Focused ion beam (FIB) and atomic force microscopy (AFM)
Hultgren Laboratory Seminar Series
This seminar is part of series of seminars introducing the areas of application and essential functionality of instruments and techniques available at Hultgren Laboratory. The seminars are aimed at users from both academy and industry. Welcome!
Time: Fri 2022-10-21 10.00 - 11.00
Video link: https://kth-se.zoom.us/j/64207214062
Participating: Liubov Belova
Focused ion beam (FIB ) and atomic force microscopy (AFM).
For questions please contact presenter
Hultgren Laboratory coordinator