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Focused ion beam (FIB) and atomic force microscopy (AFM)

Hultgren Laboratory Seminar Series

This seminar is part of series of seminars introducing the areas of application and essential functionality of instruments and techniques available at Hultgren Laboratory. The seminars are aimed at users from both academy and industry. Welcome!

Time: Fri 2022-10-21 10.00 - 11.00

Video link: https://kth-se.zoom.us/j/64207214062

Language: English

Participating: Liubov Belova

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Focused ion beam (FIB ) and atomic force microscopy (AFM).

For questions please contact presenter

Hultgren Laboratory coordinator

Belongs to: Hultgren Laboratory
Last changed: Oct 13, 2022