Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 195 | 3 | GAN//GALLIUM NITRIDE//NITRIDES | 53830 |
| 22 | 2 | GAN//GALLIUM NITRIDE//INGAN | 36458 |
| 14486 | 1 | ALINN//RESONANT CAVITY LIGHT EMITTING DIODES//RESONANT CAVITY LIGHT EMITTING DIODE RCLED | 797 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | ALINN | authKW | 514032 | 3% | 50% | 26 |
| 2 | RESONANT CAVITY LIGHT EMITTING DIODES | authKW | 242198 | 1% | 88% | 7 |
| 3 | RESONANT CAVITY LIGHT EMITTING DIODE RCLED | authKW | 193756 | 1% | 70% | 7 |
| 4 | INALN | authKW | 164227 | 2% | 23% | 18 |
| 5 | INALN FILMS | authKW | 158172 | 1% | 100% | 4 |
| 6 | RESONANT CAVITY LIGHT EMITTING DIODES RCLEDS | authKW | 158168 | 1% | 67% | 6 |
| 7 | AL1 XINXN | authKW | 141222 | 1% | 71% | 5 |
| 8 | NITRIDE VCSELS | authKW | 118629 | 0% | 100% | 3 |
| 9 | RESONANT CAVITY LIGHT EMITTING DIODE | authKW | 118629 | 0% | 100% | 3 |
| 10 | DISTRIBUTED BRAGG REFLECTORS | authKW | 91698 | 2% | 15% | 15 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 10136 | 71% | 0% | 565 |
| 2 | Physics, Condensed Matter | 1155 | 21% | 0% | 170 |
| 3 | Materials Science, Multidisciplinary | 1015 | 27% | 0% | 217 |
| 4 | Optics | 704 | 14% | 0% | 108 |
| 5 | Engineering, Electrical & Electronic | 514 | 17% | 0% | 136 |
| 6 | Crystallography | 500 | 7% | 0% | 58 |
| 7 | Nanoscience & Nanotechnology | 71 | 4% | 0% | 34 |
| 8 | Materials Science, Coatings & Films | 42 | 2% | 0% | 17 |
| 9 | Physics, Multidisciplinary | 16 | 4% | 0% | 31 |
| 10 | Materials Science, Characterization, Testing | 6 | 1% | 0% | 4 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | NANO OPTOELECT TECHNOL | 56933 | 1% | 24% | 6 |
| 2 | QUANTUM ELECT PHOTON | 53531 | 2% | 8% | 16 |
| 3 | TEXAS SUPERCOND UNIV HOUSTON TCSUH | 52723 | 0% | 67% | 2 |
| 4 | DEP CIENCIA MAT IM QI | 50837 | 0% | 43% | 3 |
| 5 | SOLID STATE PHYS ELE ON MICROSCOPY | 50837 | 0% | 43% | 3 |
| 6 | CRHEA | 44702 | 3% | 5% | 24 |
| 7 | SOLID STATE PHYS SEMICOND EPITAXY | 44482 | 0% | 38% | 3 |
| 8 | NANO OPTOELECT | 40157 | 1% | 13% | 8 |
| 9 | NANODEVICE SYST | 39852 | 1% | 9% | 11 |
| 10 | ADA NANOFABRICAT IMAGING CHARACTERIZAT | 39543 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | APPLIED PHYSICS LETTERS | 8903 | 20% | 0% | 159 |
| 2 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 6378 | 7% | 0% | 58 |
| 3 | APPLIED PHYSICS EXPRESS | 4946 | 3% | 1% | 22 |
| 4 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | 3869 | 1% | 1% | 7 |
| 5 | JOURNAL OF CRYSTAL GROWTH | 3598 | 7% | 0% | 54 |
| 6 | JAPANESE JOURNAL OF APPLIED PHYSICS | 1977 | 4% | 0% | 29 |
| 7 | IEEE PHOTONICS TECHNOLOGY LETTERS | 1833 | 4% | 0% | 28 |
| 8 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1148 | 2% | 0% | 19 |
| 9 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1066 | 2% | 0% | 15 |
| 10 | JOURNAL OF APPLIED PHYSICS | 923 | 7% | 0% | 52 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |