Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 215 | 3 | JOURNAL OF CRYSTAL GROWTH//HGCDTE//SOVIET PHYSICS SEMICONDUCTORS-USSR | 51359 |
| 222 | 2 | JOURNAL OF CRYSTAL GROWTH//PHYSICS, APPLIED//GAAS | 20254 |
| 17520 | 1 | OVAL DEFECTS//SEEIE//ABZU | 622 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | OVAL DEFECTS | authKW | 165820 | 1% | 55% | 6 |
| 2 | SEEIE | address | 67557 | 0% | 67% | 2 |
| 3 | ABZU | authKW | 50669 | 0% | 100% | 1 |
| 4 | ACCEPTOR ACCEPTOR PAIR EMISSIONS | authKW | 50669 | 0% | 100% | 1 |
| 5 | AND CHEMICAL BEAM EPITAXY | authKW | 50669 | 0% | 100% | 1 |
| 6 | BARBAR TEMPLE | authKW | 50669 | 0% | 100% | 1 |
| 7 | ELECTRIC FIELD INDUCED DEFECT | authKW | 50669 | 0% | 100% | 1 |
| 8 | FIRPC | authKW | 50669 | 0% | 100% | 1 |
| 9 | GAAL ALGAAS | authKW | 50669 | 0% | 100% | 1 |
| 10 | HALL AND DRIFT MOBILITIES | authKW | 50669 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 5271 | 59% | 0% | 364 |
| 2 | Physics, Condensed Matter | 1017 | 23% | 0% | 140 |
| 3 | Crystallography | 856 | 10% | 0% | 65 |
| 4 | Materials Science, Multidisciplinary | 425 | 21% | 0% | 131 |
| 5 | Materials Science, Coatings & Films | 231 | 5% | 0% | 30 |
| 6 | Engineering, Electrical & Electronic | 172 | 12% | 0% | 76 |
| 7 | Nanoscience & Nanotechnology | 167 | 7% | 0% | 41 |
| 8 | Physics, Multidisciplinary | 149 | 9% | 0% | 54 |
| 9 | Instruments & Instrumentation | 29 | 3% | 0% | 19 |
| 10 | Electrochemistry | 10 | 2% | 0% | 11 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SEEIE | 67557 | 0% | 67% | 2 |
| 2 | J AN KAGAMI MEM MAT SCI TECHNOL | 50669 | 0% | 100% | 1 |
| 3 | TRANSMISS DEVICE S | 50669 | 0% | 100% | 1 |
| 4 | WRIGHT ELR SOLID STATE ELE DIRECTORATE | 50669 | 0% | 100% | 1 |
| 5 | ELR SOLID STATE ELE DIRECTORATE | 25333 | 0% | 50% | 1 |
| 6 | NORTEL ADV COMPONENTS | 25333 | 0% | 50% | 1 |
| 7 | MILLIMETER WAVE ELECT MWE | 16888 | 0% | 33% | 1 |
| 8 | MF STELMAKH POLYUS | 12666 | 0% | 25% | 1 |
| 9 | SEMICOND PROC RD | 10132 | 0% | 20% | 1 |
| 10 | SEMICOND PHYS TECHNOL | 6332 | 0% | 13% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF CRYSTAL GROWTH | 5742 | 10% | 0% | 60 |
| 2 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 4035 | 5% | 0% | 28 |
| 3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 3652 | 6% | 0% | 35 |
| 4 | APPLIED PHYSICS LETTERS | 3055 | 13% | 0% | 83 |
| 5 | JOURNAL OF APPLIED PHYSICS | 2800 | 13% | 0% | 78 |
| 6 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1533 | 1% | 1% | 6 |
| 7 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 1514 | 2% | 0% | 13 |
| 8 | CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES | 692 | 0% | 1% | 1 |
| 9 | SOLID STATE COMMUNICATIONS | 682 | 3% | 0% | 19 |
| 10 | PHYSICAL REVIEW B | 518 | 7% | 0% | 44 |
Author Key Words |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | OVAL DEFECTS | 165820 | 1% | 55% | 6 | Search OVAL+DEFECTS | Search OVAL+DEFECTS |
| 2 | ABZU | 50669 | 0% | 100% | 1 | Search ABZU | Search ABZU |
| 3 | ACCEPTOR ACCEPTOR PAIR EMISSIONS | 50669 | 0% | 100% | 1 | Search ACCEPTOR+ACCEPTOR+PAIR+EMISSIONS | Search ACCEPTOR+ACCEPTOR+PAIR+EMISSIONS |
| 4 | AND CHEMICAL BEAM EPITAXY | 50669 | 0% | 100% | 1 | Search AND+CHEMICAL+BEAM+EPITAXY | Search AND+CHEMICAL+BEAM+EPITAXY |
| 5 | BARBAR TEMPLE | 50669 | 0% | 100% | 1 | Search BARBAR+TEMPLE | Search BARBAR+TEMPLE |
| 6 | ELECTRIC FIELD INDUCED DEFECT | 50669 | 0% | 100% | 1 | Search ELECTRIC+FIELD+INDUCED+DEFECT | Search ELECTRIC+FIELD+INDUCED+DEFECT |
| 7 | FIRPC | 50669 | 0% | 100% | 1 | Search FIRPC | Search FIRPC |
| 8 | GAAL ALGAAS | 50669 | 0% | 100% | 1 | Search GAAL+ALGAAS | Search GAAL+ALGAAS |
| 9 | HALL AND DRIFT MOBILITIES | 50669 | 0% | 100% | 1 | Search HALL+AND+DRIFT+MOBILITIES | Search HALL+AND+DRIFT+MOBILITIES |
| 10 | HEURISTIC BASED CONTROL | 50669 | 0% | 100% | 1 | Search HEURISTIC+BASED+CONTROL | Search HEURISTIC+BASED+CONTROL |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |