Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
378 | 3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//NUCLEAR SCIENCE & TECHNOLOGY//INSTRUMENTS & INSTRUMENTATION | 34252 |
2208 | 2 | SWIFT HEAVY IONS//ION TRACKS//THERMAL SPIKE | 5163 |
27336 | 1 | TEMPOS STRUCTURES//ETCHED ION TRACKS//COMPACTATION | 252 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | TEMPOS STRUCTURES | authKW | 875466 | 3% | 100% | 7 |
2 | ETCHED ION TRACKS | authKW | 333508 | 2% | 67% | 4 |
3 | COMPACTATION | authKW | 285863 | 2% | 57% | 4 |
4 | J AN ATOM ENERGY S | address | 250133 | 1% | 100% | 2 |
5 | NANO INDENTED FILMS | authKW | 250133 | 1% | 100% | 2 |
6 | SINGLE PARTICLE NANOFABRICATION TECHNIQUE | authKW | 250133 | 1% | 100% | 2 |
7 | C 60 FILMS | authKW | 235407 | 3% | 24% | 8 |
8 | DAMAGE CROSS SECTION | authKW | 200102 | 2% | 40% | 4 |
9 | SF4 | address | 160796 | 1% | 43% | 3 |
10 | 195 GEV KR IONS | authKW | 125067 | 0% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Nuclear Science & Technology | 1528 | 23% | 0% | 58 |
2 | Physics, Atomic, Molecular & Chemical | 845 | 23% | 0% | 59 |
3 | Physics, Applied | 594 | 33% | 0% | 82 |
4 | Physics, Nuclear | 564 | 14% | 0% | 36 |
5 | Nanoscience & Nanotechnology | 545 | 17% | 0% | 42 |
6 | Instruments & Instrumentation | 534 | 15% | 0% | 38 |
7 | Materials Science, Multidisciplinary | 359 | 29% | 0% | 72 |
8 | Physics, Condensed Matter | 354 | 21% | 0% | 53 |
9 | Materials Science, Coatings & Films | 149 | 6% | 0% | 15 |
10 | Chemistry, Physical | 140 | 18% | 0% | 46 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | J AN ATOM ENERGY S | 250133 | 1% | 100% | 2 |
2 | SF4 | 160796 | 1% | 43% | 3 |
3 | ERCH INTEGRATED TECHNOL SYST | 125067 | 0% | 100% | 1 |
4 | INTENSE MAGNET FIELDS | 125067 | 0% | 100% | 1 |
5 | INTENSE MAGNET FIELDS LNCMI | 125067 | 0% | 100% | 1 |
6 | JNRI | 125067 | 0% | 100% | 1 |
7 | MOECULAR ENGN | 125067 | 0% | 100% | 1 |
8 | NANOTUBE NANOSTRUCTURED COMPOSITE | 125067 | 0% | 100% | 1 |
9 | NONOTECH | 125067 | 0% | 100% | 1 |
10 | PHYS PARTICLES HIGH ENERGIES | 125067 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | FULLERENE SCIENCE AND TECHNOLOGY | 11335 | 3% | 1% | 7 |
2 | FULLERENES NANOTUBES AND CARBON NANOSTRUCTURES | 8035 | 4% | 1% | 9 |
3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 4779 | 14% | 0% | 35 |
4 | RADIATION EFFECTS AND DEFECTS IN SOLIDS-INCORPORATING PLASMA SCIENCE AND PLASMA TECHNOLOGY | 4716 | 1% | 2% | 2 |
5 | PLASMONICS | 4526 | 3% | 1% | 7 |
6 | JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY | 3945 | 3% | 0% | 8 |
7 | RADIATION EFFECTS AND DEFECTS IN SOLIDS | 3214 | 4% | 0% | 11 |
8 | PHYSICS OF THE SOLID STATE | 1474 | 4% | 0% | 10 |
9 | MOLECULAR MATERIALS | 1135 | 0% | 1% | 1 |
10 | VACUUM | 619 | 3% | 0% | 7 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | TEMPOS STRUCTURES | 875466 | 3% | 100% | 7 | Search TEMPOS+STRUCTURES | Search TEMPOS+STRUCTURES |
2 | ETCHED ION TRACKS | 333508 | 2% | 67% | 4 | Search ETCHED+ION+TRACKS | Search ETCHED+ION+TRACKS |
3 | COMPACTATION | 285863 | 2% | 57% | 4 | Search COMPACTATION | Search COMPACTATION |
4 | NANO INDENTED FILMS | 250133 | 1% | 100% | 2 | Search NANO+INDENTED+FILMS | Search NANO+INDENTED+FILMS |
5 | SINGLE PARTICLE NANOFABRICATION TECHNIQUE | 250133 | 1% | 100% | 2 | Search SINGLE+PARTICLE+NANOFABRICATION+TECHNIQUE | Search SINGLE+PARTICLE+NANOFABRICATION+TECHNIQUE |
6 | C 60 FILMS | 235407 | 3% | 24% | 8 | Search C+60+FILMS | Search C+60+FILMS |
7 | DAMAGE CROSS SECTION | 200102 | 2% | 40% | 4 | Search DAMAGE+CROSS+SECTION | Search DAMAGE+CROSS+SECTION |
8 | 195 GEV KR IONS | 125067 | 0% | 100% | 1 | Search 195+GEV+KR+IONS | Search 195+GEV+KR+IONS |
9 | 6141E | 125067 | 0% | 100% | 1 | Search 6141E | Search 6141E |
10 | 8107DE | 125067 | 0% | 100% | 1 | Search 8107DE | Search 8107DE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |