Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
64 | 3 | SEMICONDUCTOR LASERS//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 89567 |
26 | 2 | SUPERLATTICES AND MICROSTRUCTURES//QUANTUM WELLS//PHYSICS, CONDENSED MATTER | 34827 |
14197 | 1 | INASP INP//FDN PESQUISA DESENVOLVIMENTO TELECOMUN//STRAIN COMPENSATED MULTI QUANTUM WELLS | 817 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | INASP INP | authKW | 192874 | 1% | 100% | 5 |
2 | FDN PESQUISA DESENVOLVIMENTO TELECOMUN | address | 115725 | 0% | 100% | 3 |
3 | STRAIN COMPENSATED MULTI QUANTUM WELLS | authKW | 115725 | 0% | 100% | 3 |
4 | INASP | authKW | 94942 | 1% | 31% | 8 |
5 | DECOMPOSITION SOURCE | authKW | 77150 | 0% | 100% | 2 |
6 | FDN CPQD | address | 77150 | 0% | 100% | 2 |
7 | NOWON KU | address | 72119 | 2% | 10% | 19 |
8 | JOINT IL | address | 49593 | 0% | 43% | 3 |
9 | 0 20 X RAY DIFFRACTION XRD | authKW | 38575 | 0% | 100% | 1 |
10 | 13 MU M INASP INP LASER DIODE | authKW | 38575 | 0% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 10688 | 72% | 0% | 587 |
2 | Crystallography | 4271 | 20% | 0% | 161 |
3 | Materials Science, Multidisciplinary | 1342 | 30% | 0% | 248 |
4 | Physics, Condensed Matter | 989 | 20% | 0% | 161 |
5 | Engineering, Electrical & Electronic | 767 | 20% | 0% | 163 |
6 | Nanoscience & Nanotechnology | 392 | 8% | 0% | 69 |
7 | Materials Science, Coatings & Films | 297 | 5% | 0% | 39 |
8 | Physics, Multidisciplinary | 104 | 7% | 0% | 56 |
9 | Microscopy | 39 | 1% | 0% | 7 |
10 | Materials Science, Characterization, Testing | 26 | 1% | 0% | 7 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | FDN PESQUISA DESENVOLVIMENTO TELECOMUN | 115725 | 0% | 100% | 3 |
2 | FDN CPQD | 77150 | 0% | 100% | 2 |
3 | NOWON KU | 72119 | 2% | 10% | 19 |
4 | JOINT IL | 49593 | 0% | 43% | 3 |
5 | ASSOC BRASILEIRA TECNOL LUZ SINCROTRON | 38575 | 0% | 100% | 1 |
6 | CNRS LAMI | 38575 | 0% | 100% | 1 |
7 | CONSEJO NACL INVEST CIENT TECN FIS SOLIDO | 38575 | 0% | 100% | 1 |
8 | ELE OPHOTON MAT DEVICES ENGN PHYS | 38575 | 0% | 100% | 1 |
9 | ESTUDIOS TELECOMUN | 38575 | 0% | 100% | 1 |
10 | FOR UNGSZENTRUM ICHTEN IONEN TECH | 38575 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF CRYSTAL GROWTH | 29857 | 19% | 1% | 156 |
2 | APPLIED PHYSICS LETTERS | 6695 | 17% | 0% | 140 |
3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 6391 | 6% | 0% | 53 |
4 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 3756 | 4% | 0% | 31 |
5 | JOURNAL OF APPLIED PHYSICS | 3427 | 12% | 0% | 99 |
6 | JOURNAL OF ELECTRONIC MATERIALS | 2902 | 3% | 0% | 28 |
7 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1488 | 2% | 0% | 17 |
8 | SUPERLATTICES AND MICROSTRUCTURES | 1468 | 2% | 0% | 16 |
9 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1339 | 2% | 0% | 17 |
10 | ELECTRONICS LETTERS | 615 | 3% | 0% | 26 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |