Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 375 | 3 | MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 34629 |
| 824 | 2 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY | 12082 |
| 13876 | 1 | ULTRAMICROSCOPY//MICROSCOPY//TUNGSTEN ATOMS | 837 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | ULTRAMICROSCOPY | journal | 224077 | 22% | 3% | 184 |
| 2 | MICROSCOPY | WoSSC | 94464 | 36% | 1% | 302 |
| 3 | TUNGSTEN ATOMS | authKW | 84718 | 0% | 75% | 3 |
| 4 | TIME RESOLVED HREM | authKW | 75306 | 0% | 100% | 2 |
| 5 | UHV REM | authKW | 75306 | 0% | 100% | 2 |
| 6 | REFLECTION ELECTRON MICROSCOPY REM | authKW | 68839 | 1% | 23% | 8 |
| 7 | UHV TEM | authKW | 66934 | 0% | 44% | 4 |
| 8 | REFINED BEAM UNIT | address | 50203 | 0% | 67% | 2 |
| 9 | REFLECTION ELECTRON MICROSCOPY | authKW | 39858 | 1% | 18% | 6 |
| 10 | ACTIVATION BARRIER POTENTIAL | authKW | 37653 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Microscopy | 94464 | 36% | 1% | 302 |
| 2 | Physics, Condensed Matter | 2492 | 30% | 0% | 247 |
| 3 | Chemistry, Physical | 756 | 22% | 0% | 186 |
| 4 | Physics, Applied | 568 | 19% | 0% | 160 |
| 5 | Crystallography | 489 | 7% | 0% | 59 |
| 6 | Physics, Multidisciplinary | 239 | 9% | 0% | 78 |
| 7 | Anatomy & Morphology | 154 | 2% | 0% | 17 |
| 8 | Materials Science, Coatings & Films | 135 | 3% | 0% | 28 |
| 9 | Materials Science, Multidisciplinary | 117 | 12% | 0% | 99 |
| 10 | Biology | 111 | 4% | 0% | 33 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | REFINED BEAM UNIT | 50203 | 0% | 67% | 2 |
| 2 | ADV MICROSCOPE DESIGN | 37653 | 0% | 100% | 1 |
| 3 | BEIJING ELE ON MICROSCOPYSTATE KEY LA | 37653 | 0% | 100% | 1 |
| 4 | INORGAN MAT SCI TECHNOL | 37653 | 0% | 100% | 1 |
| 5 | J AN SCI CORP | 37653 | 0% | 100% | 1 |
| 6 | PH ECUBLENS INTER MICROSCOPIE ELE | 37653 | 0% | 100% | 1 |
| 7 | PL ELECT MINAMI KU | 37653 | 0% | 100% | 1 |
| 8 | ADV WASTE EMISS MANAGEMENTCHIKUSA KU | 18826 | 0% | 50% | 1 |
| 9 | DIPARTIMENTO SCI MOLEC AGROALIMENTARI | 18826 | 0% | 50% | 1 |
| 10 | INTER MICROSCOPIE ELE | 18826 | 0% | 50% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ULTRAMICROSCOPY | 224077 | 22% | 3% | 184 |
| 2 | SURFACE SCIENCE | 22098 | 15% | 0% | 126 |
| 3 | JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 13209 | 2% | 2% | 16 |
| 4 | ACTA CRYSTALLOGRAPHICA SECTION A | 11062 | 3% | 1% | 25 |
| 5 | JOURNAL OF ELECTRON MICROSCOPY | 10710 | 3% | 1% | 23 |
| 6 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 8472 | 6% | 0% | 47 |
| 7 | CRITICAL REVIEWS IN SURFACE CHEMISTRY | 5377 | 0% | 14% | 1 |
| 8 | SURFACE REVIEW AND LETTERS | 4962 | 2% | 1% | 19 |
| 9 | ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 4393 | 2% | 1% | 13 |
| 10 | JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 2935 | 1% | 1% | 6 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |