Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 64 | 3 | SEMICONDUCTOR LASERS//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 89567 |
| 26 | 2 | SUPERLATTICES AND MICROSTRUCTURES//QUANTUM WELLS//PHYSICS, CONDENSED MATTER | 34827 |
| 20697 | 1 | INALAS INP//INALAS ALASSB//AIINAS INP | 473 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | INALAS INP | authKW | 185081 | 1% | 56% | 5 |
| 2 | INALAS ALASSB | authKW | 133261 | 0% | 100% | 2 |
| 3 | AIINAS INP | authKW | 66631 | 0% | 100% | 1 |
| 4 | ALLNAS | authKW | 66631 | 0% | 100% | 1 |
| 5 | CANADIAN PHOTON FABRICAT OTTAWA | address | 66631 | 0% | 100% | 1 |
| 6 | CHARACTERISTIC ABSORPTION WINDOW | authKW | 66631 | 0% | 100% | 1 |
| 7 | CROSS SECTIONAL SCANNING TUNNELING MICROSCOPY XSTM | authKW | 66631 | 0% | 100% | 1 |
| 8 | DOUBLE AXIS X RAY DIFFRACTION XRD | authKW | 66631 | 0% | 100% | 1 |
| 9 | ELECT ELECT BLOCK S2 | address | 66631 | 0% | 100% | 1 |
| 10 | EQUIPE PHOTOTHERMIE COMPOSANTS ELECT STRUCT MECAN | address | 66631 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 5132 | 66% | 0% | 311 |
| 2 | Crystallography | 1054 | 13% | 0% | 62 |
| 3 | Engineering, Electrical & Electronic | 1010 | 29% | 0% | 135 |
| 4 | Materials Science, Multidisciplinary | 469 | 25% | 0% | 116 |
| 5 | Physics, Condensed Matter | 438 | 18% | 0% | 83 |
| 6 | Nanoscience & Nanotechnology | 430 | 11% | 0% | 53 |
| 7 | Materials Science, Coatings & Films | 131 | 4% | 0% | 20 |
| 8 | Physics, Multidisciplinary | 32 | 5% | 0% | 26 |
| 9 | Optics | 20 | 4% | 0% | 20 |
| 10 | Microscopy | 4 | 0% | 0% | 2 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | CANADIAN PHOTON FABRICAT OTTAWA | 66631 | 0% | 100% | 1 |
| 2 | ELECT ELECT BLOCK S2 | 66631 | 0% | 100% | 1 |
| 3 | EQUIPE PHOTOTHERMIE COMPOSANTS ELECT STRUCT MECAN | 66631 | 0% | 100% | 1 |
| 4 | GROUPEMENT SCI CNET CNRS | 66631 | 0% | 100% | 1 |
| 5 | MICROELECT RUMENTAT UR031304 | 66631 | 0% | 100% | 1 |
| 6 | MICROSTRUCTU MICROELE | 66631 | 0% | 100% | 1 |
| 7 | PHY SEMINCOND COMPOSANTS ELECT | 66631 | 0% | 100% | 1 |
| 8 | PHYS SEMICOND COMPOSANTS ELECT LAMA06 | 66631 | 0% | 100% | 1 |
| 9 | SUPERLATITICES MICROSTRUCT | 66631 | 0% | 100% | 1 |
| 10 | UNIV GMP PHYS SOLIDE | 66631 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF CRYSTAL GROWTH | 8107 | 13% | 0% | 62 |
| 2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 7301 | 9% | 0% | 43 |
| 3 | APPLIED PHYSICS LETTERS | 3218 | 16% | 0% | 74 |
| 4 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 2187 | 4% | 0% | 18 |
| 5 | JOURNAL OF APPLIED PHYSICS | 2180 | 13% | 0% | 60 |
| 6 | ELECTRONICS LETTERS | 2133 | 8% | 0% | 36 |
| 7 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1286 | 3% | 0% | 12 |
| 8 | ELECTRON DEVICE LETTERS | 881 | 0% | 1% | 2 |
| 9 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 801 | 2% | 0% | 10 |
| 10 | JOURNAL OF ELECTRONIC MATERIALS | 767 | 2% | 0% | 11 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |