Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
214 | 3 | ZNO//ZINC OXIDE//GAS SENSOR | 51365 |
301 | 2 | GAS SENSOR//SNO2//TIN OXIDE | 18862 |
356 | 1 | THIN FILM TRANSISTORS//THIN FILM TRANSISTORS TFTS//IGZO | 3620 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | THIN FILM TRANSISTORS | authKW | 2006085 | 19% | 33% | 698 |
2 | THIN FILM TRANSISTORS TFTS | authKW | 844064 | 6% | 46% | 211 |
3 | IGZO | authKW | 784667 | 3% | 84% | 107 |
4 | OXIDE SEMICONDUCTOR | authKW | 684735 | 5% | 48% | 165 |
5 | THIN FILM TRANSISTOR TFT | authKW | 671660 | 6% | 36% | 217 |
6 | INGAZNO | authKW | 667374 | 2% | 87% | 88 |
7 | AMORPHOUS OXIDE SEMICONDUCTOR | authKW | 620692 | 2% | 94% | 76 |
8 | A IGZO | authKW | 612160 | 2% | 88% | 80 |
9 | OXIDE TFT | authKW | 555416 | 2% | 90% | 71 |
10 | AMORPHOUS INDIUM GALLIUM ZINC OXIDE A IGZO | authKW | 553906 | 2% | 91% | 70 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 33821 | 61% | 0% | 2218 |
2 | Materials Science, Multidisciplinary | 10126 | 38% | 0% | 1388 |
3 | Engineering, Electrical & Electronic | 6956 | 27% | 0% | 986 |
4 | Nanoscience & Nanotechnology | 5968 | 15% | 0% | 532 |
5 | Materials Science, Coatings & Films | 4002 | 8% | 0% | 288 |
6 | Physics, Condensed Matter | 3953 | 19% | 0% | 682 |
7 | Materials Science, Ceramics | 534 | 3% | 0% | 100 |
8 | Optics | 301 | 5% | 0% | 191 |
9 | Chemistry, Multidisciplinary | 133 | 7% | 0% | 260 |
10 | Physics, Multidisciplinary | 60 | 4% | 0% | 134 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | OXIDE ELECT TEAM | 164443 | 1% | 82% | 23 |
2 | ADV DISPLAY | 157201 | 2% | 22% | 81 |
3 | TRANSPARENT ELECT TEAM | 145067 | 1% | 83% | 20 |
4 | ADV DISPLAY SYST PLICAT | 124943 | 2% | 19% | 76 |
5 | ADV MAT ENGN INFORMAT ELECT | 94919 | 2% | 17% | 66 |
6 | DISPLAY | 92339 | 3% | 10% | 107 |
7 | INFORMAT DISPLAY | 83715 | 3% | 9% | 111 |
8 | MANA ADV DEVICE MAT GRP | 83558 | 0% | 80% | 12 |
9 | MANA FOUNDRY | 73543 | 0% | 65% | 13 |
10 | MAT SCI CENIMAT I3N | 60931 | 0% | 100% | 7 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE ELECTRON DEVICE LETTERS | 106245 | 9% | 4% | 337 |
2 | JOURNAL OF DISPLAY TECHNOLOGY | 43948 | 2% | 6% | 81 |
3 | JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY | 24198 | 2% | 5% | 62 |
4 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 19130 | 5% | 1% | 187 |
5 | APPLIED PHYSICS LETTERS | 17250 | 13% | 0% | 476 |
6 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 15879 | 1% | 4% | 52 |
7 | JAPANESE JOURNAL OF APPLIED PHYSICS | 15777 | 5% | 1% | 174 |
8 | ELECTROCHEMICAL AND SOLID STATE LETTERS | 14937 | 2% | 2% | 86 |
9 | ECS SOLID STATE LETTERS | 12783 | 1% | 6% | 23 |
10 | THIN SOLID FILMS | 7275 | 5% | 0% | 178 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | THIN FILM TRANSISTORS | 2006085 | 19% | 33% | 698 | Search THIN+FILM+TRANSISTORS | Search THIN+FILM+TRANSISTORS |
2 | THIN FILM TRANSISTORS TFTS | 844064 | 6% | 46% | 211 | Search THIN+FILM+TRANSISTORS+TFTS | Search THIN+FILM+TRANSISTORS+TFTS |
3 | IGZO | 784667 | 3% | 84% | 107 | Search IGZO | Search IGZO |
4 | OXIDE SEMICONDUCTOR | 684735 | 5% | 48% | 165 | Search OXIDE+SEMICONDUCTOR | Search OXIDE+SEMICONDUCTOR |
5 | THIN FILM TRANSISTOR TFT | 671660 | 6% | 36% | 217 | Search THIN+FILM+TRANSISTOR+TFT | Search THIN+FILM+TRANSISTOR+TFT |
6 | INGAZNO | 667374 | 2% | 87% | 88 | Search INGAZNO | Search INGAZNO |
7 | AMORPHOUS OXIDE SEMICONDUCTOR | 620692 | 2% | 94% | 76 | Search AMORPHOUS+OXIDE+SEMICONDUCTOR | Search AMORPHOUS+OXIDE+SEMICONDUCTOR |
8 | A IGZO | 612160 | 2% | 88% | 80 | Search A+IGZO | Search A+IGZO |
9 | OXIDE TFT | 555416 | 2% | 90% | 71 | Search OXIDE+TFT | Search OXIDE+TFT |
10 | AMORPHOUS INDIUM GALLIUM ZINC OXIDE A IGZO | 553906 | 2% | 91% | 70 | Search AMORPHOUS+INDIUM+GALLIUM+ZINC+OXIDE+A+IGZO | Search AMORPHOUS+INDIUM+GALLIUM+ZINC+OXIDE+A+IGZO |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |