Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
553 | 3 | BETA FESI2//SILICIDES//ERBIUM | 18376 |
2281 | 2 | ERBIUM//OHMIC CONTACT//ERBIUM DOPING | 4868 |
4924 | 1 | ERBIUM//ERBIUM DOPED SILICON//LIGHT EMITTING STRUCTURES | 1730 |
6323 | 1 | OHMIC CONTACT//PD GE//SOLID PHASE REGROWTH | 1526 |
7887 | 1 | GAGDN//RARE EARTH IMPLANTATION//ERBIUM | 1341 |
26586 | 1 | ERBIUM ARSENIDE//ERSB//MANY VALLEY SEMICONDUCTOR | 271 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | ERBIUM | authKW | 515489 | 7% | 24% | 330 |
2 | OHMIC CONTACT | authKW | 86610 | 2% | 12% | 115 |
3 | ERBIUM DOPING | authKW | 72825 | 0% | 49% | 23 |
4 | UMR 6176 | address | 58606 | 1% | 28% | 32 |
5 | ERBIUM DOPED SILICON | authKW | 52424 | 0% | 90% | 9 |
6 | SIFCOM | address | 51216 | 1% | 28% | 28 |
7 | PHOTOLUMINESCENCE | authKW | 47298 | 8% | 2% | 386 |
8 | RUTHERFORD BACKSCATTERING TECHNIQUE | authKW | 41420 | 0% | 80% | 8 |
9 | PHYSICS, APPLIED | WoSSC | 33738 | 53% | 0% | 2593 |
10 | AUGER EXCITATION | authKW | 32362 | 0% | 100% | 5 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 33738 | 53% | 0% | 2593 |
2 | Physics, Condensed Matter | 13917 | 29% | 0% | 1410 |
3 | Materials Science, Multidisciplinary | 4706 | 24% | 0% | 1181 |
4 | Materials Science, Coatings & Films | 3310 | 6% | 0% | 309 |
5 | Engineering, Electrical & Electronic | 1958 | 14% | 0% | 687 |
6 | Optics | 1502 | 9% | 0% | 422 |
7 | Nanoscience & Nanotechnology | 985 | 6% | 0% | 286 |
8 | Physics, Multidisciplinary | 428 | 6% | 0% | 293 |
9 | Physics, Nuclear | 137 | 2% | 0% | 113 |
10 | Crystallography | 131 | 2% | 0% | 100 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | UMR 6176 | 58606 | 1% | 28% | 32 |
2 | SIFCOM | 51216 | 1% | 28% | 28 |
3 | PHYS MICROSTRUCT | 31323 | 2% | 5% | 89 |
4 | BIOL ENERGY ENVIRONM MEASUREMENT | 29117 | 0% | 50% | 9 |
5 | MIND IN2UB | 28027 | 0% | 19% | 23 |
6 | EUROPEAN OFF | 21082 | 0% | 22% | 15 |
7 | SOLID STATE OPTOELECT | 20710 | 0% | 80% | 4 |
8 | VAN DER WAALS ZEEMAN | 20315 | 1% | 5% | 59 |
9 | AF IOFFE PHYSICOTECH | 19992 | 3% | 2% | 131 |
10 | FOR UNGSZENTRUM ISI 2 | 19417 | 0% | 100% | 3 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | APPLIED PHYSICS LETTERS | 25398 | 14% | 1% | 669 |
2 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 22874 | 3% | 2% | 162 |
3 | SEMICONDUCTORS | 20193 | 3% | 2% | 148 |
4 | JOURNAL OF APPLIED PHYSICS | 17879 | 11% | 1% | 553 |
5 | OPTICAL MATERIALS | 11548 | 2% | 2% | 111 |
6 | SOLID-STATE ELECTRONICS | 6978 | 2% | 1% | 105 |
7 | JOURNAL OF LUMINESCENCE | 5843 | 2% | 1% | 108 |
8 | JOURNAL OF ELECTRONIC MATERIALS | 4729 | 2% | 1% | 88 |
9 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 4233 | 2% | 1% | 107 |
10 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 3800 | 2% | 1% | 77 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ERBIUM | 515489 | 7% | 24% | 330 | Search ERBIUM | Search ERBIUM |
2 | OHMIC CONTACT | 86610 | 2% | 12% | 115 | Search OHMIC+CONTACT | Search OHMIC+CONTACT |
3 | ERBIUM DOPING | 72825 | 0% | 49% | 23 | Search ERBIUM+DOPING | Search ERBIUM+DOPING |
4 | ERBIUM DOPED SILICON | 52424 | 0% | 90% | 9 | Search ERBIUM+DOPED+SILICON | Search ERBIUM+DOPED+SILICON |
5 | PHOTOLUMINESCENCE | 47298 | 8% | 2% | 386 | Search PHOTOLUMINESCENCE | Search PHOTOLUMINESCENCE |
6 | RUTHERFORD BACKSCATTERING TECHNIQUE | 41420 | 0% | 80% | 8 | Search RUTHERFORD+BACKSCATTERING+TECHNIQUE | Search RUTHERFORD+BACKSCATTERING+TECHNIQUE |
7 | AUGER EXCITATION | 32362 | 0% | 100% | 5 | Search AUGER+EXCITATION | Search AUGER+EXCITATION |
8 | GAGDN | 32362 | 0% | 100% | 5 | Search GAGDN | Search GAGDN |
9 | LIGHT EMITTING STRUCTURES | 32362 | 0% | 100% | 5 | Search LIGHT+EMITTING+STRUCTURES | Search LIGHT+EMITTING+STRUCTURES |
10 | RARE EARTH IMPLANTATION | 32362 | 0% | 100% | 5 | Search RARE+EARTH+IMPLANTATION | Search RARE+EARTH+IMPLANTATION |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 2 |