Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 544 | 3 | THERMOELECTRIC//THERMOELECTRIC MATERIALS//THERMOELECTRIC PROPERTIES | 18922 |
| 2567 | 2 | LEAD TELLURIDE//SOVIET PHYSICS SEMICONDUCTORS-USSR//PBTE | 3950 |
| 32443 | 1 | ARMAMENT DEV ENGN COMMAND//ATTN RDAR MEF A//ATTN RDRL SEE I | 151 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | ARMAMENT DEV ENGN COMMAND | address | 208722 | 1% | 100% | 1 |
| 2 | ATTN RDAR MEF A | address | 208722 | 1% | 100% | 1 |
| 3 | ATTN RDRL SEE I | address | 208722 | 1% | 100% | 1 |
| 4 | EBIC EFFECT | authKW | 208722 | 1% | 100% | 1 |
| 5 | ELLIPSOMETRY SERV | address | 208722 | 1% | 100% | 1 |
| 6 | LEAD TELLURIDE FILM | authKW | 208722 | 1% | 100% | 1 |
| 7 | LEAD TELLURIDE FILMS | authKW | 208722 | 1% | 100% | 1 |
| 8 | LIMITING PORE RADIUS | authKW | 208722 | 1% | 100% | 1 |
| 9 | OXYGEN AND IODINE | authKW | 208722 | 1% | 100% | 1 |
| 10 | PB1 XCDXSE ALLOYS | authKW | 208722 | 1% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 2603 | 68% | 0% | 102 |
| 2 | Physics, Applied | 87 | 18% | 0% | 27 |
| 3 | Materials Science, Multidisciplinary | 75 | 19% | 0% | 28 |
| 4 | Materials Science, Coatings & Films | 36 | 4% | 0% | 6 |
| 5 | Instruments & Instrumentation | 15 | 4% | 0% | 6 |
| 6 | Engineering, General | 12 | 3% | 0% | 4 |
| 7 | Materials Science, Ceramics | 10 | 2% | 0% | 3 |
| 8 | Crystallography | 1 | 1% | 0% | 2 |
| 9 | Physics, Multidisciplinary | 0 | 3% | 0% | 4 |
| 10 | Optics | 0 | 2% | 0% | 3 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ARMAMENT DEV ENGN COMMAND | 208722 | 1% | 100% | 1 |
| 2 | ATTN RDAR MEF A | 208722 | 1% | 100% | 1 |
| 3 | ATTN RDRL SEE I | 208722 | 1% | 100% | 1 |
| 4 | ELLIPSOMETRY SERV | 208722 | 1% | 100% | 1 |
| 5 | HBEREICH PHYS TECH | 17392 | 1% | 8% | 1 |
| 6 | PHOTON DEVICES SYST GRP | 17392 | 1% | 8% | 1 |
| 7 | MICROPHOTON | 14618 | 5% | 1% | 7 |
| 8 | PHYS IND PHYS | 9485 | 1% | 5% | 1 |
| 9 | TAGANROG TECHNOL | 5089 | 1% | 2% | 1 |
| 10 | KONSTANTINOV ST PETERSBURG NUCL PHYS | 4439 | 1% | 2% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 48571 | 24% | 1% | 36 |
| 2 | SEMICONDUCTORS | 13256 | 14% | 0% | 21 |
| 3 | FIZIKA TVERDOGO TELA | 6177 | 12% | 0% | 18 |
| 4 | SOVIET MICROELECTRONICS | 2788 | 1% | 1% | 2 |
| 5 | JOURNAL OF SURFACE INVESTIGATION | 2535 | 3% | 0% | 4 |
| 6 | INORGANIC MATERIALS | 1766 | 6% | 0% | 9 |
| 7 | REVUE ROUMAINE DE PHYSIQUE | 1539 | 1% | 0% | 2 |
| 8 | KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY | 1068 | 1% | 1% | 1 |
| 9 | INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 807 | 3% | 0% | 4 |
| 10 | JOURNAL OF OVONIC RESEARCH | 763 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |