Low level measurements of current, voltage and impedance for nanoelectronic devices.
Circuit design basics and use of dedicated measurement tools such as source-measure units, nanovoltmeters, picoampmeters and impedance meters.
Shielding and four-point techniques including force-sense configuration, calibration and de-embedding.
Yield and reliability measurements and figure of merits.
Statistical limitations and design of experiments
Advanced measurements tools for high-frequency, high power and circuit evaluation.
Circuit evaluation basics including ESD protection and handling.
After the course the students should have an advanced working knowledge in dedicated measurement tools for semiconductor devices and low level measurements tools in general. The student should be familiar with tools for high frequency, high power (voltage/current) and circuit evaluation.
They should be able to independently perform relevant measurements on advanced nanoelectronic devices and circuit prototypes.
The student should be able to use calibration or deembedding techniques in their experimental design and in the analysis of the measurement data.
The students should be familiar with the use of electrical characterization in yield and reliability especially with an industry perspective.
The students should be able to consider statistical limitations in their choice of characterization tools and routines.