Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 51 | 3 | SURFACE SCIENCE//PHYSICS, CONDENSED MATTER//SCANNING TUNNELING MICROSCOPY | 97901 |
| 29 | 2 | SURFACE SCIENCE//LOW INDEX SINGLE CRYSTAL SURFACES//CHEMISTRY, PHYSICAL | 33694 |
| 9327 | 1 | PHOTOELECTRON DIFFRACTION//PHOTOELECTRON HOLOGRAPHY//X RAY FLUORESCENCE HOLOGRAPHY | 1197 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | PHOTOELECTRON DIFFRACTION | authKW | 859925 | 8% | 33% | 98 |
| 2 | PHOTOELECTRON HOLOGRAPHY | authKW | 593256 | 2% | 87% | 26 |
| 3 | X RAY FLUORESCENCE HOLOGRAPHY | authKW | 509709 | 2% | 88% | 22 |
| 4 | DIRECTIONAL ELASTIC PEAK ELECTRON SPECTROSCOPY DEPES | authKW | 270801 | 1% | 86% | 12 |
| 5 | X RAY HOLOGRAPHY | authKW | 246816 | 1% | 63% | 15 |
| 6 | X RAY PHOTOELECTRON DIFFRACTION | authKW | 198935 | 2% | 33% | 23 |
| 7 | STEREOATOMSCOPE | authKW | 157969 | 1% | 100% | 6 |
| 8 | DISPLAY TYPE SPHERICAL MIRROR ANALYZER | authKW | 135401 | 1% | 86% | 6 |
| 9 | FORWARD FOCUSING PEAK | authKW | 131641 | 0% | 100% | 5 |
| 10 | MODULATED ELECTRON EMISSION | authKW | 131641 | 0% | 100% | 5 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 10950 | 50% | 0% | 597 |
| 2 | Spectroscopy | 2118 | 12% | 0% | 143 |
| 3 | Chemistry, Physical | 1785 | 27% | 0% | 329 |
| 4 | Physics, Multidisciplinary | 784 | 13% | 0% | 157 |
| 5 | Materials Science, Coatings & Films | 681 | 6% | 0% | 70 |
| 6 | Physics, Applied | 537 | 16% | 0% | 194 |
| 7 | Instruments & Instrumentation | 162 | 5% | 0% | 54 |
| 8 | Physics, Nuclear | 27 | 2% | 0% | 26 |
| 9 | Nuclear Science & Technology | 27 | 2% | 0% | 26 |
| 10 | Microscopy | 23 | 1% | 0% | 7 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | MAT USING GENERAT SYNCHROTRON RADIAT I | 84241 | 1% | 40% | 8 |
| 2 | CHAIR OPT SPECT | 54845 | 0% | 42% | 5 |
| 3 | NEUTRON SPECT | 28610 | 0% | 22% | 5 |
| 4 | CMC CAT ADV PHOTON SOURCE | 26328 | 0% | 100% | 1 |
| 5 | CNRSUR1 UMR 6251 | 26328 | 0% | 100% | 1 |
| 6 | EELECT MECH ENGN | 26328 | 0% | 100% | 1 |
| 7 | GENERAT SYNCHROTRON IL 3 | 26328 | 0% | 100% | 1 |
| 8 | ICHTEN GRENZFLACHEN ISG 2 | 26328 | 0% | 100% | 1 |
| 9 | INSITUTE NUCL PHYS CHEM | 26328 | 0% | 100% | 1 |
| 10 | KERN STALINGSFYS | 26328 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 63420 | 10% | 2% | 120 |
| 2 | SURFACE SCIENCE | 23038 | 13% | 1% | 154 |
| 3 | SURFACE REVIEW AND LETTERS | 21298 | 4% | 2% | 47 |
| 4 | PHYSICAL REVIEW B | 7954 | 19% | 0% | 228 |
| 5 | PROGRESS IN SURFACE SCIENCE | 6233 | 1% | 2% | 13 |
| 6 | SURFACE AND INTERFACE ANALYSIS | 2574 | 2% | 0% | 26 |
| 7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1724 | 3% | 0% | 31 |
| 8 | CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES | 1439 | 0% | 3% | 2 |
| 9 | PHYSICAL REVIEW LETTERS | 1361 | 6% | 0% | 73 |
| 10 | SURFACE SCIENCE REPORTS | 1284 | 0% | 1% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |