Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | MODE DISCRIMINATION | authKW | 178052 | 1% | 67% | 6 |
2 | VARIABLE REFLECTIVITY MIRROR | authKW | 142443 | 1% | 80% | 4 |
3 | MILIEUX IONISES LASERS | address | 135652 | 1% | 38% | 8 |
4 | GAUSSIAN MIRROR | authKW | 133542 | 0% | 100% | 3 |
5 | SOLID STATE LASER PL TECH | address | 118701 | 1% | 67% | 4 |
6 | GRADED PHASE MIRROR | authKW | 100155 | 0% | 75% | 3 |
7 | CUSTOM MODES | authKW | 89028 | 0% | 100% | 2 |
8 | ENSICAEN RECH IONS MAT PHOTONUMR 6252 | address | 89028 | 0% | 100% | 2 |
9 | HIGH ORDER TRANSVERSE MODES | authKW | 89028 | 0% | 100% | 2 |
10 | INTERFEROMETRIC BEAM SHAPING | authKW | 89028 | 0% | 100% | 2 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Optics | 24644 | 77% | 0% | 542 |
2 | Physics, Applied | 913 | 25% | 0% | 177 |
3 | Engineering, Electrical & Electronic | 586 | 19% | 0% | 134 |
4 | Physics, Multidisciplinary | 115 | 7% | 0% | 53 |
5 | Spectroscopy | 79 | 4% | 0% | 25 |
6 | METALLURGY & MINING | 9 | 0% | 0% | 1 |
7 | Telecommunications | 3 | 1% | 0% | 9 |
8 | Materials Science, Characterization, Testing | -0 | 0% | 0% | 1 |
9 | Remote Sensing | -0 | 0% | 0% | 1 |
10 | Engineering, Aerospace | -0 | 0% | 0% | 1 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MILIEUX IONISES LASERS | 135652 | 1% | 38% | 8 |
2 | SOLID STATE LASER PL TECH | 118701 | 1% | 67% | 4 |
3 | ENSICAEN RECH IONS MAT PHOTONUMR 6252 | 89028 | 0% | 100% | 2 |
4 | ECOLE SUPER INGENIEURS CAEN | 80117 | 1% | 30% | 6 |
5 | RECH IONS MAT PHOTON | 73658 | 2% | 14% | 12 |
6 | RECH IONS MAT PHOTONUMR 6252 | 66768 | 0% | 50% | 3 |
7 | UMR6637 | 59351 | 0% | 67% | 2 |
8 | CEA RECH IONS MAT PHOTONUMR 6252 | 44514 | 0% | 100% | 1 |
9 | CEACNRSUNITE MIXTE RECH RECH 6252 | 44514 | 0% | 100% | 1 |
10 | CEAUMR 6252ENSICAEN | 44514 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | APPLIED OPTICS | 27574 | 21% | 0% | 149 |
2 | KVANTOVAYA ELEKTRONIKA | 19795 | 8% | 1% | 54 |
3 | OPTICS COMMUNICATIONS | 11568 | 12% | 0% | 83 |
4 | IEEE JOURNAL OF QUANTUM ELECTRONICS | 7849 | 6% | 0% | 39 |
5 | JOURNAL OF OPTICAL TECHNOLOGY | 6614 | 3% | 1% | 22 |
6 | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 5286 | 1% | 1% | 10 |
7 | OPTICS LETTERS | 3498 | 7% | 0% | 49 |
8 | QUANTUM ELECTRONICS | 2299 | 2% | 0% | 15 |
9 | JOURNAL OF MODERN OPTICS | 2181 | 3% | 0% | 18 |
10 | REVUE ROUMAINE DE PHYSIQUE | 2047 | 1% | 1% | 5 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |