Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 515 | 3 | THERMAL CONDUCTIVITY//THERMAL DIFFUSIVITY//PHONON TRANSPORT | 21578 |
| 1483 | 2 | THERMAL LENS SPECTROMETRY//INFRARED THERMOGRAPHY//PULSED THERMOGRAPHY | 7880 |
| 19809 | 1 | ELECTRON ACOUSTIC MICROSCOPY//PA IMAGING//PHOTOACOUSTIC MICROSCOPE | 511 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | ELECTRON ACOUSTIC MICROSCOPY | authKW | 616756 | 2% | 100% | 10 |
| 2 | PA IMAGING | authKW | 416306 | 2% | 75% | 9 |
| 3 | PHOTOACOUSTIC MICROSCOPE | authKW | 308378 | 1% | 100% | 5 |
| 4 | NONDESTRUCTIVE OBSERVATION | authKW | 277537 | 1% | 75% | 6 |
| 5 | ION ACOUSTIC MICROSCOPY | authKW | 185027 | 1% | 100% | 3 |
| 6 | SCANNING PHOTOACOUSTIC MICROSCOPE | authKW | 185027 | 1% | 100% | 3 |
| 7 | PHOTOACOUSTIC MICROSCOPY PAM | authKW | 171317 | 1% | 56% | 5 |
| 8 | SI TRANSISTOR | authKW | 138769 | 1% | 75% | 3 |
| 9 | THERMAL WAVE MICROSCOPY | authKW | 138769 | 1% | 75% | 3 |
| 10 | BEAM DISPLACEMENT MODULATION | authKW | 123351 | 0% | 100% | 2 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 2041 | 41% | 0% | 211 |
| 2 | Microscopy | 858 | 5% | 0% | 23 |
| 3 | Materials Science, Characterization, Testing | 415 | 4% | 0% | 19 |
| 4 | Acoustics | 252 | 5% | 0% | 23 |
| 5 | Physics, Multidisciplinary | 218 | 11% | 0% | 56 |
| 6 | Materials Science, Multidisciplinary | 130 | 14% | 0% | 74 |
| 7 | Instruments & Instrumentation | 112 | 5% | 0% | 28 |
| 8 | Engineering, Electrical & Electronic | 56 | 9% | 0% | 45 |
| 9 | METALLURGY & MINING | 54 | 0% | 0% | 2 |
| 10 | Physics, Condensed Matter | 40 | 7% | 0% | 35 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | BEREICH FUGETECH WEISSTECH | 61676 | 0% | 100% | 1 |
| 2 | BEREICH WIDERSTANDS WIESSTECH | 61676 | 0% | 100% | 1 |
| 3 | CHAIR MULTIMEDIA SYST ARTIFICIAL INTELLIGENCE | 61676 | 0% | 100% | 1 |
| 4 | KATEDRA SYST MULTIMEDIALNYCH SZTUCZNEJ INTELIGE | 61676 | 0% | 100% | 1 |
| 5 | FUNCT INORGAN MAT | 24963 | 1% | 6% | 7 |
| 6 | KOMMANDANTENSTR 60 | 20557 | 0% | 33% | 1 |
| 7 | URA 304 | 20557 | 0% | 33% | 1 |
| 8 | PL PHYS INFORMAT | 19135 | 1% | 10% | 3 |
| 9 | MAIN FIRE SERV | 15417 | 0% | 25% | 1 |
| 10 | ADV DIFFUS WAVE PHOTOACOUST TECHNOL CADIPT | 14508 | 0% | 12% | 2 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | RCA REVIEW | 32104 | 2% | 5% | 10 |
| 2 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 6864 | 12% | 0% | 59 |
| 3 | PHYSICAL ACOUSTICS | 5733 | 0% | 5% | 2 |
| 4 | SCANNING ELECTRON MICROSCOPY | 4781 | 2% | 1% | 9 |
| 5 | AUTOMATIC WELDING USSR | 3285 | 0% | 3% | 2 |
| 6 | SCANNING MICROSCOPY | 2394 | 1% | 1% | 7 |
| 7 | JOURNAL DE PHYSIQUE IV | 2134 | 4% | 0% | 19 |
| 8 | PROGRESS IN NATURAL SCIENCE-MATERIALS INTERNATIONAL | 2002 | 2% | 0% | 9 |
| 9 | PROGRESS IN ANALYTICAL SPECTROSCOPY | 1400 | 0% | 2% | 1 |
| 10 | TECHNICAL PHYSICS LETTERS | 1102 | 2% | 0% | 11 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |