Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 3875 | 866 | 22.3 | 38% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | DIRECT THREE BODY RECOMBINATION | authKW | 176294 | 1% | 100% | 5 |
| 2 | ELECT PROP SPACE EXPT | address | 176294 | 1% | 100% | 5 |
| 3 | ELECT PROP SPACE EXPT PROGRAM | address | 176294 | 1% | 100% | 5 |
| 4 | THERMAL RADIATION CALORIMETRY | authKW | 176294 | 1% | 100% | 5 |
| 5 | RARE EARTH FORMATES | authKW | 105776 | 0% | 100% | 3 |
| 6 | ELECTRON DENSITY DISTRIBUTIONS | authKW | 84614 | 1% | 40% | 6 |
| 7 | TALROZE ENERGY PROBLEMS CHEM PHYS | address | 73450 | 1% | 42% | 5 |
| 8 | ALUMINUM OXYNITRIDES | authKW | 70518 | 0% | 100% | 2 |
| 9 | ALUMINUM SILICON OXYCARBIDE | authKW | 70518 | 0% | 100% | 2 |
| 10 | BULK AND INTERFACE STATES | authKW | 70518 | 0% | 100% | 2 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Crystallography | 6712 | 24% | 0% | 208 |
| 2 | Physics, Condensed Matter | 936 | 19% | 0% | 163 |
| 3 | Physics, Multidisciplinary | 565 | 13% | 0% | 114 |
| 4 | Physics, Applied | 393 | 16% | 0% | 141 |
| 5 | Physics, Atomic, Molecular & Chemical | 245 | 8% | 0% | 68 |
| 6 | Chemistry, Multidisciplinary | 150 | 11% | 0% | 99 |
| 7 | Chemistry, Physical | 108 | 11% | 0% | 92 |
| 8 | Materials Science, Multidisciplinary | 102 | 11% | 0% | 96 |
| 9 | Materials Science, Characterization, Testing | 85 | 1% | 0% | 12 |
| 10 | Instruments & Instrumentation | 70 | 4% | 0% | 32 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ELECT PROP SPACE EXPT | 176294 | 1% | 100% | 5 |
| 2 | ELECT PROP SPACE EXPT PROGRAM | 176294 | 1% | 100% | 5 |
| 3 | TALROZE ENERGY PROBLEMS CHEM PHYS | 73450 | 1% | 42% | 5 |
| 4 | PROP DIRECTORATEPRSS | 70518 | 0% | 100% | 2 |
| 5 | BUSINESS DEV SPACE PROP SYST | 35259 | 0% | 100% | 1 |
| 6 | C 902 | 35259 | 0% | 100% | 1 |
| 7 | CEA CNRS COMMUN | 35259 | 0% | 100% | 1 |
| 8 | ESEX PROJECT | 35259 | 0% | 100% | 1 |
| 9 | GRP MAT COMPUTAC | 35259 | 0% | 100% | 1 |
| 10 | LASERS SENSORS PROP PROD | 35259 | 0% | 100% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ACTA CRYSTALLOGRAPHICA SECTION A | 54049 | 7% | 3% | 59 |
| 2 | INDIAN JOURNAL OF PHYSICS | 21420 | 4% | 2% | 35 |
| 3 | ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 18806 | 3% | 2% | 26 |
| 4 | KRISTALLOGRAFIYA | 9329 | 4% | 1% | 32 |
| 5 | JOURNAL OF APPLIED CRYSTALLOGRAPHY | 4189 | 3% | 0% | 26 |
| 6 | KHIMICHESKAYA FIZIKA | 4049 | 2% | 1% | 16 |
| 7 | RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY B | 3101 | 1% | 1% | 11 |
