Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
13 | 4 | PHYSICS, PARTICLES & FIELDS//PHYSICS, NUCLEAR//OPTICS | 1062565 |
263 | 3 | OPTICS//APPLIED OPTICS//OPTICS AND LASERS IN ENGINEERING | 45499 |
1174 | 2 | FRINGE ANALYSIS//OPTICS AND LASERS IN ENGINEERING//FRINGE PROJECTION | 9759 |
10324 | 1 | HETERODYNE INTERFEROMETRY//HETERODYNE INTERFEROMETER//NANOMETER MEASUREMENT | 1103 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | HETERODYNE INTERFEROMETRY | authKW | 357107 | 3% | 36% | 35 |
2 | HETERODYNE INTERFEROMETER | authKW | 297119 | 2% | 40% | 26 |
3 | NANOMETER MEASUREMENT | address | 267853 | 1% | 63% | 15 |
4 | SURFACE ENCODER | authKW | 265937 | 1% | 85% | 11 |
5 | STRAIGHTNESS MEASUREMENT | authKW | 204081 | 1% | 71% | 10 |
6 | STRAIGHTNESS | authKW | 201497 | 2% | 31% | 23 |
7 | ERROR SEPARATION | authKW | 175667 | 2% | 36% | 17 |
8 | PERIODIC NONLINEARITY | authKW | 155556 | 1% | 78% | 7 |
9 | SOFTWARE DATUM | authKW | 155556 | 1% | 78% | 7 |
10 | LINEAR SLIDE | authKW | 146941 | 1% | 86% | 6 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Instruments & Instrumentation | 17422 | 40% | 0% | 436 |
2 | Optics | 9226 | 38% | 0% | 423 |
3 | Engineering, Manufacturing | 8629 | 16% | 0% | 172 |
4 | Engineering, General | 7948 | 21% | 0% | 229 |
5 | Nanoscience & Nanotechnology | 742 | 10% | 0% | 108 |
6 | Engineering, Mechanical | 739 | 9% | 0% | 101 |
7 | Physics, Applied | 525 | 17% | 0% | 183 |
8 | Engineering, Electrical & Electronic | 139 | 9% | 0% | 102 |
9 | Engineering, Industrial | 67 | 2% | 0% | 18 |
10 | Automation & Control Systems | 38 | 2% | 0% | 18 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | NANOMETER MEASUREMENT | 267853 | 1% | 63% | 15 |
2 | COMP SOR DEV GRP | 85716 | 0% | 100% | 3 |
3 | PAO SIU LOONG MEASUREMENT CONTROL | 85716 | 0% | 100% | 3 |
4 | SECT PRECIS ENGN | 76190 | 0% | 67% | 4 |
5 | POSTDOCTORAL STN OPT ENGN | 64931 | 0% | 45% | 5 |
6 | NANOMECH | 57391 | 3% | 5% | 38 |
7 | PRECIS ENGN STRAT GRP | 57144 | 0% | 100% | 2 |
8 | TC CPT OFF 10 | 57144 | 0% | 100% | 2 |
9 | SPACE NANOTECHNOL | 46746 | 1% | 27% | 6 |
10 | RUMENTS CO | 41554 | 0% | 36% | 4 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 85550 | 6% | 4% | 67 |
2 | PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING | 61575 | 2% | 8% | 27 |
3 | MEASUREMENT SCIENCE AND TECHNOLOGY | 48417 | 11% | 1% | 126 |
4 | APPLIED OPTICS | 11365 | 11% | 0% | 120 |
5 | INTERNATIONAL JOURNAL OF THE JAPAN SOCIETY FOR PRECISION ENGINEERING | 9913 | 1% | 3% | 11 |
6 | OPTICAL ENGINEERING | 8084 | 6% | 0% | 64 |
7 | REVIEW OF SCIENTIFIC INSTRUMENTS | 5423 | 7% | 0% | 77 |
8 | TM-TECHNISCHES MESSEN | 4669 | 1% | 1% | 11 |
9 | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING | 4346 | 2% | 1% | 18 |
10 | MEASUREMENT | 3398 | 2% | 1% | 23 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |