Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | ELECTRICAL TEST STRUCTURE | authKW | 259040 | 1% | 60% | 3 |
| 2 | ELECTRICAL CRITICAL DIMENSION ECD | authKW | 191882 | 1% | 67% | 2 |
| 3 | ACCURATE COLORS | authKW | 143912 | 0% | 100% | 1 |
| 4 | ADAPTABLE SYSTEM OF STUDY | authKW | 143912 | 0% | 100% | 1 |
| 5 | ADV SILICON RD | address | 143912 | 0% | 100% | 1 |
| 6 | BINARY BOUNDARY IMAGE | authKW | 143912 | 0% | 100% | 1 |
| 7 | BRIGHTNESS CALIBRATION | authKW | 143912 | 0% | 100% | 1 |
| 8 | BRIGHTNESS FEATURE EXTRACTION | authKW | 143912 | 0% | 100% | 1 |
| 9 | CHARGE COUPLED DEVICES CCDS CALIBRATION | authKW | 143912 | 0% | 100% | 1 |
| 10 | CHERNICAL MECHANICAL POLISHING | authKW | 143912 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Engineering, Electrical & Electronic | 1066 | 42% | 0% | 91 |
| 2 | Computer Science, Hardware & Architecture | 665 | 10% | 0% | 22 |
| 3 | Computer Science, Software Engineering | 460 | 11% | 0% | 24 |
| 4 | Spectroscopy | 352 | 11% | 0% | 25 |
| 5 | Optics | 317 | 17% | 0% | 37 |
| 6 | Engineering, Manufacturing | 314 | 7% | 0% | 15 |
| 7 | Education, Scientific Disciplines | 260 | 5% | 0% | 12 |
| 8 | Robotics | 249 | 3% | 0% | 7 |
| 9 | Computer Science, Artificial Intelligence | 235 | 9% | 0% | 20 |
| 10 | Physics, Applied | 88 | 16% | 0% | 34 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ADV SILICON RD | 143912 | 0% | 100% | 1 |
| 2 | CISX 314 | 143912 | 0% | 100% | 1 |
| 3 | MICROELECT DEV S | 143912 | 0% | 100% | 1 |
| 4 | NAVAL MECHATRON ENGN | 143912 | 0% | 100% | 1 |
| 5 | PROCESS DIAGNOST CONTROL GRP | 143912 | 0% | 100% | 1 |
| 6 | MET FABRICAT | 28781 | 0% | 20% | 1 |
| 7 | SEMICOND ELECT | 20728 | 4% | 2% | 8 |
| 8 | TRANSDUCER SYST | 20557 | 0% | 14% | 1 |
| 9 | MICROSTRUCT CHARACTERIZAT | 14389 | 0% | 10% | 1 |
| 10 | ARTIF INTELLIGENCE | 11991 | 0% | 8% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS | 133454 | 7% | 6% | 16 |
| 2 | SCIENCE NEWS | 19181 | 2% | 3% | 4 |
| 3 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 16703 | 11% | 0% | 25 |
| 4 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 12945 | 5% | 1% | 12 |
| 5 | COMPUTER | 10325 | 7% | 0% | 15 |
| 6 | INSTRUMENTS & CONTROL SYSTEMS | 10278 | 0% | 7% | 1 |
| 7 | IEEE TRANSACTIONS ON EDUCATION | 7692 | 5% | 1% | 10 |
| 8 | CONTROL ENGINEERING | 2566 | 1% | 1% | 2 |
| 9 | IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES | 2336 | 1% | 1% | 3 |
| 10 | SOLID STATE TECHNOLOGY | 1925 | 2% | 0% | 5 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |