Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
13 | 4 | PHYSICS, PARTICLES & FIELDS//PHYSICS, NUCLEAR//OPTICS | 1062565 |
263 | 3 | OPTICS//APPLIED OPTICS//OPTICS AND LASERS IN ENGINEERING | 45499 |
1174 | 2 | FRINGE ANALYSIS//OPTICS AND LASERS IN ENGINEERING//FRINGE PROJECTION | 9759 |
10046 | 1 | ABSOLUTE TEST//SUBAPERTURE STITCHING//LONG TRACE PROFILER | 1128 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | ABSOLUTE TEST | authKW | 342247 | 1% | 88% | 14 |
2 | SUBAPERTURE STITCHING | authKW | 335266 | 1% | 100% | 12 |
3 | LONG TRACE PROFILER | authKW | 330848 | 1% | 79% | 15 |
4 | OPTICAL TESTING | authKW | 292424 | 4% | 22% | 47 |
5 | PENTAPRISM | authKW | 205728 | 1% | 82% | 9 |
6 | SPACE OPT | address | 188547 | 2% | 25% | 27 |
7 | RADIAL SHEARING | authKW | 167633 | 1% | 100% | 6 |
8 | SURFACE PROFILOMETER | authKW | 161640 | 1% | 64% | 9 |
9 | METROLOGY OF X RAY OPTICS | authKW | 139694 | 0% | 100% | 5 |
10 | ZONE PLATE INTERFEROMETER | authKW | 139694 | 0% | 100% | 5 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Optics | 40431 | 78% | 0% | 876 |
2 | Instruments & Instrumentation | 1960 | 14% | 0% | 155 |
3 | Spectroscopy | 541 | 7% | 0% | 74 |
4 | Engineering, General | 258 | 4% | 0% | 47 |
5 | Engineering, Manufacturing | 165 | 2% | 0% | 27 |
6 | Physics, Nuclear | 118 | 4% | 0% | 42 |
7 | Nuclear Science & Technology | 117 | 4% | 0% | 42 |
8 | Physics, Applied | 98 | 9% | 0% | 103 |
9 | Physics, Particles & Fields | 81 | 4% | 0% | 42 |
10 | Nanoscience & Nanotechnology | 55 | 3% | 0% | 39 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SPACE OPT | 188547 | 2% | 25% | 27 |
2 | LEHRSTUHL OPT | 96341 | 1% | 27% | 13 |
3 | PHOTOELE ON IMAGING TECH SYST | 83817 | 0% | 100% | 3 |
4 | IL ULTR RECIS SUR ES | 55878 | 0% | 100% | 2 |
5 | WAVE FRONT MEASUREMENT | 55878 | 0% | 100% | 2 |
6 | XRAY OPT | 43656 | 2% | 6% | 27 |
7 | INFORMAT OPT OPTOELECT TECHNOL | 41717 | 1% | 14% | 11 |
8 | PHOTOELECT IMAGING TECH SYST | 37250 | 0% | 67% | 2 |
9 | NANJING ASTRON RUMENTS CO LTD | 35918 | 0% | 43% | 3 |
10 | ULTRA PRECIS OPTOELECT RUMENT ENGN | 30815 | 1% | 14% | 8 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | APPLIED OPTICS | 58182 | 24% | 1% | 273 |
2 | OPTICAL ENGINEERING | 35985 | 12% | 1% | 136 |
3 | OPTIK | 9115 | 5% | 1% | 61 |
4 | OPTICS EXPRESS | 8569 | 9% | 0% | 105 |
5 | OPTICS AND LASERS IN ENGINEERING | 5711 | 2% | 1% | 27 |
6 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 4024 | 2% | 1% | 28 |
7 | JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS | 3884 | 1% | 2% | 9 |
8 | PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 3128 | 1% | 1% | 13 |
9 | OPTICS COMMUNICATIONS | 2268 | 4% | 0% | 47 |
10 | OPTICS LETTERS | 2070 | 4% | 0% | 48 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ABSOLUTE TEST | 342247 | 1% | 88% | 14 | Search ABSOLUTE+TEST | Search ABSOLUTE+TEST |
2 | SUBAPERTURE STITCHING | 335266 | 1% | 100% | 12 | Search SUBAPERTURE+STITCHING | Search SUBAPERTURE+STITCHING |
3 | LONG TRACE PROFILER | 330848 | 1% | 79% | 15 | Search LONG+TRACE+PROFILER | Search LONG+TRACE+PROFILER |
4 | OPTICAL TESTING | 292424 | 4% | 22% | 47 | Search OPTICAL+TESTING | Search OPTICAL+TESTING |
5 | PENTAPRISM | 205728 | 1% | 82% | 9 | Search PENTAPRISM | Search PENTAPRISM |
6 | RADIAL SHEARING | 167633 | 1% | 100% | 6 | Search RADIAL+SHEARING | Search RADIAL+SHEARING |
7 | SURFACE PROFILOMETER | 161640 | 1% | 64% | 9 | Search SURFACE+PROFILOMETER | Search SURFACE+PROFILOMETER |
8 | METROLOGY OF X RAY OPTICS | 139694 | 0% | 100% | 5 | Search METROLOGY+OF+X+RAY+OPTICS | Search METROLOGY+OF+X+RAY+OPTICS |
9 | ZONE PLATE INTERFEROMETER | 139694 | 0% | 100% | 5 | Search ZONE+PLATE+INTERFEROMETER | Search ZONE+PLATE+INTERFEROMETER |
10 | DEFLECTOMETRY | 136268 | 2% | 26% | 19 | Search DEFLECTOMETRY | Search DEFLECTOMETRY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |