Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
67 | 3 | LITHIUM ION BATTERY//JOURNAL OF POWER SOURCES//ELECTROCHEMISTRY | 88728 |
2758 | 2 | LEAD ACID BATTERY//VALVE REGULATED LEAD ACID BATTERIES//JOURNAL OF POWER SOURCES | 3429 |
20569 | 1 | RFE2O4//LUFE2O4//CHARGE FRUSTRATION | 478 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | RFE2O4 | authKW | 992882 | 3% | 94% | 16 |
2 | LUFE2O4 | authKW | 927191 | 3% | 94% | 15 |
3 | CHARGE FRUSTRATION | authKW | 445048 | 2% | 75% | 9 |
4 | CAAC IGZO | authKW | 403842 | 1% | 88% | 7 |
5 | YBFE2O4 | authKW | 263735 | 1% | 100% | 4 |
6 | CRYSTALLINE OXIDE SEMICONDUCTOR | authKW | 197801 | 1% | 100% | 3 |
7 | ERFE2O4 | authKW | 197801 | 1% | 100% | 3 |
8 | HEILONGJIANG PROV LOW DIMENS SYST MESOS | address | 197801 | 1% | 100% | 3 |
9 | IN2O3ZNOM | authKW | 197801 | 1% | 100% | 3 |
10 | OXIDE SEMICONDUCTOR FET | authKW | 197801 | 1% | 100% | 3 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 1511 | 30% | 0% | 145 |
2 | Physics, Applied | 776 | 28% | 0% | 132 |
3 | Chemistry, Inorganic & Nuclear | 510 | 12% | 0% | 59 |
4 | Materials Science, Multidisciplinary | 443 | 24% | 0% | 114 |
5 | Physics, Multidisciplinary | 404 | 15% | 0% | 70 |
6 | Crystallography | 216 | 6% | 0% | 30 |
7 | Microscopy | 163 | 2% | 0% | 10 |
8 | Chemistry, Physical | 150 | 15% | 0% | 70 |
9 | Engineering, Electrical & Electronic | 60 | 9% | 0% | 44 |
10 | Optics | 59 | 6% | 0% | 29 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | HEILONGJIANG PROV LOW DIMENS SYST MESOS | 197801 | 1% | 100% | 3 |
2 | ENGN TRAINING BASIC EXPERIMENTAT | 190036 | 1% | 41% | 7 |
3 | CREATING NEW MAT | 105489 | 1% | 40% | 4 |
4 | EXPT PHYS IVC | 87910 | 0% | 67% | 2 |
5 | ANORGHAN CHEM | 65934 | 0% | 100% | 1 |
6 | DEV LSI CIRCUITS MEMORIES | 65934 | 0% | 100% | 1 |
7 | EQUIPE CHIM CRISTALLOCHIM MAT C2M | 65934 | 0% | 100% | 1 |
8 | M BESSY I1 | 65934 | 0% | 100% | 1 |
9 | PHYS HIGASHI KU | 65934 | 0% | 100% | 1 |
10 | STRUCT PROPRIETES MODELISAT MAT | 65934 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY | 37512 | 6% | 2% | 28 |
2 | JOURNAL OF SOLID STATE CHEMISTRY | 8651 | 9% | 0% | 44 |
3 | JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 3034 | 6% | 0% | 31 |
4 | JAPANESE JOURNAL OF APPLIED PHYSICS | 1908 | 5% | 0% | 22 |
5 | FERROELECTRICS | 1151 | 3% | 0% | 15 |
6 | PHYSICAL REVIEW B | 803 | 10% | 0% | 47 |
7 | HYPERFINE INTERACTIONS | 404 | 1% | 0% | 7 |
8 | PHYSICA B-CONDENSED MATTER | 337 | 3% | 0% | 13 |
9 | JOURNAL OF ELECTRON MICROSCOPY | 314 | 1% | 0% | 3 |
10 | ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE CRYSTAL ENGINEERING AND MATERIALS | 275 | 1% | 0% | 4 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | RFE2O4 | 992882 | 3% | 94% | 16 | Search RFE2O4 | Search RFE2O4 |
2 | LUFE2O4 | 927191 | 3% | 94% | 15 | Search LUFE2O4 | Search LUFE2O4 |
3 | CHARGE FRUSTRATION | 445048 | 2% | 75% | 9 | Search CHARGE+FRUSTRATION | Search CHARGE+FRUSTRATION |
4 | CAAC IGZO | 403842 | 1% | 88% | 7 | Search CAAC+IGZO | Search CAAC+IGZO |
5 | YBFE2O4 | 263735 | 1% | 100% | 4 | Search YBFE2O4 | Search YBFE2O4 |
6 | CRYSTALLINE OXIDE SEMICONDUCTOR | 197801 | 1% | 100% | 3 | Search CRYSTALLINE+OXIDE+SEMICONDUCTOR | Search CRYSTALLINE+OXIDE+SEMICONDUCTOR |
7 | ERFE2O4 | 197801 | 1% | 100% | 3 | Search ERFE2O4 | Search ERFE2O4 |
8 | IN2O3ZNOM | 197801 | 1% | 100% | 3 | Search IN2O3ZNOM | Search IN2O3ZNOM |
9 | OXIDE SEMICONDUCTOR FET | 197801 | 1% | 100% | 3 | Search OXIDE+SEMICONDUCTOR+FET | Search OXIDE+SEMICONDUCTOR+FET |
10 | TRIGONAL BIPYRAMIDAL COORDINATION | 150702 | 1% | 57% | 4 | Search TRIGONAL+BIPYRAMIDAL+COORDINATION | Search TRIGONAL+BIPYRAMIDAL+COORDINATION |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |