Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
51 | 3 | SURFACE SCIENCE//PHYSICS, CONDENSED MATTER//SCANNING TUNNELING MICROSCOPY | 97901 |
1092 | 2 | GALLIUM ARSENIDE//GAAS//SURFACE SCIENCE | 10114 |
12022 | 1 | REFLECTION HIGH ENERGY ELECTRON DIFFRACTION RHEED//REFLECTION MASS SPECTROMETRY//HIGH RESOLUTION LOW ENERGY ELECTRON DIFFRACTION | 965 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | REFLECTION HIGH ENERGY ELECTRON DIFFRACTION RHEED | authKW | 86842 | 3% | 10% | 27 |
2 | REFLECTION MASS SPECTROMETRY | authKW | 73480 | 0% | 75% | 3 |
3 | HIGH RESOLUTION LOW ENERGY ELECTRON DIFFRACTION | authKW | 65317 | 0% | 100% | 2 |
4 | STEP DENSITY | authKW | 58055 | 0% | 44% | 4 |
5 | RHEED OSCILLATIONS | authKW | 48985 | 0% | 50% | 3 |
6 | PHYSISORBED MOLECULES | authKW | 43543 | 0% | 67% | 2 |
7 | RHEED | authKW | 38547 | 3% | 5% | 26 |
8 | ADSORPTION ISLAND | authKW | 32658 | 0% | 100% | 1 |
9 | AG441 | authKW | 32658 | 0% | 100% | 1 |
10 | ALXGA1 XAS ALLOY | authKW | 32658 | 0% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 5773 | 50% | 0% | 480 |
2 | Physics, Condensed Matter | 5504 | 40% | 0% | 385 |
3 | Crystallography | 2909 | 15% | 0% | 146 |
4 | Materials Science, Coatings & Films | 1946 | 11% | 0% | 102 |
5 | Materials Science, Multidisciplinary | 793 | 23% | 0% | 219 |
6 | Chemistry, Physical | 736 | 21% | 0% | 200 |
7 | Physics, Multidisciplinary | 261 | 9% | 0% | 88 |
8 | Nanoscience & Nanotechnology | 215 | 6% | 0% | 59 |
9 | Engineering, Electrical & Electronic | 77 | 8% | 0% | 77 |
10 | Microscopy | 43 | 1% | 0% | 8 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | EXPTL PHYS FESTKORPERPHYS ABT | 32658 | 0% | 100% | 1 |
2 | FOR UNGS OPTOELEKTR | 32658 | 0% | 100% | 1 |
3 | MICROELECT SOLIF STATE ELECT | 32658 | 0% | 100% | 1 |
4 | PHYS ASTRON SUPERCOMP | 32658 | 0% | 100% | 1 |
5 | PHYS EXPTL FESTKORPERPHYS ABT | 32658 | 0% | 100% | 1 |
6 | PHYS SOLIDE CNRS | 32658 | 0% | 100% | 1 |
7 | SCI SYST SYST ENGN GRP OHTA KU | 32658 | 0% | 100% | 1 |
8 | SERV NANOSTRUCT RAYONNEMENT | 32658 | 0% | 100% | 1 |
9 | SONDERFOR BEREICH 140 | 32658 | 0% | 100% | 1 |
10 | SPMM RECH FONDAMENTALE MAT CONDENSEE | 32658 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SURFACE SCIENCE | 22644 | 14% | 1% | 137 |
2 | JOURNAL OF CRYSTAL GROWTH | 14874 | 12% | 0% | 120 |
3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 5603 | 6% | 0% | 54 |
4 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1627 | 3% | 0% | 27 |
5 | APPLIED PHYSICS LETTERS | 1462 | 8% | 0% | 73 |
6 | PHYSICAL REVIEW B | 1382 | 9% | 0% | 88 |
7 | APPLIED SURFACE SCIENCE | 1041 | 4% | 0% | 35 |
8 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 984 | 1% | 1% | 6 |
9 | FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYICS | 897 | 0% | 1% | 2 |
10 | CRYSTAL RESEARCH AND TECHNOLOGY | 817 | 1% | 0% | 13 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |