SK3740 Introduction to Scanning Probe Microscopy 6.0 credits

Introduktion till svepprob-mikroskopi

  • Educational level

    Third cycle
  • Academic level (A-D)

    D
  • Subject area

  • Grade scale

At present this course is not scheduled to be offered.

Intended learning outcomes

 To provide the theoretical background and physical intuitation necessary to understand how SPM's operate and how to interpret the images they produce.  To provide an practical, hands-on introduction to the operation of SPMs in a laboratory setting. 

Course main content

The course is designed for students from a wide variety of educational backgrounds, from Physics, Chemistry and Biology, who would like to learn about the technical details of how SPMs work, and the possibilities and pitfalls in interpreting the images that SPM's produce.  We will look in detail at some of the many different modes of SPM usage, with particular emphasis on Atomic Force Microscopy (AFM) and its many variations. 

  • SPM overview
  • Scanners, Sensors, Feedback and Control
  • Cantilevers and Tips, Force Measurements
  • Fluctuations, Noise and Fundamental Limits
  • Surface Forces, Adhesion and Friction
  • AFM Colloidal Probe Technique
  • SPM Applications in Microelectronics
  • Nonlinear Cantilever Dynamics

Eligibility

Solid background in Physics, Chemistry and Biology.

Language of instruction: English

Literature

Various articles, lecture notes, and training manuals, made available to participating students.

Examination

Two Written lab reports, and either one  literature project or one simulation project.

Offered by

SCI/Applied Physics

Contact

David Haviland, haviland@kth.se

Examiner

David B Haviland <haviland@kth.se>

Version

Course syllabus valid from: Autumn 2010.