CRACK DETECTION.FATIGUE & FRACTURE OF ENGINEERING MATERIALS & STRUCTURES. VOL. 31. ISSUE 8. P. 695-713 16 100% 34
4 KIM, KC , KWON, JY , KANG, NW , (2016) A NOVEL FORCED-RESONANCE MICROWAVE METHOD TO DETECT SURFACE CRACKS IN METAL.IEICE ELECTRONICS EXPRESS. VOL. 13. ISSUE 17. P. - 10 100% 0
5 MEMON, MU , LIM, S , (2016) REVIEW OF ELECTROMAGNETIC-BASED CRACK SENSORS FOR METALLIC MATERIALS (RECENT RESEARCH AND FUTURE PERSPECTIVES).METALS. VOL. 6. ISSUE 8. P. - 16 59% 0
6 NANNI, E , ABOU-KHOUSA, M , KHARKOVSKY, S , ZOUGHI, R , AUSTIN, R , (2008) NEAR-FIELD MICROWAVE IN-PROCESS THICKNESS MONITORING OF COATINGS UNDERGOING CURING.MATERIALS EVALUATION. VOL. 66. ISSUE 8. P. 865-870 14 78% 1
7 MCCLANAHAN, A , KHARKOVSKY, S , MAXON, AR , ZOUGHI, R , PALMER, DD , (2010) DEPTH EVALUATION OF SHALLOW SURFACE CRACKS IN METALS USING RECTANGULAR WAVEGUIDES AT MILLIMETER-WAVE FREQUENCIES.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 59. ISSUE 6. P. 1693-1704 15 63% 18
8 ZOUGHI, R , LAI, J , MUNOZ, K , (2002) A BRIEF REVIEW OF MICROWAVE TESTING OF STRATIFIED COMPOSITE STRUCTURES: A COMPARISON BETWEEN PLANE WAVE AND NEAR FIELD APPROACHES.MATERIALS EVALUATION. VOL. 60. ISSUE 2. P. 171-177 16 73% 15
9 BAUMGARTNER, MA , GHASR, MT , ZOUGHI, R , (2015) WIDEBAND IMAGING ARRAY USING ORTHOGONALLY FED DUAL VARACTOR-LOADED ELLIPTICAL SLOTS.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 64. ISSUE 3. P. 740 -749 13 62% 2
10 DONNELL, KM , ZOUGHI, R , KURTIS, KE , (2013) DEMONSTRATION OF MICROWAVE METHOD FOR DETECTION OF ALKALI-SILICA REACTION (ASR) GEL IN CEMENT-BASED MATERIALS.CEMENT AND CONCRETE RESEARCH. VOL. 44. ISSUE . P. 1-7 10 83% 7

Classes with closest relation at Level 1


Rank Class id link
1 20425 MICROWAVE MICROPROBE//MICROWAVE MICROSCOPE//NEAR FIELD MICROWAVE MICROSCOPY
2 6357 PERMITTIVITY MEASUREMENT//COMPLEX PERMITTIVITY//MICROWAVE MEASUREMENTS
3 35656 PYRAMIDAL HORN//PYRAMIDAL HORN DESIGN//FRINGE CURRENT
4 37677 ECO DESIGN MODEL//GLOBAL COOLING WATER//IN PLANT MATERIAL DEGRADATION
5 20201 GORDON CENSSIS//PASSIVE MILLIMETER WAVE IMAGING//GLOW DISCHARGE DETECTOR GDD
6 37110 OPTICAL TOUCH SWITCHES//TOUCH SENSORS//AMSRL VTSNONDESTRUCT EVALUAT SCI BRANCH
7 26431 POTENTIAL DROP TECHNIQUE//POTENTIAL DROP//FIELD SIGNATURE METHOD
8 30853 SURLENS//NONUNIFORM FAST FOURIER TRANSFORM//NFFT
9 2143 MICROWAVE IMAGING//INVERSE SCATTERING//MICROWAVE TOMOGRAPHY
10 17294 MAGNETIC FLUX LEAKAGE//MAGNETIC FLUX LEAKAGE MFL//MFL

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