| 8 | KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY | 1630 | 0% | 2% | 3 |
| 9 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 1269 | 3% | 0% | 27 |
| 10 | AUSTRALIAN JOURNAL OF PHYSICS | 1260 | 1% | 1% | 7 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | AZRIEL, VM , RUSIN, LY , SEVRYUK, MB , (1995) PULSE MODEL OF INTERACTION OF DIATOMIC MOLECULE PAIR WITH IONIC BONDS.KHIMICHESKAYA FIZIKA. VOL. 14. ISSUE 7. P. 28-37 | 21 | 81% | 2 |
| 2 | BANNO, H , ASAKA, T , FUKUDA, K , (2014) ELECTRON DENSITY DISTRIBUTION AND CRYSTAL STRUCTURE OF 27R-SIALON, SI3-XAL6+XOXN10-X (X SIMILAR TO 1.9).JOURNAL OF THE CERAMIC SOCIETY OF JAPAN. VOL. 122. ISSUE 1424. P. 281 -287 | 12 | 80% | 0 |
| 3 | GORFMAN, S , SCHMIDT, O , TSIRELSON, V , ZIOLKOWSKI, M , PIETSCH, U , (2013) CRYSTALLOGRAPHY UNDER EXTERNAL ELECTRIC FIELD.ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE. VOL. 639. ISSUE 11. P. 1953 -1962 | 18 | 51% | 6 |
| 4 | SOBOLEVA, LV , (1995) DETERMINATION OF OPTIMAL CRYSTAL-GROWTH CONDITIONS FROM DISSOLUTION DIAGRAMS OF TERNARY-SYSTEMS.INORGANIC MATERIALS. VOL. 31. ISSUE 5. P. 567-595 | 19 | 83% | 1 |
| 5 | SARAVANAN, R , ISRAEL, S , (2004) BONDING IN FLUORITE COMPOUND CAF2 USING MEM.PHYSICA B-CONDENSED MATTER. VOL. 352. ISSUE 1-4. P. 220-226 | 12 | 86% | 5 |
| 6 | GORFMAN, S , SCHMIDT, O , ZIOLKOWSKI, M , VON KOZIEROWSKI, M , PIETSCH, U , (2010) TIME-RESOLVED X-RAY DIFFRACTION STUDY OF THE PIEZOELECTRIC CRYSTAL RESPONSE TO A FAST CHANGE OF AN APPLIED ELECTRIC FIELD.JOURNAL OF APPLIED PHYSICS. VOL. 108. ISSUE 6. P. - | 10 | 83% | 5 |
| 7 | SARAVANAN, R , (2006) APPLICATION OF MAXIMUM ENTROPY METHOD FOR THE STUDY OF ELECTRON DENSITY DISTRIBUTION IN SRS, BAS AND PUS USING POWDER X-RAY DATA.PRAMANA-JOURNAL OF PHYSICS. VOL. 66. ISSUE 6. P. 1057-1065 | 12 | 75% | 0 |
| 8 | KUHS, WF , (1992) GENERALIZED ATOMIC DISPLACEMENTS IN CRYSTALLOGRAPHIC STRUCTURE-ANALYSIS.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 48. ISSUE . P. 80-98 | 21 | 57% | 137 |
| 9 | BANNO, H , ASAKA, T , FUKUDA, K , (2014) ELECTRON DENSITY DISTRIBUTION AND DISORDERED CRYSTAL STRUCTURE OF 8H-SIALON, SI3-XAL1+XOXN5-X (X SIMILAR TO 2.2).JOURNAL OF SOLID STATE CHEMISTRY. VOL. 213. ISSUE . P. 169 -175 | 11 | 65% | 1 |
| 10 | SARAVANAN, R , MAJELA, AMA , JAINULABDEEN, S , (2007) NON-NUCLEAR MAXIMA (NNM), SYMMETRIC AND ASYMMETRIC CHARGE DISTRIBUTION IN SOLAR GRADE SI AND N-GAAS, USING X-RAY POWDER DATA.PHYSICA B-CONDENSED MATTER. VOL. 400. ISSUE 1-2. P. 16 -21 | 17 | 50% | 1 |
Classes with closest relation at Level 2 |