Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
26 | 4 | ENGINEERING, ELECTRICAL & ELECTRONIC//ELECT ENGN//IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION | 322555 |
620 | 3 | LIGHTNING//IEEE TRANSACTIONS ON POWER DELIVERY//POWER TRANSFORMER | 12898 |
1360 | 2 | IEEE TRANSACTIONS ON POWER DELIVERY//LIGHTNING//POWER TRANSFORMER | 8553 |
26988 | 1 | IEC 60060 1//LIGHTNING IMPULSE WITHSTAND VOLTAGE TEST//LIGHTNING IMPULSE VOLTAGE TEST | 260 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | IEC 60060 1 | authKW | 1946225 | 7% | 94% | 17 |
2 | LIGHTNING IMPULSE WITHSTAND VOLTAGE TEST | authKW | 727310 | 2% | 100% | 6 |
3 | LIGHTNING IMPULSE VOLTAGE TEST | authKW | 659963 | 3% | 78% | 7 |
4 | OVERSHOOT RATE | authKW | 484873 | 2% | 100% | 4 |
5 | RECORDED CURVE | authKW | 484873 | 2% | 100% | 4 |
6 | TEST VOLTAGE FUNCTION | authKW | 484873 | 2% | 100% | 4 |
7 | RESIDUAL CURVE | authKW | 387897 | 2% | 80% | 4 |
8 | SPHERE GAPS | authKW | 363655 | 1% | 100% | 3 |
9 | SPARKOVER | authKW | 323246 | 2% | 67% | 4 |
10 | BASE CURVE | authKW | 311697 | 2% | 43% | 6 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 5005 | 80% | 0% | 207 |
2 | Instruments & Instrumentation | 2917 | 33% | 0% | 87 |
3 | Physics, Applied | 347 | 25% | 0% | 66 |
4 | Engineering, General | 107 | 5% | 0% | 14 |
5 | Computer Science, Hardware & Architecture | 0 | 0% | 0% | 1 |
6 | Energy & Fuels | -0 | 1% | 0% | 2 |
7 | Physics, Fluids & Plasmas | -0 | 0% | 0% | 1 |
8 | Computer Science, Artificial Intelligence | -0 | 0% | 0% | 1 |
9 | Telecommunications | -0 | 0% | 0% | 1 |
10 | Computer Science, Interdisciplinary Applications | -0 | 0% | 0% | 1 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | LCOE | 242437 | 1% | 100% | 2 |
2 | HIGH VOLTAGE INSULAT GRP | 138276 | 3% | 13% | 9 |
3 | ELECT POWER MEASUREMENTS MEASUREMENT ST | 121218 | 0% | 100% | 1 |
4 | ELECT SYST UNDERGROUND TRANSMISS PROGRAM | 121218 | 0% | 100% | 1 |
5 | ENGN TRANSMISS DISTRIBUT SYST | 121218 | 0% | 100% | 1 |
6 | HIGH VOLTAGE ENGN ELECT TECHNOL | 121218 | 0% | 100% | 1 |
7 | LCOE FFII | 121218 | 0% | 100% | 1 |
8 | TD SYST | 121218 | 0% | 100% | 1 |
9 | DIPARTIMENTO INFORMAZ INGN ELETTR | 60608 | 0% | 50% | 1 |
10 | EEPS GRP | 60608 | 0% | 50% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEE PROCEEDINGS-SCIENCE MEASUREMENT AND TECHNOLOGY | 61597 | 7% | 3% | 19 |
2 | IEEE TRANSACTIONS ON POWER DELIVERY | 55344 | 23% | 1% | 60 |
3 | IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 51250 | 12% | 1% | 32 |
4 | IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY | 25165 | 5% | 2% | 12 |
5 | IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 23565 | 12% | 1% | 30 |
6 | ETZ ARCHIV | 4521 | 1% | 1% | 3 |
7 | PTB-MITTEILUNGEN | 3961 | 1% | 1% | 3 |
8 | ELECTRICAL TECHNOLOGY | 3786 | 0% | 3% | 1 |
9 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2979 | 6% | 0% | 15 |
10 | REVIEW OF SCIENTIFIC INSTRUMENTS | 2444 | 10% | 0% | 25 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | IEC 60060 1 | 1946225 | 7% | 94% | 17 | Search IEC+60060+1 | Search IEC+60060+1 |
2 | LIGHTNING IMPULSE WITHSTAND VOLTAGE TEST | 727310 | 2% | 100% | 6 | Search LIGHTNING+IMPULSE+WITHSTAND+VOLTAGE+TEST | Search LIGHTNING+IMPULSE+WITHSTAND+VOLTAGE+TEST |
3 | LIGHTNING IMPULSE VOLTAGE TEST | 659963 | 3% | 78% | 7 | Search LIGHTNING+IMPULSE+VOLTAGE+TEST | Search LIGHTNING+IMPULSE+VOLTAGE+TEST |
4 | OVERSHOOT RATE | 484873 | 2% | 100% | 4 | Search OVERSHOOT+RATE | Search OVERSHOOT+RATE |
5 | RECORDED CURVE | 484873 | 2% | 100% | 4 | Search RECORDED+CURVE | Search RECORDED+CURVE |
6 | TEST VOLTAGE FUNCTION | 484873 | 2% | 100% | 4 | Search TEST+VOLTAGE+FUNCTION | Search TEST+VOLTAGE+FUNCTION |
7 | RESIDUAL CURVE | 387897 | 2% | 80% | 4 | Search RESIDUAL+CURVE | Search RESIDUAL+CURVE |
8 | SPHERE GAPS | 363655 | 1% | 100% | 3 | Search SPHERE+GAPS | Search SPHERE+GAPS |
9 | SPARKOVER | 323246 | 2% | 67% | 4 | Search SPARKOVER | Search SPARKOVER |
10 | BASE CURVE | 311697 | 2% | 43% | 6 | Search BASE+CURVE | Search BASE+CURVE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |