Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 375 | 3 | MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 34629 |
| 805 | 2 | JOURNAL OF SYNCHROTRON RADIATION//FLUORESCENCE YIELD//RESONANT INELASTIC X RAY SCATTERING | 12256 |
| 24021 | 1 | CONVERSION ELECTRON YIELD//CRYSTAL TECHNOL DEV//SIK EDGE XANES | 349 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | CONVERSION ELECTRON YIELD | authKW | 722443 | 2% | 100% | 8 |
| 2 | CRYSTAL TECHNOL DEV | address | 270916 | 1% | 100% | 3 |
| 3 | SIK EDGE XANES | authKW | 270916 | 1% | 100% | 3 |
| 4 | X RAY PHOTOACOUSTIC EFFECT | authKW | 270916 | 1% | 100% | 3 |
| 5 | TRXPS | authKW | 203186 | 1% | 75% | 3 |
| 6 | ANISOTROPIC STRUCTURE ANALYSIS | authKW | 180611 | 1% | 100% | 2 |
| 7 | DRY TYPE SILICA | authKW | 180611 | 1% | 100% | 2 |
| 8 | GIXPS | authKW | 180611 | 1% | 100% | 2 |
| 9 | HBEREICH C EXPT PHYS | address | 180611 | 1% | 100% | 2 |
| 10 | POLARIZATION DEPENDENT TOTAL REFLECTION FLUORESCENCE XAFS | authKW | 180611 | 1% | 100% | 2 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Instruments & Instrumentation | 1158 | 19% | 0% | 65 |
| 2 | Physics, Applied | 689 | 30% | 0% | 105 |
| 3 | Physics, Condensed Matter | 469 | 21% | 0% | 72 |
| 4 | Spectroscopy | 425 | 10% | 0% | 35 |
| 5 | Physics, Multidisciplinary | 147 | 11% | 0% | 38 |
| 6 | Nuclear Science & Technology | 61 | 5% | 0% | 16 |
| 7 | Optics | 60 | 7% | 0% | 24 |
| 8 | Chemistry, Physical | 51 | 11% | 0% | 39 |
| 9 | Chemistry, Analytical | 49 | 7% | 0% | 23 |
| 10 | Physics, Nuclear | 44 | 4% | 0% | 14 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | CRYSTAL TECHNOL DEV | 270916 | 1% | 100% | 3 |
| 2 | HBEREICH C EXPT PHYS | 180611 | 1% | 100% | 2 |
| 3 | ENS CHIM PARIS | 90305 | 0% | 100% | 1 |
| 4 | MAT WISSEN FB 8 | 90305 | 0% | 100% | 1 |
| 5 | NTT AT | 90305 | 0% | 100% | 1 |
| 6 | TIMORI | 90305 | 0% | 100% | 1 |
| 7 | ADHES THIN FILMS | 45152 | 0% | 50% | 1 |
| 8 | FRITZ HABER ABT ANORGAN CHEM | 45152 | 0% | 50% | 1 |
| 9 | SYNCHOTRON RADIAT SCI | 45152 | 0% | 50% | 1 |
| 10 | KANTO TECH | 31254 | 1% | 12% | 3 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF SYNCHROTRON RADIATION | 16518 | 7% | 1% | 24 |
| 2 | SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2693 | 4% | 0% | 13 |
| 3 | PHYSICA B-CONDENSED MATTER | 2248 | 8% | 0% | 28 |
| 4 | JOURNAL DE PHYSIQUE IV | 2223 | 5% | 0% | 16 |
| 5 | SURFACE AND INTERFACE ANALYSIS | 1590 | 3% | 0% | 11 |
| 6 | X-RAY SPECTROMETRY | 1547 | 2% | 0% | 6 |
| 7 | REVIEW OF SCIENTIFIC INSTRUMENTS | 1527 | 7% | 0% | 23 |
| 8 | ELECTROCOMPONENT SCIENCE AND TECHNOLOGY | 1099 | 0% | 1% | 1 |
| 9 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1022 | 5% | 0% | 19 |
| 10 | JOURNAL OF ANALYTICAL METHODS IN CHEMISTRY | 860 | 1% | 0% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |