Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
588 | 3 | X RAY OPTICS//X RAY MICROSCOPY//JOURNAL OF SYNCHROTRON RADIATION | 15045 |
1435 | 2 | X RAY MICROSCOPY//X RAY OPTICS//MULTILAYER MIRROR | 8135 |
7319 | 1 | X RAY MICROSCOPY//ZONE PLATE//X RAY OPTICS | 1406 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | X RAY MICROSCOPY | authKW | 786123 | 8% | 31% | 115 |
2 | ZONE PLATE | authKW | 701416 | 5% | 48% | 65 |
3 | X RAY OPTICS | authKW | 507019 | 7% | 22% | 104 |
4 | COMPOUND REFRACTIVE LENSES | authKW | 344826 | 1% | 77% | 20 |
5 | REFRACTIVE LENSES | authKW | 340840 | 1% | 72% | 21 |
6 | MULTILAYER LAUE LENS | authKW | 336214 | 1% | 100% | 15 |
7 | FRESNEL ZONE PLATE | authKW | 316254 | 3% | 34% | 42 |
8 | RONTGENPHYS | address | 287207 | 3% | 28% | 45 |
9 | X RAY WAVEGUIDE | authKW | 253434 | 1% | 54% | 21 |
10 | X RAY FOCUSING | authKW | 249030 | 1% | 56% | 20 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Instruments & Instrumentation | 11403 | 29% | 0% | 402 |
2 | Optics | 7100 | 30% | 0% | 424 |
3 | Physics, Applied | 6211 | 43% | 0% | 608 |
4 | Spectroscopy | 1871 | 10% | 0% | 147 |
5 | Microscopy | 1453 | 4% | 0% | 50 |
6 | Nuclear Science & Technology | 1012 | 8% | 0% | 119 |
7 | Physics, Nuclear | 978 | 8% | 0% | 117 |
8 | Physics, Particles & Fields | 610 | 8% | 0% | 108 |
9 | Nanoscience & Nanotechnology | 565 | 8% | 0% | 110 |
10 | Physics, Multidisciplinary | 343 | 9% | 0% | 123 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | RONTGENPHYS | 287207 | 3% | 28% | 45 |
2 | XRAY MICROSCOPY SECT | 151292 | 1% | 75% | 9 |
3 | PRECIS SCI TECHNOL | 105081 | 3% | 10% | 46 |
4 | MISTRAL BEAMLINE EXPT | 91519 | 0% | 58% | 7 |
5 | UNIDAD ASOCIADA CNB | 89657 | 0% | 100% | 4 |
6 | ULTRA PRECIS SCI TECHNOL | 88389 | 2% | 16% | 24 |
7 | ENGN SCI SYST | 80687 | 0% | 60% | 6 |
8 | ULTR RECIS SCI TECHNOL | 69061 | 1% | 21% | 15 |
9 | NANOMETEROPT TECHNOL | 62257 | 0% | 56% | 5 |
10 | FOR EINRICHTUNG RONTGENPHYS | 56031 | 0% | 50% | 5 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF SYNCHROTRON RADIATION | 158194 | 11% | 5% | 149 |
2 | REVIEW OF SCIENTIFIC INSTRUMENTS | 8708 | 8% | 0% | 110 |
3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 5557 | 7% | 0% | 103 |
4 | JOURNAL OF SURFACE INVESTIGATION | 4339 | 1% | 1% | 16 |
5 | JOURNAL DE PHYSIQUE IV | 3773 | 3% | 0% | 42 |
6 | MICROELECTRONIC ENGINEERING | 2595 | 2% | 0% | 35 |
7 | JOURNAL OF STRUCTURAL BIOLOGY | 2514 | 1% | 1% | 20 |
8 | OPTICS EXPRESS | 2333 | 4% | 0% | 62 |
9 | X-RAY SPECTROMETRY | 2078 | 1% | 1% | 14 |
10 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1967 | 3% | 0% | 39 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | X RAY MICROSCOPY | 786123 | 8% | 31% | 115 | Search X+RAY+MICROSCOPY | Search X+RAY+MICROSCOPY |
2 | ZONE PLATE | 701416 | 5% | 48% | 65 | Search ZONE+PLATE | Search ZONE+PLATE |
3 | X RAY OPTICS | 507019 | 7% | 22% | 104 | Search X+RAY+OPTICS | Search X+RAY+OPTICS |
4 | COMPOUND REFRACTIVE LENSES | 344826 | 1% | 77% | 20 | Search COMPOUND+REFRACTIVE+LENSES | Search COMPOUND+REFRACTIVE+LENSES |
5 | REFRACTIVE LENSES | 340840 | 1% | 72% | 21 | Search REFRACTIVE+LENSES | Search REFRACTIVE+LENSES |
6 | MULTILAYER LAUE LENS | 336214 | 1% | 100% | 15 | Search MULTILAYER+LAUE+LENS | Search MULTILAYER+LAUE+LENS |
7 | FRESNEL ZONE PLATE | 316254 | 3% | 34% | 42 | Search FRESNEL+ZONE+PLATE | Search FRESNEL+ZONE+PLATE |
8 | X RAY WAVEGUIDE | 253434 | 1% | 54% | 21 | Search X+RAY+WAVEGUIDE | Search X+RAY+WAVEGUIDE |
9 | X RAY FOCUSING | 249030 | 1% | 56% | 20 | Search X+RAY+FOCUSING | Search X+RAY+FOCUSING |
10 | X RAY MICROSCOPE | 190504 | 1% | 50% | 17 | Search X+RAY+MICROSCOPE | Search X+RAY+MICROSCOPE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |